Effect of Input Precision on Line Micro Quality Measurement

Line quality micro-measurement is of important content of objective measurement, contributing to reproduction quality assessment of digital printed character and line metrics. Transforming physical presswork to digital image is not only the first but also a key procedure in micro quality measurement. In this study, effect of input resolution was verified in order to determine the precision requirement in micro quality survey. A series of experiments were carried out to measure same inkjet samples, which were scanned with a normal flatbed in three resolution sets. The effect on assessment accuracy of resolution condition was analyzed by pair-wise comparison method. Results show that normal flatbed is precise enough for micro line quality measurement. But 600DPI identified in ISO13660 standard is too low to serve in this survey. 1200DPI can work well enough and extra-high resolution version will not respond to improve the measurement precision obviously in inkjet line attribute evaluation.

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Digital image processing for nonperiodic objects and an on-line image processing system for high resolution electron microscopy

Journal of Electron Microscopy Technique ◽

10.1002/jemt.1060040106 ◽

1986 ◽

Vol 4 (1) ◽

pp. 55-62 ◽

Cited By ~ 1

Author(s):

Norio Baba ◽

Eisaku Oho ◽

Makio Mukai ◽

Koichi Kanaya

Keyword(s):

Electron Microscopy ◽

Image Processing ◽

High Resolution ◽

Digital Image Processing ◽

Digital Image ◽

Processing System ◽

High Resolution Electron Microscopy ◽

Image Processing System ◽

Resolution Electron ◽

On Line

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On Line Digital Image Analysis and Processing in HREM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100055990 ◽

1982 ◽

Vol 40 ◽

pp. 740-741

Author(s):

E. D. Boyesa ◽

B. J. Muggridgea ◽

M. J. Goringe

Keyword(s):

Image Analysis ◽

High Resolution ◽

Digital Image ◽

Digital Image Analysis ◽

Theoretical Models ◽

Specimen Thickness ◽

Optical Bench ◽

Proper Understanding ◽

On Line ◽

High Resolution Images

HREM has proved to be a powerful technique with wide applications in the materials sciences, but the images even from very thin crystals are not always simple to interpret reliably. Independent knowledge of the specimen thickness, microscope aberrations and operating defocus is usually required for a proper understanding or calculation of high resolution images. Offline, images must be exhaustively matched with those computed from theoretical models incorporating a range of conditions, together with optical diffractometer analysis using a laser optical bench (ODM). This process is time consuming and does not always produce satisfactory results.

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On-line alignment and astigmatism correction using a TV and personal computer

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100146850 ◽

1993 ◽

Vol 51 ◽

pp. 202-203

Author(s):

F. Hosokawa ◽

Y. Kondo ◽

T. Honda ◽

Y. Ishida ◽

M. Kersker

Keyword(s):

High Resolution ◽

Personal Computer ◽

Block Diagram ◽

Incident Beam ◽

Ccd Camera ◽

Alignment Procedure ◽

Astigmatism Correction ◽

Transmission Electron ◽

Alignment System ◽

On Line

High-resolution transmission electron microscopy must attain utmost accuracy in the alignment of incident beam direction and in astigmatism correction, and that, in the shortest possible time. As a method to eliminate this troublesome work, an automatic alignment system using the Slow-Scan CCD camera has been introduced recently. In this method, diffractograms of amorphous images are calculated and analyzed to detect misalignment and astigmatism automatically. In the present study, we also examined diffractogram analysis using a personal computer and digitized TV images, and found that TV images provided enough quality for the on-line alignment procedure of high-resolution work in TEM. Fig. 1 shows a block diagram of our system. The averaged image is digitized by a TV board and is transported to a computer memory, then a diffractogram is calculated using an FFT board, and the feedback parameters which are determined by diffractogram analysis are sent to the microscope(JEM- 2010) through the RS232C interface. The on-line correction system has the following three modes.

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Using the Pair-Wise Comparison Method in Optimizing the Operation of an Agricultural Production Blast Freezing Machine

Elektrichestvo ◽

10.24160/0013-5380-2017-12-51-54 ◽

2017 ◽

pp. 51-54

Author(s):

Tatiana T. AMBARTSUMOVA ◽

◽

Dmitrii I. GRIBOV ◽

Sergei I. KOPYLOV ◽

◽

...

Keyword(s):

Agricultural Production ◽

Comparison Method ◽

Pair Wise Comparison

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Super Resolution Digital Image Correlation (SR-DIC): an Alternative to Image Stitching at High Magnifications

Experimental Mechanics ◽

10.1007/s11340-021-00729-2 ◽

2021 ◽

Author(s):

R. S. Hansen ◽

D. W. Waldram ◽

T. Q. Thai ◽

R. B. Berke

Keyword(s):

High Resolution ◽

Digital Image Correlation ◽

Spatial Resolution ◽

Digital Image ◽

Super Resolution ◽

Image Correlation ◽

Low Resolution ◽

Strain Measurements ◽

Resolution Image ◽

High Resolution Image

Abstract Background High-resolution Digital Image Correlation (DIC) measurements have previously been produced by stitching of neighboring images, which often requires short working distances. Separately, the image processing community has developed super resolution (SR) imaging techniques, which improve resolution by combining multiple overlapping images. Objective This work investigates the novel pairing of super resolution with digital image correlation, as an alternative method to produce high-resolution full-field strain measurements. Methods First, an image reconstruction test is performed, comparing the ability of three previously published SR algorithms to replicate a high-resolution image. Second, an applied translation is compared against DIC measurement using both low- and super-resolution images. Third, a ring sample is mechanically deformed and DIC strain measurements from low- and super-resolution images are compared. Results SR measurements show improvements compared to low-resolution images, although they do not perfectly replicate the high-resolution image. SR-DIC demonstrates reduced error and improved confidence in measuring rigid body translation when compared to low resolution alternatives, and it also shows improvement in spatial resolution for strain measurements of ring deformation. Conclusions Super resolution imaging can be effectively paired with Digital Image Correlation, offering improved spatial resolution, reduced error, and increased measurement confidence.

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