Effects of erbium doping of indium tin oxide electrode in resistive random access memory

2016 ◽  
Vol 9 (3) ◽  
pp. 034202 ◽  
Author(s):  
Po-Hsun Chen ◽  
Kuan-Chang Chang ◽  
Ting-Chang Chang ◽  
Tsung-Ming Tsai ◽  
Chih-Hung Pan ◽  
...  
2016 ◽  
Vol 37 (5) ◽  
pp. 584-587 ◽  
Author(s):  
Po-Hsun Chen ◽  
Kuan-Chang Chang ◽  
Ting-Chang Chang ◽  
Tsung-Ming Tsai ◽  
Chih-Hung Pan ◽  
...  

2015 ◽  
Vol 36 (11) ◽  
pp. 1138-1141 ◽  
Author(s):  
Ji Chen ◽  
Kuan-Chang Chang ◽  
Ting-Chang Chang ◽  
Tsung-Ming Tsai ◽  
Chih-Hung Pan ◽  
...  

2016 ◽  
Vol 63 (11) ◽  
pp. 4288-4294 ◽  
Author(s):  
Po-Hsun Chen ◽  
Kuan-Chang Chang ◽  
Ting-Chang Chang ◽  
Tsung-Ming Tsai ◽  
Chih-Hung Pan ◽  
...  

RSC Advances ◽  
2017 ◽  
Vol 7 (19) ◽  
pp. 11585-11590 ◽  
Author(s):  
Cong Ye ◽  
Jia-Ji Wu ◽  
Chih-Hung Pan ◽  
Tsung-Ming Tsai ◽  
Kuan-Chang Chang ◽  
...  

A low temperature supercritical fluid nitridation (SCF-nitridation) technique was investigated to dope nitrogen into a indium-tin-oxide (ITO) electrode to boost the performance of hafnium oxide resistive random access memory (RRAM).


2016 ◽  
Vol 63 (12) ◽  
pp. 4769-4775 ◽  
Author(s):  
Po-Hsun Chen ◽  
Ting-Chang Chang ◽  
Kuan-Chang Chang ◽  
Tsung-Ming Tsai ◽  
Chih-Hung Pan ◽  
...  

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