Investigation of the properties of deep-level defect in Cu(In,Ga)Se2thin films by steady-state photocapacitance and time-resolved photoluminescence measurements
2015 ◽
Vol 54
(4S)
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pp. 04DR02
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2006 ◽
Vol 527-529
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pp. 461-464
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Keyword(s):
2011 ◽
Vol 131
(12)
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pp. 2792-2802
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Keyword(s):
2015 ◽
Vol 167
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pp. 333-338
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Keyword(s):
Keyword(s):