Demountable X-Ray Tube for Light Element Fluorescence Analysis

Author(s):  
J. A. Dunne ◽  
W. R. Muller
1964 ◽  
Vol 8 ◽  
pp. 269-284 ◽  
Author(s):  
Burton L. Henke

AbstractMethods and instrumentation have heen developed for the extension of X-ray fluorescence analysis into the light element region, magnesium through beryllium. Examples of current values for the minimum detectable limits for these elements and associated instrumental parameters are presented. Some specific techniques are described for the use of an ultrasoft X-ray vacuum spectrograph, for the development of large d-spacing multilayer analyzers, and for the construction of thin window systems.


1991 ◽  
Vol 35 (B) ◽  
pp. 947-952
Author(s):  
Christina Streli ◽  
Peter Wobrauschek ◽  
Hannes Aiginger

AbstractTotal Reflection X-Ray Fluorescence Analysis (TXRF) has become a powerful analytical tool for trace element analysis. Because of its advantages in excitation and background reduction TXRF has been applied for the analysis of light elements (C,O,F,Na,...). A special Ge(HP) detector offering an ultra thin window in combination with a spectrometer specially designed for the requirements of light element analysis was used. Also a new windowless X-ray tube for efficient excitation of the light elements was tested. The system was checked with standard aqueous solutions; detection limits in the ng range (7 ng for O) are obtained.


1985 ◽  
Vol 29 ◽  
pp. 469-476
Author(s):  
Peter B. DeGroot

AbstractThe total elemental composition of a sample must be measured or specified for successful application of fundamental parameters type matrix corrections in x-ray fluorescence analyses. Unanalyzed light elements can be dealt with in three ways. They can be related to the concentration of another element by stoichiometry, calculated by difference, or their effects minimized by addition of a diluent of known composition, ‘The relative success of these approaches depends on the composition of the sample. Limiting cases tested are high or low concentrations of analytes having long or short wavelength emission lines, in the presence of additional heavy or light elements. Molybdenum oxide is used as the analyte, with the oxygen serving as a typical unanalyzed light element to be treated by stoichiometry, difference, or dilution. The accuracy and precision of the analysis for molybdenum, using either the Kα or Lα line, is the criterion for judging the success of the strategy. Experimental results and theoretical calculations using the XRF11* matrix correction program are employed. Generally, the difference strategy is inferior to stoichiometry or dilution. However, difference methods can give acceptable results except in the case of a high concentration of short wavelength analyte in a light element matrix. Where stoichiometry is not known, an assumed stoichiometry that is correct within one oxidation number gives results comparable to the difference method.


1966 ◽  
Vol 10 ◽  
pp. 520-533 ◽  
Author(s):  
M. A. Short ◽  
M. J. H. Ruscoe

AbstractIn view of the importance of obtaining optimum conditions for the X-ray fluorescence analysis of light elements, an investigation has been made of the effects of varying the X-ray tube target, the target take-off angle, the tube voltage, and the tube window thickness. The effects of these parameters have been observed by measurement of the intensity of fluorescence of two light elements using the Ray max 60 demountable tube and vacuum path spectrometer. The results obtained are compared with those given by theoretical calculations based on consideration of the relevant parameters; good qualitative agreement has been obtained. It is shown that a high primary X-ray intensity is obtained with a high target take-off angle, a low angle of incidence of the electron beam on the target, and an optimum setting of tube voltage. It is further shown that the most suitable target to use for the fluorescence analysis of light elements is markedly dependent on the thickness of the X-ray tube window.


1982 ◽  
Vol 26 ◽  
pp. 377-384
Author(s):  
Leif Højslet Christensen ◽  
Iver Drabæk

AbstractAn energy-dispersive x-ray fluorescence method has been developed for the direct determination of major and minor elements in infinitely thick samples of paint. Matrix absorption and enhancement corrections are iteratively calculated from a knowledge of tabulated fundamental parameters and the unknown weight fractions. An estimate of the significant light element fraction of the bulk sample required for the calculation of matrix attenuation is obtained using the scatter peaks of the silver secondary target. Relative elemental calibration constants and calibration factors for the coherent and incoherent peaks are determined experimentally using either thin-film standards or standards of known total composition. For routine analysis only one absolute standard is required. The method has been applied to different types of paint with a relative standard deviation better than 5% provided the counting statistics are not the limiting factor. The accuracy has been tested by comparing own results with those obtained either from the formulation or from, instrumental neutron activation analysis.


