scholarly journals A RECORDING AND DOCUMENTATION SYSTEM OF BUILDING STOCK: THE CASE OF PENTALOFOS SETTLEMENT IN KOZANI (GREECE)

2016 ◽  
Author(s):  
Nikolaos Lianos ◽  
Anastasios Anastasios
Keyword(s):  
Documentation System ◽  
Building Stock ◽  
Gis Application ◽  
Area Of Interest ◽  
Construction Property ◽  
Structure Morphology ◽  
Efficient Integration ◽  
Geographic Background ◽  
Technical Features ◽  
Architectural Documentation

Facing the need for effective and efficient integration of spatial and descriptive information related to the documentation of the cultural heritage, the primary aim of this project is the production of a dynamic geodatabase in order to collect, record and organize cartographic and architectural data as well as morphological and typological features of Pentalofos settlement into a GIS application. For this purpose, the project is meant, among other things, to complete a thorough research on the evolution of the settlement and its context, create the necessary geographic background for the documentation of the area of interest and to record building's technical features among others (year of construction, property status, structure, morphology, typology, description of current condition, pathology etc) by implementing traditional and up-to-date as well architectural documentation methods.

Image registration with a computer driven S.T.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 98-99
Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema
Keyword(s):  
Spot Size ◽  
Scanning Transmission Electron Microscope ◽  
Small Computer ◽  
Structural Studies ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Specimen Area ◽  
On Line ◽  
Minimum Distances

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.

Advanced TEM sample preparation techniques for submicron Si devices

1995 ◽  
Vol 53 ◽  
pp. 516-517 ◽  
Author(s):  
P. B. Basham ◽  
H. L. Tsai
Keyword(s):  
Sample Preparation ◽  
Process Development ◽  
Light Transmission ◽  
Specific Area ◽  
Turnaround Time ◽  
Small Hole ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Polished Side ◽  
Preparation Techniques

The use of transmission electron microscopy (TEM) to support process development of advanced microelectronic devices is often challenged by a large amount of samples submitted from wafer fabrication areas and specific-spot analysis. Improving the TEM sample preparation techniques for a fast turnaround time is critical in order to provide a timely support for customers and improve the utilization of TEM. For the specific-area sample preparation, a technique which can be easily prepared with the least amount of effort is preferred. For these reasons, we have developed several techniques which have greatly facilitated the TEM sample preparation.For specific-area analysis, the use of a copper grid with a small hole is found to be very useful. With this small-hole grid technique, TEM sample preparation can be proceeded by well-established conventional methods. The sample is first polished to the area of interest, which is then carefully positioned inside the hole. This polished side is placed against the grid by epoxy Fig. 1 is an optical image of a TEM cross-section after dimpling to light transmission.

A technique for preparing semiconductor cross sections for both TEM and SEM analysis

1989 ◽  
Vol 47 ◽  
pp. 712-713
Author(s):  
Stanley J. Klepeis ◽  
J.P. Benedict ◽  
R.M Anderson
Keyword(s):  
Sample Preparation ◽  
Cross Section ◽  
Cross Sections ◽  
Sem Analysis ◽  
Preparation Technique ◽  
Ion Milling ◽  
Tem Analysis ◽  
Polished Cross Section ◽  
Area Of Interest ◽  
Polished Side

The ability to prepare a cross-section of a specific semiconductor structure for both SEM and TEM analysis is vital in characterizing the smaller, more complex devices that are now being designed and manufactured. In the past, a unique sample was prepared for either SEM or TEM analysis of a structure. In choosing to do SEM, valuable and unique information was lost to TEM analysis. An alternative, the SEM examination of thinned TEM samples, was frequently made difficult by topographical artifacts introduced by mechanical polishing and lengthy ion-milling. Thus, the need to produce a TEM sample from a unique,cross-sectioned SEM sample has produced this sample preparation technique.The technique is divided into an SEM and a TEM sample preparation phase. The first four steps in the SEM phase: bulk reduction, cleaning, gluing and trimming produces a reinforced sample with the area of interest in the center of the sample. This sample is then mounted on a special SEM stud. The stud is inserted into an L-shaped holder and this holder is attached to the Klepeis polisher (see figs. 1 and 2). An SEM cross-section of the sample is then prepared by mechanically polishing the sample to the area of interest using the Klepeis polisher. The polished cross-section is cleaned and the SEM stud with the attached sample, is removed from the L-shaped holder. The stud is then inserted into the ion-miller and the sample is briefly milled (less than 2 minutes) on the polished side. The sample on the stud may then be carbon coated and placed in the SEM for analysis.

Area of interest/field-of-view research using ASPT.

1978 ◽  
Author(s):  
W. Dean LeMaster ◽  
Thomas M. Longridge
Keyword(s):  
Field Of View ◽  
Area Of Interest

Web Based GIS Application using Open Source Software for Sharing Geospatial Data

2015 ◽  
Vol 4 (1) ◽  
pp. 1224-1228 ◽  
Author(s):  
Debasish Chakraborty ◽  
◽  
Debanjan Sarkar ◽  
Shubham Agarwal ◽  
Dibyendu Dutta ◽  
...  
Keyword(s):  
Open Source ◽  
Open Source Software ◽  
Geospatial Data ◽  
Web Based ◽  
Gis Application

Determinants Considered by Consumers for Brand Selection - with Reference to Laptops in Albania

2014 ◽  
Vol 4 (2) ◽  
Author(s):  
Margret Plloçi ◽  
Macit Koc
Keyword(s):  
Primary Data ◽  
Battery Life ◽  
Decision Making Process ◽  
Light Weight ◽  
Sources Of Information ◽  
Technical Features ◽  
The Relationship ◽  
The City ◽  
Different Sources ◽  
Core Features

Abstract Purpose of the article There is relatively a big number of brands in the market of laptops nowadays in Albania. It appears that the number of brands offered in this market could easily be compared to the number of brands in Europe and even broader. The purpose of this study is to help Albanian vendors understand the criteria that consumers take into consideration when they make the decision to purchase a laptop. Methodology/methods The research is based on the collection and the analyses of the primary data collected through interviews to people like managers or employees who work in the sector of trading laptops or in businesses like education where laptops are broadly used recently; then a survey is done through a questionnaire delivered to customers who already own and use a laptop and customers who are potential buyers of laptops. Scientific aim The aim of the research is to identify if there are any relationships between the demographics of the consumers and the criteria of buying a laptop; on the other hand, to find out how is the relationship between the demographics and the features of different brands. Findings The study found out that Albanian consumers have good knowledge of laptops and their brands, and they use different sources of information for making their decisions in buying a laptop; it is found that there are relationships between some demographics like age or gender and the appraisal for some attributes of the laptops like price, design and high graphics card; it is also found that some technical features and other attributes of using laptops are some of the determinants that influence the laptops’ purchases. Conclusions It is realized that one of the most important demographics of the consumers is their age. Some core features like RAM, ROM, battery life, processor quality, light weight or attributes that are connected to the purposes of using the laptop computers like practicality and mobility in using them, work and studying processes, quick access to the internet are determinant factors which influence the decision making process of purchasing a laptop. I would recommend that future researches be focused also on the relationship between the customers’ income and their preferred brand or ranking brands according to the customers’ preferences. Such studies should also extend outside the city of Tirana.

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