The Characterization of CdS Thin Film Prepared by CBD Method
2012 ◽
Vol 538-541
◽
pp. 88-91
Keyword(s):
X Ray
◽
CdS thin film was deposited onto glass substrates by the chemical bath deposition. The deposition temperature was maintained at 75 °C. The crystal structure, surface morphology, optical and electrical properties have investigated employing X-ray diffraction (XRD), scanning electron microscopy (SEM), spectrophotometer and seeback coefficient measurement, respectively. The XRD reveals CdS thin film grown at 75 °C has the mixed hexagonal and cubic structure. The optical band gap energy is 2.4 eV. The seeback coefficient is 197.3μV/k at room temperature. The electric resistivity of CdS thin film is in the order of 10000Ω•cm.
Keyword(s):
2020 ◽
Vol 12
(2)
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pp. 254-262
1993 ◽
Vol 29
(1)
◽
pp. 300-306
◽
2018 ◽
Vol 21
(1)
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pp. 001-005
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