1963 ◽  
Vol 7 ◽  
pp. 460-488 ◽  
Author(s):  
Burton L. Henke

AbstractOptimized vacuum spectrographic measurement of low-energy fluorescence has been found to yield counting rates and peak-to-background ratios which are enough to permit the extension of fluorescence analysis for elementary chemistry into the light-element range—sodium through boron. This is accomplished with an efficient, demountable ultrasoft X-ray source, with close coupling among source, crystal, and detector, with KAP and multilayered stearate analyzers, and with, optimized flow-propordonal counting. Specific methods for achieving peak-to-background ratios on practical samples containing these light elements are presented. The extension of these methods of light-element analysis with the use of curved long-spaced crystals for X-Ray macroprobe and electron microprobe measurements is discussed. The design and construction of multilayered soap film “crystals” for long-wavelength X-ray analysis is described.


Author(s):  
D. A. Carpenter ◽  
M. A. Taylor

The development of intense sources of x rays has led to renewed interest in the use of microbeams of x rays in x-ray fluorescence analysis. Sparks pointed out that the use of x rays as a probe offered the advantages of high sensitivity, low detection limits, low beam damage, and large penetration depths with minimal specimen preparation or perturbation. In addition, the option of air operation provided special advantages for examination of hydrated systems or for nondestructive microanalysis of large specimens.The disadvantages of synchrotron sources prompted the development of laboratory-based instrumentation with various schemes to maximize the beam flux while maintaining small point-to-point resolution. Nichols and Ryon developed a microprobe using a rotating anode source and a modified microdiffractometer. Cross and Wherry showed that by close-coupling the x-ray source, specimen, and detector, good intensities could be obtained for beam sizes between 30 and 100μm. More importantly, both groups combined specimen scanning with modern imaging techniques for rapid element mapping.


Author(s):  
G.F. Bastin ◽  
H.J.M. Heijligers ◽  
J.M. Dijkstra

For the calculation of X-ray intensities emitted by elements present in multi-layer systems it is vital to have an accurate knowledge of the x-ray ionization vs. mass-depth (ϕ(ρz)) curves as a function of accelerating voltage and atomic number of films and substrate. Once this knowledge is available the way is open to the analysis of thin films in which both the thicknesses as well as the compositions can usually be determined simultaneously.Our bulk matrix correction “PROZA” with its proven excellent performance for a wide variety of applications (e.g., ultra-light element analysis, extremes in accelerating voltage) has been used as the basis for the development of the software package discussed here. The PROZA program is based on our own modifications of the surface-centred Gaussian ϕ(ρz) model, originally introduced by Packwood and Brown. For its extension towards thin film applications it is required to know how the 4 Gaussian parameters α, β, γ and ϕ(o) for each element in each of the films are affected by the film thickness and the presence of other layers and the substrate.


Author(s):  
D. A. Carpenter ◽  
Ning Gao ◽  
G. J. Havrilla

A monolithic, polycapillary, x-ray optic was adapted to a laboratory-based x-ray microprobe to evaluate the potential of the optic for x-ray micro fluorescence analysis. The polycapillary was capable of collecting x-rays over a 6 degree angle from a point source and focusing them to a spot approximately 40 µm diameter. The high intensities expected from this capillary should be useful for determining and mapping minor to trace elements in materials. Fig. 1 shows a sketch of the capillary with important dimensions.The microprobe had previously been used with straight and with tapered monocapillaries. Alignment of the monocapillaries with the focal spot was accomplished by electromagnetically scanning the focal spot over the beveled anode. With the polycapillary it was also necessary to manually adjust the distance between the focal spot and the polycapillary.The focal distance and focal spot diameter of the polycapillary were determined from a series of edge scans.


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