Electric Field Characterization of Diamond Metal Semiconductor Field Effect Transistors Using Electron Beam Induced Current

2018 ◽  
Vol 924 ◽  
pp. 935-938
Author(s):  
Khaled Driche ◽  
Hitoshi Umezawa ◽  
Shinya Ohmagari ◽  
Hajime Okumura ◽  
Yoshiaki Mokuno ◽  
...  
Keyword(s):  
Electron Beam ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Depletion Region ◽  
Induced Current ◽  
Electron Beam Induced Current ◽  
Effect Transistor ◽  
Lateral Gate ◽  
P Type

Lateral gate depletion expansion towards drain contact has been analyzed on p-type diamond metal-semiconductor field effect transistor by electron beam induced current. The investigation was restricted to a closed channel to simplify the study and to directly observe the expansion of the lateral depletion region. The experimental data agreed with the theoretical model given in the literature.

Application of Two-pin EBIC Technique to Isolate the Defective Fin(s) in Advanced Bulk FinFET Devices

2019 ◽  
Author(s):  
Kah Chin Cheong ◽  
Liangshan Chen ◽  
Yuting Wei ◽  
Yu Zhang ◽  
Brian Popielarski ◽  
...  
Keyword(s):  
Electron Beam ◽  
Basic Principle ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Gate Oxide ◽  
Induced Current ◽  
Isolation Technique ◽  
Electron Beam Induced Current ◽  
Effect Transistor ◽  
Absorption Current

Abstract This paper demonstrates a two-pin Electron Beam Induced Current (EBIC) isolation technique to isolate the defective Fin with gate oxide damage in advanced Fin Field Effect Transistor (FinFET) devices. The basic principle of this twopin configuration is similar to two-point Electron Beam Absorption Current (EBAC) technique: a second pin as ground on the gate is added to partially shunt the EBIC current and thus creates EBIC contrast from the defective Fin. In this way, the challenge of highly resistive short path inside the Fin in a narrow gate can be overcome. The paper will provide failure analysis details using this technique for defective Fin isolation.

scholarly journals 2,2'-(Arylenedivinylene)bis-8-hydroxyquinolines exhibiting aromatic π-π stacking interactions as solution-processable p-type organic semiconductors for high-performance organic field effect transistors

2021 ◽  
Author(s):  
Suman Yadav ◽  
Shivani Sharma ◽  
Satinder K Sharma ◽  
Chullikkattil P. Pradeep
Keyword(s):  
Organic Semiconductors ◽  
Field Effect ◽  
High Performance ◽  
Field Effect Transistor ◽  
Field Effect Transistors ◽  
Organic Field Effect Transistors ◽  
Organic Thin Film ◽  
Effect Transistor ◽  
Solution Processable ◽  
P Type

Solution-processable organic semiconductors capable of functioning at low operating voltages (~5 V) are in demand for organic field-effect transistor (OFET) applications. Exploration of new classes of compounds as organic thin-film...

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