Improvement of Interface Roughness in Platinum/Carbon Multilayers for X-Ray Mirrors

2012 ◽  
Vol 523-524 ◽  
pp. 1076-1079
Author(s):  
Jang Woo Kim ◽  
Satoshi Matsuyama ◽  
Yasuhisa Sano ◽  
Kazuto Yamauchi
Keyword(s):  
Surface Roughness ◽  
Single Layer ◽  
Interface Roughness ◽  
Carbon Doping ◽  
Diffraction Spectrum ◽  
X Ray Diffraction ◽  
Sputtering Deposition ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

We present a study of the improvement in interface roughness of platinum/carbon multilayers for X-ray mirrors. The X-ray reflectivity of multilayers strongly depends on interface quality. In an effort to reduce the interface roughness caused by crystallization during deposition, carbon doping of platinum was proposed, and its effectiveness was evaluated. We compared 45-nm-thick single-layer platinum to carbon-doped platinum films. The films were deposited on a silicon (100) substrate by dc magnetron sputtering deposition. The surface roughness and X-ray diffraction spectrum of each film were measured by atomic force microscopy and X-ray diffraction, respectively. We concluded that the increase in carbon concentration suppresses the crystallization of platinum and causes the surface roughness to decrease.

Surface Morphology of InxGa1-xAs/GaAs Relaxed Layers Characterized by Atomic Force Microscopy

1994 ◽  
Vol 340 ◽  
Author(s):  
G. Padeletti ◽  
G. M. Ingo ◽  
P. Imperatori
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Strain Relaxation ◽  
Grazing Incidence ◽  
Dislocation Network ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Combined Use

ABSTRACTGa0.65In0.35As layers of a varying nominal epilayer thickness (10 – 1000 nm) have been grown by the MBE technique on GaAs (100) substrates and characterized by the combined use of atomic force microscopy (AFM) and grazing incidence X-ray diffraction (GIXD). The surface roughness and morphology have been investigated. The GIXD and AFM results show that the thinnest films are characterized by an asymmetric strain relaxation along the two <110> directions with no surface crosshatched pattern but with a misfit dislocation network. AFM images on the thickest films show also well-oriented protrusions along the [110] direction, which increase in size and become more elongated as the nominal film thickness increases.

Atomic force microscopy and X-ray diffraction study of surface and interface roughness in Nb/Cu multilayers

1996 ◽  
Vol 156 (1-3) ◽  
pp. 109-110 ◽  
Author(s):  
K. Temst ◽  
M.J. Van Bael ◽  
D.G. de Groot ◽  
N.J. Koeman ◽  
R.P. Griessen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Diffraction Study ◽  
Interface Roughness ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Surface And Interface ◽  
Atomic Force

Influence of Cu2+ Doping on the Photocatalytic Activity of TiO2 Film

2008 ◽  
Vol 368-372 ◽  
pp. 1483-1485 ◽  
Author(s):  
Rui Hai Cui ◽  
Zhao Hua Jiang ◽  
Zhong Ping Yao
Keyword(s):  
Aqueous Solution ◽  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Photocatalytic Activity ◽  
Degradation Rate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Composition And Structure

With the approach of anodic oxidation, TiO2/Ti film doped with Cu2+ was produced in H2SO4 electrolyte mixed with CuSO4. The surface morphology and the roughness of the films were studied with atomic force microscopy. The phase composition of the films was studied by X-ray diffraction. The photocatalytic activity of the films was compared through the photocatalytic degradation rate of phenol. The relations of the photocatalytic activity to the concentration of Cu2+, the microstructure and the surface roughness of the film were investigated. The results showed that Cu2+ increased the surface roughness and restrained the growth of crystal. In addition, the phenol in aqueous solution was successfully photodegraded under visible light irradiation by Cu2+-TiO2/Ti film. The composition and structure of the film affected the catalytic activity greatly. Compared with TiO2/Ti film, the recombination rate of e- and h+ of Cu2+-TiO2/Ti film was decreased.

