Superconductive Tunneling in YBa2Cu3O7 Thin Films: Dependence upon Crystallographic Orientation

1991 ◽  
pp. 137-146 ◽  
Author(s):  
L. H. Greene ◽  
J. Lesueur ◽  
W. L. Feldmann ◽  
A. Inam
Keyword(s):  
Thin Films ◽  
Crystallographic Orientation

Control of Nanostructure and Crystallographic Orientation in Electrodeposited ZnO Thin Films via Structure Directing Agents

2014 ◽  
Vol 161 (5) ◽  
pp. D195-D201 ◽  
Author(s):  
Keigo Ichinose ◽  
Tomoaki Mizuno ◽  
Matthew Schuette White ◽  
Tsukasa Yoshida
Keyword(s):  
Thin Films ◽  
Crystallographic Orientation ◽  
Zno Thin Films ◽  
Structure Directing Agents

Effects of P Content on Morphology of Nanocrystals Induced by FIB Irradiation in Ni-P Amorphous Alloy

2006 ◽  
Vol 960 ◽  
Author(s):  
Koji Sato ◽  
Chiemi Ishiyama ◽  
Masato Sone ◽  
Yakichi Higo
Keyword(s):  
Thin Films ◽  
Amorphous Alloy ◽  
Crystallographic Orientation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Orientation Relationships ◽  
Beam Direction ◽  
Precipitation Distribution ◽  
P Content

ABSTRACTWe studied the effects of phosphorus (P) on Ni nanocrystalline morphology formed by focused ion beam (FIB) irradiation for Ni-P amorphous alloy thin films. The P content in the amorphous alloy was varied from 8 to 12 wt.%. The nanocrystals induced by the FIB irradiation for Ni-11.8, 8.9, 7.9 wt.% amorphous alloy had an f.c.c. structure and showed unique crystallographic orientation relationships to the geometry of the focused ion beam, that is, {111}f.c.c. parallel to the irradiated plane and <110>f.c.c. parallel to the projected ion beam direction, respectively. The Ni nanocrystals precipitated like aggregates with decreasing of the P content. These results represent that the P content does not affect crystallographic orientation relationships, while influences the precipitation distribution of Ni nanocrystals generated by the FIB irradiation.

Controlling magnetism of multiferroic (Bi0.9La0.1)2FeCrO6 thin films by epitaxial and crystallographic orientation strain

2013 ◽  
Vol 102 (19) ◽  
pp. 192911 ◽  
Author(s):  
Amit Khare ◽  
Abhishek Singh ◽  
S. S. Prabhu ◽  
D. S. Rana
Keyword(s):  
Thin Films ◽  
Crystallographic Orientation

Synthesis and VOC gas sensing properties of Polypyrrole / MoO3 Nanohybrids

2003 ◽  
Vol 785 ◽  
Author(s):  
Kouta Hosono ◽  
Ichiro Matsubara ◽  
Norimitsu Murayama ◽  
Shin Woosuck ◽  
Noriya Izu
Keyword(s):  
Thin Films ◽  
Organic Compound ◽  
Volatile Organic Compound ◽  
Crystallographic Orientation ◽  
Electrical Resistance ◽  
Gas Sensing ◽  
Sodium Ions ◽  
Sensing Properties ◽  
Gas Sensing Properties ◽  
Volatile Organic

ABSTRACTWe have prepared polypyrrole (PPy) / MoO3 nanohybrid thin films and evaluated their volatile organic compound (VOC) gas sensing properties. The (PPy)xMoO3 thin films have been prepared by intercalation reactions of highly oriented MoO3 thin films. Intercalation of hydrated sodium ions successfully proceeded without loosing the crystallographic orientation. The (PPy)xMoO3 thin films was obtained by replacing the hydrated sodium ions with PPy. The (PPy)xMoO3 thin films can detect formaldehyde gas by increasing in their electrical resistance, whereas they showed no response to toluene.

Rodrigues-Frank Space Representations of Fiber Texture

1995 ◽  
Vol 403 ◽  
Author(s):  
Krishna Rajan ◽  
Ronald Petkie
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Crystallographic Orientation ◽  
Fiber Texture ◽  
Boundary Structure ◽  
Structure Information ◽  
Grain Boundary Structure ◽  
Specific Determination

AbstractThe concept of fcc fiber texture is examined in the context of Rodrigues-Frank (R-F) representations. Using fiber texture in thin films as the basis of our analysis, it is shown that this approach when combined with grain specific determination of crystallographic orientation provides a useful means of detecting a number of texture components with relatively small grain sampling densities. The application of R-F representations is also shown to be a useful methodology to couple grain boundary structure information with microtexture data.

