Automated Scanning Probe Microscopy as a New Tool for Combinatorial Polymer Research: Conductive Carbon Black/Poly(dimethylsiloxane) Composites

2003 ◽  
Vol 24 (1) ◽  
pp. 113-117 ◽  
Author(s):  
Riadh Neffati ◽  
Alexander Alexeev ◽  
Sergey Saunin ◽  
José C. M. Brokken-Zijp ◽  
Daan Wouters ◽  
...  
Keyword(s):  
Carbon Black ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Conductive Carbon Black ◽  
Polymer Research ◽  
Automated Scanning

Automated Scanning Probe Microscopy for Combinatorial Polymer Research

2005 ◽  
Vol 894 ◽  
Author(s):  
Daan Wouters ◽  
Alexander Alexeev ◽  
Dmitri Kozodaev ◽  
Sergey Saunin ◽  
Ulrich Schubert
Keyword(s):  
High Throughput ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Thin Polymer Film ◽  
Characterization Methods ◽  
Probe Microscopy ◽  
Materials Research ◽  
Polymer Research ◽  
Combinatorial Materials ◽  
Automated Scanning

AbstractWith the development of combinatorial materials research (CMR) methods and high throughput experimentation (HTE) workflows for polymer research applications, the demand for automated, high throughput characterization methods is evident. Solution-based characterization methods like NMR, GPC, viscosimetry, for example and UV-Vis as well as fluorescence plate readers are available. Here we report on the incorporation of automated scanning probe microscopy in the HTE-workflow by demonstrating the evaluation of surface properties and topographies for thin polymer film libraries.

The Role of Scanning Probe Microscopy in Drug Delivery Research

1996 ◽  
Vol 13 (3-4) ◽  
pp. 225-256 ◽  
Author(s):  
Kevin M. Shakesheff ◽  
Martyn C. Davies ◽  
Clive J. Roberts ◽  
Saul J. B. Tendler ◽  
Philip M. Williams
Keyword(s):  
Drug Delivery ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

Extending Electrical Scanning Probe Microscopy Measurements of Semiconductor Devices Using Microwave Impedance Microscopy

2015 ◽  
Author(s):  
Benedict Drevniok ◽  
St. John Dixon-Warren ◽  
Oskar Amster ◽  
Stuart L Friedman ◽  
Yongliang Yang
Keyword(s):  
Scanning Probe Microscopy ◽  
Semiconductor Devices ◽  
Cmos Image Sensor ◽  
Image Sensor ◽  
Scanning Probe ◽  
Cross Sectional ◽  
Probe Microscopy ◽  
Dopant Profiling ◽  
Capacitance Voltage

Abstract Scanning microwave impedance microscopy was used to analyze a CMOS image sensor sample to reveal details of the dopant profiling in planar and cross-sectional samples. Sitespecific capacitance-voltage spectroscopy was performed on different regions of the samples.

Sign in / Sign up

Export Citation Format

Share Document