Advanced architecture ofCdHgTe photodiode for detection of weak infrared radiation
The dark currents of CdHgTe photodiodes based on the advanced architecture, which isused inthreshold FPAfordetection ofweak infrared radiation,have been analyzed. Theopposite conductivity regions areformedof in wide-gap layers, thatreducesthe contribution of theSRHgeneration-recombination currents of to the total dark current.By using various compositions layers with transition sublayers reducing surface recombination at the interfaces, one canre-duce the surface mechanismcontributionto the total dark current of the photodiode. Finally, due to the correct choice of the absorption layer composition and wide-gap layer parameters, dark current in the space charge region ismuch lower than аdiffusion currentcausing by Auger mechanismin the absorption region for a given cutoff wavelength.