An exploration of benchtop X‐ray emission spectroscopy for precise characterization of the sulfur redox state in cementitious materials

2021 ◽  
Author(s):  
Jared E. Abramson ◽  
Nancy M. Avalos ◽  
Agathe L. M. Bourchy ◽  
Sarah A. Saslow ◽  
Gerald T. Seidler
Keyword(s):  
Emission Spectroscopy ◽  
Redox State ◽  
Cementitious Materials ◽  
X Ray ◽  
Precise Characterization

Distorted chiolite crystal structures of α-Na5M3F14 (M=Cr,Fe,Ga) studied by X-ray powder diffraction

2003 ◽  
Vol 18 (2) ◽  
pp. 128-134 ◽  
Author(s):  
A. Le Bail ◽  
A.-M. Mercier
Keyword(s):  
Crystal Structures ◽  
Powder Diffraction ◽  
Room Temperature ◽  
Rietveld Refinements ◽  
Space Group ◽  
X Ray ◽  
Precise Characterization

The crystal structures of the chiolite-related room temperature phases α-Na5M3F14 (MIII=Cr,Fe,Ga) are determined. For all of them, the space group is P21/n, Z=2; a=10.5096(3) Å, b=7.2253(2) Å, c=7.2713(2) Å, β=90.6753(7)° (M=Cr); a=10.4342(7) Å, b=7.3418(6) Å, c=7.4023(6) Å, β=90.799(5)° (M=Fe), and a=10.4052(1) Å, b=7.2251(1) Å, c=7.2689(1), β=90.6640(4)° (M=Ga). Rietveld refinements produce final RF factors 0.036, 0.033, and 0.035, and RWP factors, 0.125, 0.116, and 0.096, for MIII=Cr, Fe, and Ga, respectively. The MF6 polyhedra in the defective isolated perovskite-like layers deviate very few from perfect octahedra. Subtle octahedra tiltings lead to the symmetry decrease from the P4/mnc space group adopted by the Na5Al3F14 chiolite aristotype to the P21/n space group adopted by the title series. Facile twinning precluded till now the precise characterization of these compounds.

Precision Lattice Parameter Measurements with Guinier Camera and Counter Diffractometer: Comparison and Reconciliation of Results

1982 ◽  
Vol 26 ◽  
pp. 11-24 ◽  
Author(s):  
Allan Brown
Keyword(s):  
Measurement Errors ◽  
Systematic Errors ◽  
Lattice Parameter ◽  
Precision Measurements ◽  
Compound A ◽  
X Ray ◽  
Random Measurement ◽  
Precise Characterization ◽  
The Difference

Different procedures used in precision measurements of lattice parameters are, strictly, only valid if they can be shown to give results that are mutually reproducible. For this purpose reproducibility is defined in terms of the parameters a. and standard deviations a. obtained for X-ray specimens of one or more reference materials. The requirement is that all systematic errors should be minimized to a level below that of the random measurement errors. Where these have a Gaussian distribution the significance of the difference, Δa°, between two , measurements can then be Let;Led by evaluating . Thus, if K < 2 the difference, Δa°, cannot be distinguished from the effects of random measurement errors. This condition should be met for specimens of the same sample if reproducibility is good. For K ≥ 3 the value of Δa° is then taken to reflect real differences in the crystalline Jattice of two X-ray specimens of a given compound. A basis is thus created for the study of solid solubility and for the precise characterization of crystalline compounds.

scholarly journals Precise Characterization of Dislocations and Cementite in Pearlitic Steels at Different Drawing Strains Using X-ray Diffraction

2013 ◽  
Vol 53 (4) ◽  
pp. 673-679 ◽  
Author(s):  
Shigeo Sato ◽  
Kazuaki Wagatsuma ◽  
Mikio Ishikuro ◽  
Eui-Pyo Kwon ◽  
Hitoshi Tashiro ◽  
...  
Keyword(s):  
X Ray Diffraction ◽  
X Ray ◽  
Precise Characterization

Cu Kβ2,5 X-ray emission spectroscopy as a tool for characterization of monovalent copper compounds

2012 ◽  
Vol 27 (11) ◽  
pp. 1882 ◽  
Author(s):  
J. R. Vegelius ◽  
K. O. Kvashnina ◽  
M. Klintenberg ◽  
I. L. Soroka ◽  
S. M. Butorin
Keyword(s):  
Emission Spectroscopy ◽  
X Ray ◽  
Copper Compounds

Characterization of diamondlike films by x‐ray emission spectroscopy with high‐energy resolution

1993 ◽  
Vol 73 (9) ◽  
pp. 4605-4609 ◽  
Author(s):  
S. N. Shamin ◽  
J. C. Pivin ◽  
E. Z. Kurmaev
Keyword(s):  
Energy Resolution ◽  
Emission Spectroscopy ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray

scholarly journals Characterization of an imploding cylindrical plasma for electron transport studies using x-ray emission spectroscopy

2020 ◽  
Vol 27 (2) ◽  
pp. 023302 ◽  
Author(s):  
M. Dozières ◽  
S. Hansen ◽  
P. Forestier-Colleoni ◽  
C. McGuffey ◽  
D. Kawahito ◽  
...  
Keyword(s):  
Electron Transport ◽  
Emission Spectroscopy ◽  
X Ray ◽  
Cylindrical Plasma ◽  
Transport Studies

scholarly journals Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry

2012 ◽  
Vol 20 (4) ◽  
pp. 4525 ◽  
Author(s):  
Frank Siewert ◽  
Jana Buchheim ◽  
Sébastien Boutet ◽  
Garth J. Williams ◽  
Paul A. Montanez ◽  
...  
Keyword(s):  
High Resolution ◽  
X Ray ◽  
Precise Characterization

LOW PRESSURE CH2Cl2 PLASMA DISCHARGE

2015 ◽  
Vol 8 (3) ◽  
pp. 2240-2248
Author(s):  
Osvaldo Flores
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Langmuir Probe ◽  
Emission Spectroscopy ◽  
Optical Emission Spectroscopy ◽  
Optical Emission ◽  
Plasma Discharge ◽  
X Ray ◽  
Scanning Electron

Glow discharge of dichloromethane (DCM) was investigated employing Optical Emission Spectroscopy (OES), while the electron temperature and electron density were measured using a double Langmuir probe. Deposits formed were characterized by Scanning Electron Microscopy (SEM), X-ray Photo Fluorescence Spectroscopy (XPS) and Fourier Transform Infrared Spectroscopy (FTIR). The species identified by OES were the molecular bands of C2, C3, CH, H2, CH+, HCl+, Cl and C+. The material deposited displays a growing behavior. SEM observation shows several features which correspond to coalesce and growth mechanism. The characterization of the material deposited can explain the different stages of deposits that are formed on the electrode surface. Several factors are concerned in the complexity of the process, regarding the interaction of species formed during the plasma discharge. Involving several bonds types such as: C=C, C=C-CH2-Cl, C-C and CH.

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