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2009 International Symposium on VLSI Technology, Systems, and Applications
Latest Publications
TOTAL DOCUMENTS
78
(FIVE YEARS 0)
H-INDEX
6
(FIVE YEARS 0)
Published By IEEE
9781424427840
Latest Documents
Most Cited Documents
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Related Keywords
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
The device architecture dilemma for CMOS technologies: Opportunities & challenges of finFET over planar MOSFET
2009 International Symposium on VLSI Technology, Systems, and Applications
◽
10.1109/vtsa.2009.5159300
◽
2009
◽
Cited By ~ 18
Author(s):
B. Parvais
◽
A. Mercha
◽
N. Collaert
◽
R. Rooyackers
◽
I. Ferain
◽
...
Keyword(s):
Device Architecture
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Impacts of NBTI on SRAM array with power gating structure
2009 International Symposium on VLSI Technology, Systems, and Applications
◽
10.1109/vtsa.2009.5159298
◽
2009
◽
Cited By ~ 1
Author(s):
Hao-I Yang
◽
Ching-Te Chuang
◽
Wei Hwang
Keyword(s):
Power Gating
Get full-text (via PubEx)
Nanoelectromechanical systems for ultra-low-power computing and VLSI
2009 International Symposium on VLSI Technology, Systems, and Applications
◽
10.1109/vtsa.2009.5159286
◽
2009
◽
Author(s):
Philip Feng
Keyword(s):
Low Power
◽
Nanoelectromechanical Systems
◽
Ultra Low Power
◽
Low Power Computing
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CMOS technology roadmap projection including parasitic effects
2009 International Symposium on VLSI Technology, Systems, and Applications
◽
10.1109/vtsa.2009.5159299
◽
2009
◽
Cited By ~ 7
Author(s):
Lan Wei
◽
Frederic Boeuf
◽
Thomas Skotnicki
◽
H.-S. Philip Wong
Keyword(s):
Cmos Technology
◽
Technology Roadmap
◽
Parasitic Effects
Get full-text (via PubEx)
Inversion-type surface channel In0.53]Ga{in0.47As metal-oxide-semiconductor field-effect transistors with metal-gate/high-k dielectric stack and CMOS-compatible PdGe contacts
2009 International Symposium on VLSI Technology, Systems, and Applications
◽
10.1109/vtsa.2009.5159330
◽
2009
◽
Author(s):
Hock-Chun Chin
◽
Xinke Liu
◽
Leng-Seow Tan
◽
Yee-Chia Yeo
Keyword(s):
Metal Oxide
◽
Field Effect
◽
Field Effect Transistors
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Metal Gate
◽
High K
◽
Cmos Compatible
◽
High K Dielectric
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High-κ/metal gate low power bulk technology - Performance evaluation of standard CMOS logic circuits, microprocessor critical path replicas, and SRAM for 45nm and beyond
2009 International Symposium on VLSI Technology, Systems, and Applications
◽
10.1109/vtsa.2009.5159305
◽
2009
◽
Author(s):
D.-G. Park
◽
K. Stein
◽
K. Schruefer
◽
Y. Lee
◽
J.-P. Han
◽
...
Keyword(s):
Performance Evaluation
◽
Low Power
◽
Critical Path
◽
Logic Circuits
◽
Metal Gate
◽
Bulk Technology
Get full-text (via PubEx)
Boron carbon nitride film containing hydrogen for 2nm node low-k interconnection
2009 International Symposium on VLSI Technology, Systems, and Applications
◽
10.1109/vtsa.2009.5159270
◽
2009
◽
Author(s):
Hidemitsu Aoki
◽
Takuroh Masuzumi
◽
Makoto Hara
◽
Daisuke Watanabe
◽
Chiharu Kimura
◽
...
Keyword(s):
Carbon Nitride
◽
Nitride Film
◽
Carbon Nitride Film
◽
Boron Carbon Nitride
◽
Low K
◽
Boron Carbon
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Single-Metal Dual-Dielectric (SMDD) gate-first CMOS integration towards low VT and high performance
2009 International Symposium on VLSI Technology, Systems, and Applications
◽
10.1109/vtsa.2009.5159287
◽
2009
◽
Author(s):
L.-A. Ragnarsson
◽
T. Schram
◽
E. Rohr
◽
F. Sebaai
◽
P. Kelkar
◽
...
Keyword(s):
High Performance
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A novel Multi - Nitridation ONO interpoly dielectric (MN-ONO) for highly reliable and high performance NAND Flash memory
2009 International Symposium on VLSI Technology, Systems, and Applications
◽
10.1109/vtsa.2009.5159280
◽
2009
◽
Cited By ~ 2
Author(s):
C. H. Liu
◽
Y. M. Lin
◽
Y. Sakamoto
◽
R. J. Yang
◽
D. Y. Yin
◽
...
Keyword(s):
Flash Memory
◽
High Performance
◽
Nand Flash
◽
Nand Flash Memory
Get full-text (via PubEx)
Characterization of poly-Silicon emitter BJTs as access devices for Phase Change Memory
2009 International Symposium on VLSI Technology, Systems, and Applications
◽
10.1109/vtsa.2009.5159278
◽
2009
◽
Cited By ~ 6
Author(s):
B. Rajendran
◽
M. Breitwisch
◽
R. Cheek
◽
M-H. Lee
◽
Y-H. Shih
◽
...
Keyword(s):
Phase Change
◽
Phase Change Memory
◽
Poly Silicon
◽
Change Memory
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