Microstructure and Properties of Directionally Solidified NbSi2/ Nb5Si3 Composites

2005 ◽  
Vol 475-479 ◽  
pp. 733-736 ◽  
Author(s):  
Wei Li ◽  
Hai Bo Yang ◽  
Ai Dang Shan ◽  
Lan Ting Zhang ◽  
Jian Sheng Wu

NbSi2 is an attractive material for high temperature applications due to its high melting point, low density and good oxidation resistance. The high-temperature strength of NbSi2 is expected to be further improved by incorporation with Nb5Si3, which performs a high creep resistance and strength at high temperature due to its complex crystal structure. In this paper, directionally solidified NbSi2/ Nb5Si3 in-situ composites have been prepared using an optical floating zone method. Scanning Electron Microscopes (SEM) and X-ray diffraction (XRD) have been used to investigate the phase constitution and microstructure. The orientation relationship between Nb5Si3 and NbSi2 is investigated by transmission electron microscopy (TEM). High-temperature properties of alloys are tested by compression at the strain rate of 1×10-4/s at 1673K and 1773K. It was found that high temperature strength and phase constitution of directionally solidified alloys depended on the addition of Mo.

Author(s):  
A. Garg ◽  
R. D. Noebe ◽  
R. Darolia

Small additions of Hf to NiAl produce a significant increase in the high-temperature strength of single crystals. Hf has a very limited solubility in NiAl and in the presence of Si, results in a high density of G-phase (Ni16Hf6Si7) cuboidal precipitates and some G-platelets in a NiAl matrix. These precipitates have a F.C.C structure and nucleate on {100}NiAl planes with almost perfect coherency and a cube-on-cube orientation-relationship (O.R.). However, G-phase is metastable and after prolonged aging at high temperature dissolves at the expense of a more stable Heusler (β'-Ni2AlHf) phase. In addition to these two phases, a third phase was shown to be present in a NiAl-0.3at. % Hf alloy, but was not previously identified (Fig. 4 of ref. 2 ). In this work, we report the morphology, crystal-structure, O.R., and stability of this unknown phase, which were determined using conventional and analytical transmission electron microscopy (TEM).Single crystals of NiAl containing 0.5at. % Hf were grown by a Bridgman technique. Chemical analysis indicated that these crystals also contained Si, which was not an intentional alloying addition but was picked up from the shell mold during directional solidification.


Author(s):  
H. Kung ◽  
T. R. Jervis ◽  
J.-P. Hirvonen ◽  
M. Nastasi ◽  
T. E. Mitchell ◽  
...  

MoSi2 is a potential matrix material for high temperature structural composites due to its high melting temperature and good oxidation resistance at elevated temperatures. The two major drawbacksfor structural applications are inadequate high temperature strength and poor low temperature ductility. The search for appropriate composite additions has been the focus of extensive investigations in recent years. The addition of SiC in a nanolayered configuration was shown to exhibit superior oxidation resistance and significant hardness increase through annealing at 500°C. One potential application of MoSi2- SiC multilayers is for high temperature coatings, where structural stability ofthe layering is of major concern. In this study, we have systematically investigated both the evolution of phases and the stability of layers by varying the heat treating conditions.Alternating layers of MoSi2 and SiC were synthesized by DC-magnetron and rf-diode sputtering respectively. Cross-sectional transmission electron microscopy (XTEM) was used to examine three distinct reactions in the specimens when exposed to different annealing conditions: crystallization and phase transformation of MoSi2, crystallization of SiC, and spheroidization of the layer structures.


1997 ◽  
Vol 3 (S2) ◽  
pp. 1243-1244 ◽  
Author(s):  
Raynald Gauvin ◽  
Steve Yue

The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate the microscope with incident electron energy, E0, below 5 keV with probe diameter smaller than 5 nm. At 1 keV, the electron range is 60 nm in aluminum and 10 nm in iron (computed using the CASINO program). Since the electron beam diameter is smaller than 5 nm at 1 keV, the resolution of these microscopes becomes closer to that of TEM.


