Scanning Acoustic Microscopy as a Non-Destructive Technique for Process Monitoring of High Power Semiconductor Devices

1992 ◽  
pp. 723-729 ◽  
Author(s):  
J. Attal ◽  
B. Bianco ◽  
A. Cambiaso ◽  
D. E. Crees ◽  
P. Dargent ◽  
...  
Keyword(s):  
Process Monitoring ◽  
High Power ◽  
Semiconductor Devices ◽  
Acoustic Microscopy ◽  
Scanning Acoustic Microscopy ◽  
Power Semiconductor ◽  
Power Semiconductor Devices ◽  
Non Destructive

(Invited) High Power Semiconductor Devices for FACTS: Current State of the Art and Opportunities for Advanced Materials

2019 ◽  
Vol 41 (8) ◽  
pp. 19-30 ◽  
Author(s):  
Matthew J. Marinella ◽  
Stanley Atcitty ◽  
Sandeepan DasGupta ◽  
Robert J. Kaplar ◽  
Mark A. Smith
Keyword(s):  
High Power ◽  
State Of The Art ◽  
Semiconductor Devices ◽  
Advanced Materials ◽  
Power Semiconductor ◽  
Power Semiconductor Devices ◽  
Current State
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