Interface between FGH96 Superalloy and Refractory Slurry with Different Soaking Time

2021 ◽  
Vol 1035 ◽  
pp. 318-327
Author(s):  
Yi Bo Zhang ◽  
Wen Yong Xu ◽  
Liang Zheng ◽  
Zhou Li ◽  
Guo Qing Zhang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Reaction Layer ◽  
Silica Sol ◽  
Contact Interface ◽  
Soaking Time ◽  
Internal Part ◽  
Thermodynamic Conditions ◽  
Micro Level ◽  
Scanning Electron

In this paper, the contact interface between FGH96 superalloy melts and refractory slurry with corundum powder and silica sol at 1600°C with different soaking time in 10-240 min range was investigated. The morphology and composition of the contact interface were studied by optical microscopy (OM), scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS). The results show that the reaction layer formed on the contact interface between the melting superalloy and the refractory slurry, and is mainly consist of Alumina and contains a small amount of other metal elements such as Ti and Cr. The reaction layer was not smooth on the micro level, and there was a peninsula-like structure protruding into the internal part of the melting superalloy on the reaction zone, and even started to fall off at some places to form islands. With the increase of soaking time, the reaction between melt of superalloy and refractory slurry increased gradually and the reaction layer began to combine with the refractory slurry substrate and form obvious interaction layered structure, resulting in the corrosion of refractory slurry substrate. With the soaking time over 120 min, the stable contact interface was destroyed. Thermodynamic calculation shows that the substitution reaction between Al in superalloy and SiO2 in refractory slurry meets the thermodynamic conditions, and the reaction can proceed forward.

Approaches to Solution Deposited Flexible Composite Vapor Barrier Films

2009 ◽  
Vol 1195 ◽  
Author(s):  
Jeffrey A. Gerbec ◽  
Jimmy Granstrom ◽  
Hunaid Nulwala ◽  
Luis M. Campos ◽  
Craig Hawker
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Compressive Stress ◽  
Interfacial Adhesion ◽  
Ambient Pressure ◽  
Silica Sol ◽  
Multilayered Structures ◽  
Barrier Films ◽  
Scanning Electron

AbstractLiquid resin hybridized silica sol-gels and thiol-ene elastomers were evaluated as compatible materials to form thin film, flexible multilayered structures. Liquid resins are cast and cured in air and ambient pressure on the order of minutes. Scanning Electron Microscopy (SEM) reveals homogeneous interfaces and robust interfacial adhesion under tensile and compressive stress. Thickness of the hybrid glass and thiol-ene films range from 0.80μm to 1.5μm and 8 μm to 16 μm respectively.

Preparation of β-Tricalcium Phosphate Containing Silica by CO2-Laser-Irradiation

2006 ◽  
Vol 309-311 ◽  
pp. 779-782 ◽  
Author(s):  
El-Sayed Ghaith ◽  
Toshihiro Kasuga ◽  
Masayuki Nogami
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Bone Formation ◽  
Laser Irradiation ◽  
Tricalcium Phosphate ◽  
Energy Dispersive Spectrometry ◽  
Silica Sol ◽  
X Ray ◽  
Modified Surface ◽  
Scanning Electron

Silicon is one of the essential ions with a stimulating effect on bone formation. β- tricalcium phosphate ceramic (β-TCP) with a modified surface containing silica was prepared in order to accelerate the bone formation. Sintered β-TCP pellets were spin-coated with a prehydrolyzed silica sol, and subsequently laser-irradiated using CO2 laser at the power of 6.5W. Scanning electron microscopy attached with X-ray energy dispersive spectrometry (SEM-EDS) showed that the silica was doped into the β-TCP surface. The silicon ion was released into a trisbuffer solution at pH 7.4 at 37 oC during one week of soaking.

