Study on Mechanical Automation with the Torque Limiter Functioned Based on Infrared Interruption

2013 ◽  
Vol 703 ◽  
pp. 249-254
Author(s):  
I Chiang Yang ◽  
Po Szu Lai ◽  
Yu Lin Juan ◽  
Tsair Rong Chen ◽  
Ching Mu Chen

In this research, the verification on the torque limiter is completed by using the mechanism of a torque limiter integrated with the infrared optointerrupter feedback detection. Through a shuttle and an infrared optointerrupter, it is meant to determine whether the rotation mechanism is affected by the mechanism of a torque limiter. With this, it is available to determine if any jamming happens. Through the testing verification of physical mechanisms, the feasibility for the torque limiter proposed by this research is conducted. It can avoid current shorting when dead jamming happens. Also, the detection circuits relevant to the detection of motor current feedback can be saved to reduce systematical circuit maintenance and manufacture torque limiters with long life expectancy, higher stability and low cost.

Author(s):  
peisheng guo ◽  
gongzheng yang ◽  
Chengxin Wang

Aqueous zinc-ion batteries (AZIBs) have been regarded as alternative and promising large-scale energy storage systems due to their low cost, convenient manufacturing processes, and high safety. However, their development was...


2020 ◽  
Vol 87 (s1) ◽  
pp. s79-s84
Author(s):  
Qummar Zaman ◽  
Senan Alraho ◽  
Andreas König

AbstractThe conventional method for testing the performance of reconfigurable sensory electronics of industry 4.0 relies on the direct measurement methods. This approach gives higher accuracy but at the price of extremely high testing cost and does not utilize the new degrees of freedom for measurement methods enabled by industry 4.0. In order to reduce the test cost and use available resources more efficiently, a primary approach, called indirect measurements or alternative testing has been proposed using a non-intrusive sensor. Its basic principle consists in using the indirect measurements, in order to estimate the sensory electronics performance parameters without measuring directly. The non-intrusive property of the proposed method offers better performance of the sensing electronics and virtually applicable to any sensing electronics. Efficiency is evaluated in terms of model accuracy by using six different classical metrics. It uses an indirect current-feedback instrumentation amplifier (InAmp) as a test vehicle to evaluate the performance parameters of the circuit. The device is implemented using CMOS 0.35 μm technology. The achieved maximum value of average expected error metrics is 0.24, and the lowest value of correlation performance metrics is 0.91, which represent an excellent efficiency of InAmp performance predictor.


1998 ◽  
pp. 2039-2046 ◽  
Author(s):  
D. T. Kuo ◽  
A. S. Loc ◽  
S. W. K. Yuan ◽  
A. L. Johnson

Materials ◽  
2021 ◽  
Vol 14 (19) ◽  
pp. 5843
Author(s):  
Rosaria Verduci ◽  
Antonio Agresti ◽  
Valentino Romano ◽  
Giovanna D’Angelo

The last decade has witnessed the advance of metal halide perovskites as a promising low-cost and efficient class of light harvesters used in solar cells (SCs). Remarkably, the efficiency of lab-scale perovskite solar cells (PSCs) reached a power conversion efficiency of 25.5% in just ~10 years of research, rivalling the current record of 26.1% for Si-based PVs. To further boost the performances of PSCs, the use of 2D materials (such as graphene, transition metal dichalcogenides and transition metal carbides, nitrides and carbonitrides) has been proposed, thanks to their remarkable optoelectronic properties (that can be tuned with proper chemical composition engineering) and chemical stability. In particular, 2D materials have been demonstrated as promising candidates for (i) accelerating hot carrier transfer across the interfaces between the perovskite and the charge extraction layers; (ii) improving the crystallization of the perovskite layers (when used as additives in the precursor solution); (iii) favoring electronic bands alignment through tuning of the work function. In this mini-review, we discuss the physical mechanisms underlying the increased efficiency of 2D material-based PSCs, focusing on the three aforementioned effects.


Author(s):  
Yuxi Song ◽  
Kaiyue Zhang ◽  
Xiangrong Li ◽  
Chuanwei Yan ◽  
Qinghua Liu ◽  
...  

Aqueous all-iron flow battery is a promising alternative for large-scale energy storage applications due to low cost and high safety. However, inferior Fe plating/stripping reversibility and hydrolysis of Fe2+ at...


Author(s):  
David E. Hayes-Bautista

The 2016 Republican presidential campaign has been based on an overtly anti–Mexican immigrant nativist message, another round in the universalistic versus nativist conflict over the definition of American. Nationally, Latinos exhibit the strong work ethic, avoidance of welfare, positive health outcomes, and long life expectancy of Latinos in California. In the post-millennial generation in the top eleven Latino market areas, Latino presence ranges from being a large majority to being the largest plurality. Latino post-millennials will be instrumental in creating the twenty-first-century definition of American.


2012 ◽  
Vol 159 ◽  
pp. 297-301
Author(s):  
Ru Wang ◽  
Guo Feng Pan ◽  
Juan Wang ◽  
Rui Xia Yang ◽  
Yu Ling Liu

It is of significance to research high-removal efficiency and low-cost CMP process for the 65 nm and below node. Chemical mechanical polishing (CMP) can realize the planarization of the wafer with free defects, free contamination and below nanometer level roughness. Test project of CMP slurry is main contain of these detections such as pH value, chelating agent content, SiO2 gel particle size, ζ-potential detection and the observation by Transmission electron microscopy (TEM). End point detection method of pattern wafer CMP usually includes the non destructive optical measurement, motor current feedback measurement and polishing pad temperature test. The main problems of the measurement for pattern wafer CMP are critical dimension (CD), section, film thickness, defects and particles measurement. Some of the new type of testing technology, such as atomic force profiler (AFP), can be used to compare CMP effect, such as dishing, erosion, tungsten plugs, the height of steps and flatness of the wafer, which is significant for wafer CMP research.


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