Tailoring in-plane crystallographic orientation of epitaxial YBa2Cu3O7−x thin films having perpendicular c-axis texture

2012 ◽  
Vol 520 (9) ◽  
pp. 3651-3656 ◽  
Author(s):  
Lei Zheng ◽  
Xiaodong Su ◽  
Jun Fan ◽  
Yajie Chen ◽  
Xiaoluan Yang ◽  
...  
Keyword(s):  
Thin Films ◽  
Crystallographic Orientation

The Effects of Processing on the Microstructure of Copper Thin Films on Tantalum Barrier Layers

1995 ◽  
Vol 391 ◽  
Author(s):  
E.M. Zielinski ◽  
R.P. Vinci ◽  
J.C. Bravman
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Barrier Layer ◽  
Crystallographic Orientation ◽  
Deposition Temperature ◽  
Volume Fraction ◽  
Fiber Texture ◽  
Cu Films ◽  
Barrier Layers ◽  
Two Temperatures

abstractPreferred crystallographic orientation and grain size distribution were characterized as a function of processing for sputtered Cu films on Ta underlayers. The Ta barrier layer was deposited at two temperatures, 30 and 100 °C. Cu was deposited at 30, 150 and 250 °C on the 30 °C Ta, and at 100, 150, 200 and 250 °C on the 100 °C Ta. In the first set of samples, with increasing deposition temperature, the Cu (111) fiber texture grew weaker and the volume fraction of randomly oriented grains increased from 0.23 to 0.74. In contrast, for the films deposited on the 100 °C Ta, with increasing deposition temperature, Cu (111) fiber texture strengthened and the fractions of randomly oriented and twinned grains decreased. Grain size was lognormally distributed in all samples and varied approximately parabolically with deposition temperature. At a given deposition temperature, median grain size in the Cu was larger in the films deposited on the 100 °C Ta. These results will be related to the microstructure of the Ta underlayers. Cu microstructure on the 100 °C Ta is shown to be influenced by textural inheritance from the Ta underlayer. Microstructure of the Cu on 30 °C Ta is discussed in terms of trace contaminants.

Influence of crystallographic orientation and layer thickness on fracture behavior of Ni/Ni3Al multilayered thin films

2001 ◽  
Vol 44 (11) ◽  
pp. 2629-2633 ◽  
Author(s):  
Rajarshi Banerjee ◽  
Jason P Fain ◽  
Peter M Anderson ◽  
Hamish L Fraser
Keyword(s):  
Thin Films ◽  
Layer Thickness ◽  
Crystallographic Orientation ◽  
Fracture Behavior ◽  
Multilayered Thin Films

The Pyrochlore-to-Perovskite Transformation in Solution-Derived Lead Zirconate Titanate Thin Films

1994 ◽  
Vol 361 ◽  
Author(s):  
James A. Voigt ◽  
B.A. Tuttle ◽  
T.J. Headley ◽  
D.L. Lamppa
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Grain Growth ◽  
Lead Zirconate Titanate ◽  
Volume Change ◽  
Crystallographic Orientation ◽  
Crystallization Process ◽  
Perovskite Phase ◽  
Lead Zirconate ◽  
Two Dimensional

ABSTRACTWe have characterized the pyrochlore-to-perovskite crystallization process in solution-derived Pb(Zr0.20Ti0.80)O3 thin films on (100) MgO single crystal substrates. It has been determined that the perovskite phase nucleated preferentially at the film/MgO interface out of a nanocrystalline (≈100Å grains) pyrochlore matrix. During the early stages of the pyrochlore-to-perovskite conversion process, perovskite growth proceeded nearly isotropically from the substrate to form hemispherically shaped grains. Deviations from isotropie growth were shown to result from a growth dependence based on the crystallographic orientation of a growing perovskite grain relative to the orientations of pyrochlore grains being transformed. The volume change that occurs during the pyrochlore-to-pervoskite transformation along with two-dimensional grain growth has been used to develop a mechanism for formation of porosity that commonly is concentrated in grain boundary regions.

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