Pathogenesis of Human Hair Defects

1974 ◽  
Vol 32 ◽  
pp. 12-13
Author(s):  
P.S. Porter ◽  
T. Aoyagi ◽  
R. Matta
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Human Hair ◽  
Standard Techniques ◽  
Scanning Electron

Using standard techniques of scanning electron microscopy (SEM), over 1000 human hair defects have been studied. In several of the defects, the pathogenesis of the abnormality has been clarified using these techniques. It is the purpose of this paper to present several distinct morphologic abnormalities of hair and to discuss their pathogenesis as elucidated through techniques of scanning electron microscopy.

Ultrastructural Analysis of the Salivary Glands of Gromphadorhina Portentosa (Schaum)

1977 ◽  
Vol 35 ◽  
pp. 638-639
Author(s):  
P.J. Dailey
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Salivary Glands ◽  
Secretory Vesicles ◽  
The Past ◽  
Transmission Electron ◽  
Means Of Transmission ◽  
Gromphadorhina Portentosa ◽  
Scanning Electron ◽  
Topographical Relief

The structure of insect salivary glands has been extensively investigated during the past decade; however, none have attempted scanning electron microscopy (SEM) in ultrastructural examinations of these secretory organs. This study correlates fine structure by means of SEM cryofractography with that of thin-sectioned epoxy embedded material observed by means of transmission electron microscopy (TEM).Salivary glands of Gromphadorhina portentosa were excised and immediately submerged in cold (4°C) paraformaldehyde-glutaraldehyde fixative1 for 2 hr, washed and post-fixed in 1 per cent 0s04 in phosphosphate buffer (4°C for 2 hr). After ethanolic dehydration half of the samples were embedded in Epon 812 for TEM and half cryofractured and subsequently critical point dried for SEM. Dried specimens were mounted on aluminum stubs and coated with approximately 150 Å of gold in a cold sputtering apparatus.Figure 1 shows a cryofractured plane through a salivary acinus revealing topographical relief of secretory vesicles.

Two- or three-way observations of the identical cell elements within the same sections by LM, TEM and/or SEM

1978 ◽  
Vol 36 (2) ◽  
pp. 82-83 ◽  
Author(s):  
Nakazo Watari ◽  
Yasuaki Hotta ◽  
Yoshio Mabuchi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Fine Structure ◽  
Light Microscopy ◽  
Thin Sections ◽  
Transmission Electron ◽  
Identical Cell ◽  
Electron Microscopes ◽  
Scanning Electron

It is very useful if we can observe the identical cell elements within the same sections by light microscopy (LM), transmission electron microscopy (TEM) and/or scanning electron microscopy (SEM) sequentially, because, the cell fine structure can not be indicated by LM, while the color is; on the other hand, the cell fine structure can be very easily observed by EM, although its color properties may not. However, there is one problem in that LM requires thick sections of over 1 μm, while EM needs very thin sections of under 100 nm. Recently, we have developed a new method to observe the same cell elements within the same plastic sections using both light and transmission (conventional or high-voltage) electron microscopes.In this paper, we have developed two new observation methods for the identical cell elements within the same sections, both plastic-embedded and paraffin-embedded, using light microscopy, transmission electron microscopy and/or scanning electron microscopy (Fig. 1).

Spontaneous Cataract in Nude Athymic Mice

1977 ◽  
Vol 35 ◽  
pp. 512-513
Author(s):  
Ronald H. Bradley ◽  
R. S. Berk ◽  
L. D. Hazlett
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Nude Mouse ◽  
Cellular Immunity ◽  
Phosphate Buffer ◽  
Osmium Tetroxide ◽  
Athymic Mice ◽  
Transmission Microscopy ◽  
Mouse Lens ◽  
Scanning Electron