The Surface and Interface Microstructure of Epitaxial Pr0.7Sr0.3MnO3/La0.5Ca0.5MnO3 Bilayer Structure

2013 ◽  
Vol 372 ◽  
pp. 75-79
Author(s):  
Haiou Wang ◽  
Hao Liu ◽  
Meng Xiong Cao ◽  
Wei Shi Tan ◽  
Ping Dai ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Mass Density ◽  
Bilayer Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Surface And Interface ◽  
Lcmo Film ◽  
Atomic Force ◽  
Disordered Layer

Epitaxial bilayer structure consisting of ferromagnetic (FM) metallic Pr0.7Sr0.3MnO3 (PSMO) and antiferromagnetic (AFM) insulator La0.5Ca0.5MnO3 (LCMO) was fabricated on (001)-oriented single crystal SrTiO3 (STO) substrate by pulsed laser deposition technique. We studied the surface structure and interdiffusion at interface between PSMO and LCMO by using atomic force microscope and grazing incident x-ray reflectivity (GIXRR). The perfect data fitting result of GIXRR indicated that interdiffusion at the interface of Pr0.7Sr0.3MnO3/La0.5Ca0.5MnO3 (PSMO/LCMO) could not be negligible; there was a large interdiffusion zone at the PSMO/LCMO interfaces with a thickness of about 7 nm. We found that the thickness of the top layer at air/PSMO interface was about 2.5 nm and the mass density of the top layer was about 76.53% of that of PSMO layer. The surface roughness was about 1.6 nm which was consistent with observation by atomic force microscopy. Normal X-ray diffraction (NXRD) was also employed to investigate the average structure. Except from PSMO and LCMO layer diffraction peaks, we observed another additional peak, which was developed from the large disordered layer resulting from interdiffusion at the interface of PSMO/LCMO. This implied that the variation of crystalline structure of PSMO/LCMO film occurred due to interdiffusion. Surface roughness and interdiffusion played an important role in magnetic properties of FM/AFM bilayer.

scholarly journals Effect of Addition of Polyethylene Glycol into Trivalent Chromium Bath on Chromium Coating

2020 ◽  
Vol 307 ◽  
pp. 264-270
Author(s):  
Eydar Tey ◽  
Zulkarnain Zainal ◽  
Kean Pah Lim ◽  
Ismayadi Ismail
Keyword(s):  
Surface Roughness ◽  
Polyethylene Glycol ◽  
Copper Substrate ◽  
Trivalent Chromium ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Chromium Plating ◽  
Atomic Force ◽  
Cr Coating

Conventionally, chromium is deposited from hexavalent chromium baths containing extremely toxic compounds of Cr (VI). Due to serious health and environmental concerns of Cr (VI), trivalent chromium bath is proposed as a counter approach towards greener and safer chromium plating. In the present work, chromium coatings were electrodeposited onto copper substrate using a modified trivalent chromium electroplating bath with addition of polyethylene glycol (PEG 1500). The effects of PEG on the Cr coating were investigated. The crystalline structure, composition and surface morphology of the deposits were studied by X-ray diffraction (XRD), energy-dispersive X-ray spectroscopy (EDX) and scanning electron microscopy (SEM). The surface roughness of the coatings were characterized by atomic force microscopy (AFM). With addition of PEG, the surface roughness of Cr coating decreased by 44.5 % and the corrosion rate decreased by 23.3 % compared to that of without PEG. Meanwhile, the hardness increased by 22.7 %.

Sb surfactant-mediated epitaxy of Ge on Si(113) studied by AFM, SEM and GIXRD

2005 ◽  
Vol 901 ◽  
Author(s):  
Torben Clausen ◽  
Jan-Ingo Flege ◽  
Thomas Schmidt ◽  
Jens Falta
Keyword(s):  
Strain State ◽  
Strain Relaxation ◽  
Three Dimensional ◽  
Grazing Incidence ◽  
Interface Roughness ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Electron

AbstractWe have investigated the Sb surfactant-mediated growth of Ge on Si(113) over the temperature range from 500°C to 700°C. The surface morphology, film thickness, interface roughness and strain state of the films have been determined by the use of scanning electron microscopy, atomic force microscopy and grazing incidence x-ray diffraction. After growth at temperatures between 500°C and 600°C smooth Ge films have been observed, which show a partial strain relaxation. However, increasing the temperature to 700°C, a rough surface with a high density of three-dimensional islands has been found.

