Spin Filtering on the MnSb Cluster Interface in GaSbMn Thin Films

2015 ◽  
Vol 233-234 ◽  
pp. 643-647 ◽  
Author(s):  
Oksana Koplak ◽  
Alexey Polyakov ◽  
Alexander Davydov ◽  
Roman Morgunov ◽  
Artem Talantsev ◽  
...  

Effect of charge carriers concentration on magnetic parameters of the ferromagnetic MnSb nanoclusters as well as opposite effect of cluster magnetization on spin polarization of holes and magnetoresistance were observed in GaSbMn thin films. Microwave magneto-resistance effect is evidence of the charge carriers spin filtering by ferromagnetic clusters.

2021 ◽  
Vol 23 (3) ◽  
pp. 2368-2376
Author(s):  
A. Di Trolio ◽  
A. Amore Bonapasta ◽  
C. Barone ◽  
A. Leo ◽  
G. Carapella ◽  
...  

Co doping increases the ZnO resistivity (ρ) at high T (HT), whereas it has an opposite effect at low T (LT). H balances the Co effects by neutralizing the ρ increase at HT and strengthening its decrease at LT.


2006 ◽  
Vol 514-516 ◽  
pp. 1155-1160 ◽  
Author(s):  
Talaat Moussa Hammad

Sol gel indium tin oxide thin films (In: Sn = 90:10) were prepared by the sol-gel dipcoating process on silicon buffer substrate. The precursor solution was prepared by mixing SnCl2.2H2O and InCl3 dissolved in ethanol and acetic acid. The crystalline structure and grain orientation of ITO films were determined by X-ray diffraction. The surface morphology of the films was characterized by scanning electron microscope (SEM). Optical transmission and reflectance spectra of the films were analyzed by using a UV-visible spectrophotometer. The transport properties of majority charge carriers for these films were studied by Hall measurement. ITO thin film with electrical resistivity of 7.6 ×10-3 3.cm, Hall mobility of approximately 2 cm2(Vs)-1 and free carrier concentration of approximately 4.2 ×1020 cm-3 are obtained for films 100 nm thick films. The I-V curve measurement showed typical I-V characteristic behavior of sol gel ITO thin films.


2008 ◽  
Vol 78 (18) ◽  
Author(s):  
A. V. Ramos ◽  
T. S. Santos ◽  
G. X. Miao ◽  
M.-J. Guittet ◽  
J.-B. Moussy ◽  
...  

2015 ◽  
Vol 16 (2) ◽  
pp. 302-306
Author(s):  
O.M. Bordun ◽  
B.O. Bordun ◽  
V.B. Lushchanets ◽  
I.Yo. Kukharskyy

Fundamental absorption edge of b–Ga2O3 thin films, obtained by radio-frequency ion-plasmous sputtering, was investigated, using the method of optical spectroscopy. It was ascertained that the optical band gap Eg increases from 4.60 to 4.65 eV after the heat treatment films in argon atmosphere and to 5.20 eV after the reduction of annealed films in a hydrogen atmosphere. Consolidated effective mass of free charge carriers in b–Ga2O3 films after annealing and after reduction in hydrogen was estimated. It was found that the concentration of charge carriers after heat treatment in argon atmosphere is 7.30´1017 cm–3 and after reduction in hydrogen, is 2.62´1019 cm–3, which is typical for degenerated semiconductors. It was shown that the shift of fundamental absorption edge in thin films b–Ga2O3 after reduction in hydrogen is caused by Burstein-Moss effect.


2005 ◽  
Vol 82 (3) ◽  
pp. 471-474 ◽  
Author(s):  
O. Rabin ◽  
K. Nielsch ◽  
M.S. Dresselhaus

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