MOCVD Growth and Annealing of Gallium Oxide Thin Film and Its Structural Characterization
2005 ◽
Vol 475-479
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pp. 3377-3380
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Keyword(s):
We have demonstrated the production of gallium oxide thin films on various substrates such as Si(111), SiO2, and sapphire by metalorganic chemical vapor deposition using the trimethylgallium (TMGa) as a precursor in the presence of oxygen. The XRD data revealed that the as-deposited gallium oxide films were fully amorphous but very small crystallites with monoclinic structures were found with the thermal annealing at a sufficiently high temperature, regardless of substrate materials. The AFM analysis indicated that the surface roughness increased by the thermal annealing.
1999 ◽
Vol 17
(1)
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pp. 83-87
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1993 ◽
Vol 140-142
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pp. 457-464
2000 ◽
Vol 18
(5)
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pp. 2384
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1995 ◽
Vol 34
(Part 1, No. 12A)
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pp. 6321-6325
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2000 ◽
Vol 181-182
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pp. 93-100
2005 ◽
Vol 44
(No. 4)
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pp. L150-L152
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