Investigation of the Effect of Uv-Assisted Oxidation and Nitridation of Hafnium Metal Films

2003 ◽  
Vol 780 ◽  
Author(s):  
C. Essary ◽  
V. Craciun ◽  
J. M. Howard ◽  
R. K. Singh
Keyword(s):  
Uv Radiation ◽  
Photoelectron Spectroscopy ◽  
Grazing Angle ◽  
X Ray Diffraction ◽  
Metal Thin Films ◽  
X Ray ◽  
Force Microscopy ◽  
Si Substrates ◽  
Atomic Force ◽  
Silicon Interface

AbstractHf metal thin films were deposited on Si substrates using a pulsed laser deposition technique in vacuum and in ammonia ambients. The films were then oxidized at 400 °C in 300 Torr of O2. Half the samples were oxidized in the presence of ultraviolet (UV) radiation from a Hg lamp array. X-ray photoelectron spectroscopy, atomic force microscopy, and grazing angle X-ray diffraction were used to compare the crystallinity, roughness, and composition of the films. It has been found that UV radiation causes roughening of the films and also promotes crystallization at lower temperatures.Furthermore, increased silicon oxidation at the interface was noted with the UVirradiated samples and was shown to be in the form of a mixed layer using angle-resolved X-ray photoelectron spectroscopy. Incorporation of nitrogen into the film reduces the oxidation of the silicon interface.

Low Molecular Weight Microfibers with Light Sensing Properties

2017 ◽  
Vol 54 (4) ◽  
pp. 655-658
Author(s):  
Andrei Bejan ◽  
Dragos Peptanariu ◽  
Bogdan Chiricuta ◽  
Elena Bicu ◽  
Dalila Belei
Keyword(s):  
Molecular Weight ◽  
Low Molecular Weight ◽  
X Ray Diffraction ◽  
Aromatic Rings ◽  
X Ray ◽  
Force Microscopy ◽  
Light Sensing ◽  
Sensing Applications ◽  
Atomic Force ◽  
Low Molecular Weight Compounds

Microfibers were obtained from organic low molecular weight compounds based on heteroaromatic and aromatic rings connected by aliphatic spacers. The obtaining of microfibers was proved by scanning electron microscopy. The deciphering of the mechanism of microfiber formation has been elucidated by X-ray diffraction, infrared spectroscopy, and atomic force microscopy measurements. By exciting with light of different wavelength, florescence microscopy revealed a specific optical response, recommending these materials for light sensing applications.

Nanocrystalline Solutions as Precursors to The Spray Deposition of Cdte Thin Films

1995 ◽  
Vol 382 ◽  
Author(s):  
Martin Pehnt ◽  
Douglas L. Schulz ◽  
Calvin J. Curtis ◽  
Helio R. Moutinho ◽  
Amy Swartzlander ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Grain Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Cdte Nanoparticles ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Cdte Thin Films

ABSTRACTIn this article we report the first nanoparticle-derived route to smooth, dense, phase-pure CdTe thin films. Capped CdTe nanoparticles were prepared by injection of a mixture of Cd(CH3)2, (n-C8H17)3 PTe and (n-C8H17)3P into (n-C8H17)3PO at elevated temperatures. The resultant nanoparticles 32-45 Å in diameter were characterized by x-ray diffraction, UV-Vis spectroscopy, transmission electron microscopy, thermogravimetric analysis and energy dispersive x-ray spectroscopy. CdTe thin film deposition was accomplished by dissolving CdTe nanoparticles in butanol and then spraying the solution onto SnO2-coated glass substrates at variable susceptor temperatures. Smooth and dense CdTe thin films were obtained using growth temperatures approximately 200 °C less than conventional spray pyrolysis approaches. CdTe films were characterized by x-ray diffraction, UV-Vis spectroscopy, atomic force microscopy, and Auger electron spectroscopy. An increase in crystallinity and average grain size as determined by x-ray diffraction was noted as growth temperature was increased from 240 to 300 °C. This temperature dependence of film grain size was further confirmed by atomic force microscopy with no remnant nanocrystalline morphological features detected. UV-Vis characterization of the CdTe thin films revealed a gradual decrease of the band gap (i.e., elimination of nanocrystalline CdTe phase) as the growth temperature was increased with bulk CdTe optical properties observed for films grown at 300 °C.

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