Effect of Vacuum Annealing Temperature on Properties of Ga-Doped ZnO Films Deposited by DC Magnetron Reactive Sputtering

2012 ◽  
Vol 485 ◽  
pp. 348-351
Author(s):  
Ji Sen Zhang ◽  
Hui Dong Yang ◽  
Bo Huang ◽  
Song Yu ◽  
Li Xin Zeng

The Ga-doped ZnO thin films (GZO) were deposited at room temperature by DC magnetron reactive sputtering. The influence of vacuum annealing temperature on the morphology, internal stress, optical and electrical properties were investigated. The results showed that with the rise of annealing temperature, the grain size increased, the preferred orientation and crystallization degree became better, the internal stress reduced, the resistivity firstly decreased slightly before 350°C and then increased sharply. The minimum resistivity of 1.32×10-3Ω•cm was obtained at 350°C. The annealing temperature had a very big influence on the transmittance, and the average transmittance was about 80% in the visible range.

2001 ◽  
Vol 48 (3-4) ◽  
pp. 194-198 ◽  
Author(s):  
M. Chen ◽  
Z.L. Pei ◽  
C. Sun ◽  
L.S. Wen ◽  
X. Wang

2021 ◽  
Vol 12 (5) ◽  
pp. 6776-6787

A Co-doped ZnO layer was prepared by electrodeposition method on indium doped tin oxide (ITO) substrate using a cathodic reduction from nitrate medium with different doping percentages of cobalt. The bath temperature was controlled at 70 °C. The films were cathodically electrodeposited in a bath containing 5 mM Zn(NO3)2. 6H2O, while the source of Co is Co(NO3)2.6H2O where 0.1M KNO3 was used as supporting electrolyte. The nucleation and growth mechanism of Co-doped ZnO nuclei have been studied by cyclic voltammetry and chronoamperometry. The cyclic voltammetry shows that the electrodeposition of ZnO and Co-doped ZnO at a negative potential around -1.0 V versus saturated calomel electrode (SCE) is a quasi-reversible reaction controlled by the diffusion process. Comparing current transients curves obtained by the chronoamperometric method with the theoretical curves of current density j versus t ½ allows us to say that the nucleation is 3D instantaneous, as shown in SEM analysis. The presence of Co does not modify the nucleation and growth mechanism. The XRD patterns show that the substitution of zinc by cobalt does not change the würtzite crystal structure, but the crystallite size decreases with the cobalt percentage. The transmittance spectra indicate that the Co-doped ZnO films are transparent in the visible range. The optical gap increases with the doping percentage of cobalt.


2008 ◽  
Vol 148 (1-3) ◽  
pp. 35-39 ◽  
Author(s):  
Fanyong Ran ◽  
Lei Miao ◽  
Sakae Tanemura ◽  
Masaki Tanemura ◽  
Yongge Cao ◽  
...  

2014 ◽  
Vol 685 ◽  
pp. 3-6
Author(s):  
Ying Lian Wang ◽  
Jun Yao Ye

Pure ZnO thin films and Ag doped ZnO thin films were prepared on quartz substrates by sol-gel process. Structural features and UV absorption spectrum have been studied by XRD and UV-Vis-Nir scanning spectrophotometer. Taking phenol as pollutants, further study of the effect of different annealing temperature and Ag dopant amount of ZnO films on photocatalytic properties was carried out. The results showed that, the optimal annealing temperature on photocatalytic degradation of phenol in this experiment was 300 °C, the best molar ratio of ZnO and Ag was 30:1, which was better than pure ZnO film greatly. Excellent adhesion, recyclable and efficient degradation Ag doped ZnO thin films were found in this experiment.


2006 ◽  
Vol 287 (1) ◽  
pp. 78-84 ◽  
Author(s):  
Shou-Yi Kuo ◽  
Wei-Chun Chen ◽  
Fang-I Lai ◽  
Chin-Pao Cheng ◽  
Hao-Chung Kuo ◽  
...  

2016 ◽  
Vol 31 (4) ◽  
pp. 234-240 ◽  
Author(s):  
P. V. Rajkumar ◽  
K. Ravichandran ◽  
K. Karthika ◽  
B. Sakthivel ◽  
B. Muralidharan

Author(s):  
Sema Kurtaran ◽  
Serhat Aldağ ◽  
Göksu Öföfoğlu

Ga doped ZnO thin films were formed by the Ultrasonic Chemical Spray Pyrolysis method onto substrates using zinc acetate and gallium (III) nitrate hydrate as precursors. The structural, optical, surface and electrical properties were studied as a function of increasing Ga doping concentration from 0 to 6 at %. Structural studies were shown polycrystalline with a hexagonal crystal structure. The transparency in the visible range was around 85% for thin film deposited using 6 at % Ga doping. With the aim of determining surface images and surface roughness of the films atomic force microscope images were taken. Ga doping of ZnO thin films could markedly decrease surface roughness. Electrical resistivity was determined by four point method. The resistivity 2.0% Ga doped ZnO film was the lowest resistivity of 1.7 cm. In the photoluminescence measurements of the films, existence of UV and defect emission band was observed. As a result, Ga doped ZnO films have advanced properties and promising materials for solar cells.


Sign in / Sign up

Export Citation Format

Share Document