The nude mouse is a hairless mutant (homozygous for the mutation nude, nu/nu), which is born lacking a thymus and possesses a severe defect in cellular immunity. Spontaneous unilateral cataractous lesions were noted (during ocular examination using a stereomicroscope at 40X) in 14 of a series of 60 animals (20%). This transmission and scanning microscopic study characterizes the morphology of this cataract and contrasts these data with normal nude mouse lens.All animals were sacrificed by an ether overdose. Eyes were enucleated and immersed in a mixed fixative (1% osmium tetroxide and 6% glutaraldehyde in Sorenson's phosphate buffer pH 7.4 at 0-4°C) for 3 hours, dehydrated in graded ethanols and embedded in Epon-Araldite for transmission microscopy. Specimens for scanning electron microscopy were fixed similarly, dehydrated in graded ethanols, then to graded changes of Freon 113 and ethanol to 100% Freon 113 and critically point dried in a Bomar critical point dryer using Freon 13 as the transition fluid.

Scanning and Transmission Microscopy of Nematocyst Batteries in Epitheliomuscular Cells of Hydra

1971 ◽  
Vol 29 ◽  
pp. 410-411 ◽  
Author(s):  
Jane A. Westfall ◽  
S. Yamataka ◽  
Paul D. Enos
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Osmium Tetroxide ◽  
External Surface ◽  
Three Dimensional ◽  
Surface Structures ◽  
Transmission Microscopy ◽  
Transmission Electron ◽  
Freeze Dried ◽  
Scanning Electron

Scanning electron microscopy (SEM) provides three dimensional details of external surface structures and supplements ultrastructural information provided by transmission electron microscopy (TEM). Animals composed of watery jellylike tissues such as hydras and other coelenterates have not been considered suitable for SEM studies because of the difficulty in preserving such organisms in a normal state. This study demonstrates 1) the successful use of SEM on such tissue, and 2) the unique arrangement of batteries of nematocysts within large epitheliomuscular cells on tentacles of Hydra littoralis.Whole specimens of Hydra were prepared for SEM (Figs. 1 and 2) by the fix, freeze-dry, coat technique of Small and Màrszalek. The specimens were fixed in osmium tetroxide and mercuric chloride, freeze-dried in vacuo on a prechilled 1 Kg brass block, and coated with gold-palladium. Tissues for TEM (Figs. 3 and 4) were fixed in glutaraldehyde followed by osmium tetroxide. Scanning micrographs were taken on a Cambridge Stereoscan Mark II A microscope at 10 KV and transmission micrographs were taken on an RCA EMU 3G microscope (Fig. 3) or on a Hitachi HU 11B microscope (Fig. 4).

Microbulldozing and Microchiseling

1969 ◽  
Vol 27 ◽  
pp. 134-135
Author(s):  
J.N. Ramsey ◽  
D.P. Cameron ◽  
F.W. Schneider
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Material Handling ◽  
Microprobe Analysis ◽  
Foreign Matter ◽  
Specific Location ◽  
Potential Problems ◽  
Knoop Indenter ◽  
Scanning Electron ◽  
Microhardness Tester

As computer components become smaller the analytical methods used to examine them and the material handling techniques must become more sensitive, and more sophisticated. We have used microbulldozing and microchiseling in conjunction with scanning electron microscopy, replica electron microscopy, and microprobe analysis for studying actual and potential problems with developmental and pilot line devices. Foreign matter, corrosion, etc, in specific locations are mechanically loosened from their substrates and removed by “extraction replication,” and examined in the appropriate instrument. The mechanical loosening is done in a controlled manner by using a microhardness tester—we use the attachment designed for our Reichert metallograph. The working tool is a pyramid shaped diamond (a Knoop indenter) which can be pushed into the specimen with a controlled pressure and in a specific location.

A New Image Processing Technique for STEM

1974 ◽  
Vol 32 ◽  
pp. 432-433
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Scanning Electron Microscopy ◽  
Elastic Scattering ◽  
Field Emission ◽  
Processing Technique ◽  
Image Processing Technique ◽  
Energy Analyzer ◽  
Scanning Microscope ◽  
Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

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