scholarly journals Development of a novel nanoindentation technique by utilizing a dual-probe AFM system

2015 ◽  
Vol 6 ◽  
pp. 2015-2027 ◽  
Author(s):  
Eyup Cinar ◽  
Ferat Sahin ◽  
Dalia Yablon
Keyword(s):  
Scanning Probe Microscopy ◽  
Tuning Fork ◽  
Vertical Movement ◽  
Fused Silica ◽  
Scanning Probe ◽  
Depth Sensing ◽  
New Approach ◽  
Probe System ◽  
Properties Of Materials ◽  
Dual Probe

A novel instrumentation approach to nanoindentation is described that exhibits improved resolution and depth sensing. The approach is based on a multi-probe scanning probe microscopy (SPM) tool that utilizes tuning-fork based probes for both indentation and depth sensing. Unlike nanoindentation experiments performed with conventional AFM systems using beam-bounce technology, this technique incorporates a second probe system with an ultra-high resolution for depth sensing. The additional second probe measures only the vertical movement of the straight indenter attached to a tuning-fork probe with a high spring constant and it can also be used for AFM scanning to obtain an accurate profiling. Nanoindentation results are demonstrated on silicon, fused silica, and Corning Eagle Glass. The results show that this new approach is viable in terms of accurately characterizing mechanical properties of materials through nanoindentation with high accuracy, and it opens doors to many other exciting applications in the field of nanomechanical characterization.

Improve performance of scanning probe microscopy by balancing tuning fork prongs

2009 ◽  
Vol 109 (4) ◽  
pp. 291-295 ◽  
Author(s):  
Boon Ping Ng ◽  
Ying Zhang ◽  
Shaw Wei Kok ◽  
Yeng Chai Soh
Keyword(s):  
Scanning Probe Microscopy ◽  
Tuning Fork ◽  
Scanning Probe ◽  
Improve Performance ◽  
Probe Microscopy

scholarly journals Dynamics of quartz tuning fork force sensors used in scanning probe microscopy

2009 ◽  
Vol 20 (21) ◽  
pp. 215502 ◽  
Author(s):  
A Castellanos-Gomez ◽  
N Agraït ◽  
G Rubio-Bollinger
Keyword(s):  
Scanning Probe Microscopy ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Scanning Probe ◽  
Force Sensors ◽  
Probe Microscopy

Measuring the Interaction Force Between a Tip and a Substrate Using a Quartz Tuning Fork Under Ambient Conditions

2006 ◽  
Vol 6 (11) ◽  
pp. 3455-3459
Author(s):  
Yexian Qin ◽  
R. Reifenberger
Keyword(s):  
Resonant Frequency ◽  
Scanning Probe Microscopy ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Interaction Force ◽  
Scanning Probe ◽  
Ambient Conditions ◽  
Probe Microscopy ◽  
Tuning Forks ◽  
Force Data

Tuning forks mounted with sharp tips provide an alternate method to silicon microcantilevers for probing the tip-substrate interaction in scanning probe microscopy. The high quality factor and stable resonant frequency of the tuning fork allow accurate measurements of small shifts in the resonant frequency as the tip approaches the substrate. To permit an accurate measure of surface interaction forces, the electrical and piezomechanical properties of a tuning fork has been characterized using techniques derived from scanning probe microscopy. After proper calibration, representative interaction force data for a conventional Si tip and an HOPG substrate are obtained under ambient conditions.

Specimen preparation for scanning-probe microscopy of materials by ultramicrotomy

1994 ◽  
Vol 52 ◽  
pp. 878-879
Author(s):  
F. Shaapur ◽  
P. Rez ◽  
D. R. Yaniv ◽  
G. W. Drach
Keyword(s):  
Scanning Probe Microscopy ◽  
Surface Defects ◽  
Bulk Material ◽  
The Body ◽  
Scanning Probe ◽  
Specimen Preparation ◽  
Probe Microscopy ◽  
Naturally Occurring ◽  
Properties Of Materials

Scanning Probe Microscopy (SPM) has been traditionally employed for the characterization of exposed and naturally occurring surfaces. An extension of the technique for studying the bulk properties of materials is limited by the ability to produce and expose a perfectly clean, defect-free, smooth, flat surface within the body of the sample. With the exception of monocrystals with a preferred cleavage plane, most materials for SPM bulk examination have been prepared using conventional lapping procedures. Generally, as a result of surface scratches or residual lapping debris, a surface prepared in such a way is not sufficiently smooth or clean for its intended application. In addition, such a sample is not representative of the bulk material due to the surface defects commonly caused by the use of abrasives. In the case of particulate materials these difficulties are compounded by the need to support and immobilize the particles and generate a sufficiently large surface for SPM.

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