Metals ◽  
2019 ◽  
Vol 9 (10) ◽  
pp. 1026 ◽  
Author(s):  
Abbas Bahrami ◽  
Peyman Taheri

This paper investigates a failure in HP-Mod radiant tubes in a petrochemical plant. Tubes fail after 90,000 h of working at 950 °C. Observed failure is in the form of excessive bulging and longitudinal cracking in reformer tubes. Cracks are also largely branched. The microstructure of service-exposed tubes was evaluated using optical and scanning electron microscopes (SEM). Energy-dispersive X-ray spectroscopy (EDS) was used to analyze and characterize different phases in the microstructure. The results of this study showed that carbides are coarsened at both the inner and the outer surface due to the long exposure to a carburizing environment. Metallography examinations also revealed that there are many creep voids that are nucleated on carbide phases and scattered in between dendrites. Cracks appeared to form as a result of creep void coalescence. Failure is therefore attributed to creep due to a long exposure to a high temperature.


1979 ◽  
Author(s):  
M. Marshall ◽  
J. Staubesand ◽  
H. Hese

The arteries of mini pigs which had been exposed to the local or systemic action of recognised ‘risk factors’ for arterial disease were examined with the light microscope, and the transmission and scanning electron microscopes. Initially the scanning instrument revealed adhesions of platelets in different stages of development, but showed an apparently intact endothelium. With the transmission electron microscope, however, degenerative changes in the endothelium could be observed. Increased blood platelet aggregation was also present. After a few weeks we could see a remarkable focal thickening of the intima, together with deposits on the endothelium of platelets, erythrocytes and fibrin (“mixed microparietal thrombosis”). After 6 months fully developed arteriosclerosis of the abdominal aorta had appeared.


2007 ◽  
Vol 353-358 ◽  
pp. 890-893
Author(s):  
Chun Liang Zhang ◽  
Li Ping Chen ◽  
Bin He

Laser cladding of Co-base alloy on the sealing surfaces of nuclear valve clacks has been performed with a 5KW CO2 transverse flowing laser. The laser cladding was compared with plasma spraying. Both laser cladded and plasma sprayed zones were characterized by optical and scanning electron microscopes. The high temperature impact-slide wear resistance of laser cladded and plasma sprayed coatings were studied. The experimental results showed that compared with that of plasma sprayed coating, the laser cladded coating has higher microhardness, more uniform microstructure, smaller grain size, lower dilution rate, and fewer pores and impurities. The experimental results also showed that the weight loss of plasma sprayed coating during the high temperature impact-slide wear is two times larger than that of laser cladded coating.


2005 ◽  
Vol 69 (6) ◽  
pp. 488-492
Author(s):  
Yonosuke Murayama ◽  
Shuji Hanada ◽  
Jong Ho Lee ◽  
Akira Yoshikawa ◽  
Tsuguo Fukuda

2010 ◽  
Vol 644 ◽  
pp. 1-7 ◽  
Author(s):  
Joaquim Portillo ◽  
Edgar F. Rauch ◽  
Stavros Nicolopoulos ◽  
Mauro Gemmi ◽  
Daniel Bultreys

Precession electron diffraction (PED) is a new promising technique for electron diffraction pattern collection under quasi-kinematical conditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique may be used in TEM instruments of voltages 100 to 400 kV and is an effective upgrade of the TEM instrument to a true electron diffractometer. The PED technique, when combined with fast electron diffraction acquisition and pattern matching software techniques, may also be used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscattered Diffraction (EBSD) technique in Scanning Electron Microscopes (SEM) at lower magnifications and longer acquisition times.


2001 ◽  
Vol 7 (S2) ◽  
pp. 574-575
Author(s):  
Bernhard Frost ◽  
David C Joy

Even though all real objects are three dimensional, imaging and metrology performed by using electron-beam tools such as scanning electron microscopes is inherently two dimensional. Any information about the third dimension must therefore be obtained by inference, or by time consuming special methods such as stereo-photogrammetry. If, however, the structures of interest are thin enough to be electron transparent then quantitative three dimensional metrology can be performed directly by using off-axis transmission electron holography. Here we demonstrate the application to a SCALPEL lithography mask which consists of chromium lines on a silicon support film. The off-axis holography was performed in a field emission transmission electron microscope, a Hitachi HF2000 operated at 200keV. The sample is positioned so that half the beam passes through the specimen while the rest travels only through the vacuum. An electrostatic biprism then recombines these two components to form the hologram which is recorded onto a CCD camera.


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