Pre-bond Scan Test Through TSV Probing

2013 ◽  
pp. 115-135
Author(s):  
Brandon Noia ◽  
Krishnendu Chakrabarty
Keyword(s):  
Scan Test

Case Study: Combined Dynamic Laser Stimulation and Static Emission Microscopy Techniques Applied to Scan Test Failure on Mixed Mode Device

2012 ◽  
Author(s):  
Magdalena Sienkiewicz ◽  
Philippe Rousseille
Keyword(s):  
Mixed Mode ◽  
Laser Stimulation ◽  
Scan Test ◽  
Silicon Bulk ◽  
Defect Localization ◽  
Emission Microscopy ◽  
Microscopy Techniques ◽  
Test Failure

Abstract This paper presents a case study on scan test reject in a mixed mode IC. It focuses on the smart use of combined mature FA techniques, such as Soft Defect Localization (SDL) and emission microscopy (EMMI), to localize a random scan test anomaly at the silicon bulk level.

An integrated DFT solution for power reduction in scan test applications by low power gating scan cell

Integration ◽  
2017 ◽  
Vol 57 ◽  
pp. 108-124 ◽  
Author(s):  
Mahshid Mojtabavi Naeini ◽  
Sreedharan Baskara Dass ◽  
Chia Yee Ooi ◽  
Tomokazu Yoneda ◽  
Michiko Inoue
Keyword(s):  
Low Power ◽  
Power Reduction ◽  
Power Gating ◽  
Scan Test

Scan Test Response Compaction Combined with Diagnosis Capabilities

2008 ◽  
Vol 24 (1-3) ◽  
pp. 235-246 ◽  
Author(s):  
Sverre Wichlund ◽  
Frank Berntsen ◽  
Einar Johan Aas
Keyword(s):  
Test Response ◽  
Scan Test ◽  
Test Response Compaction

Boundary-Scan Test

1993 ◽  
Author(s):  
Harry Bleeker ◽  
Peter van den Eijnden ◽  
Frans de Jong
Keyword(s):  
Boundary Scan ◽  
Scan Test ◽  
Boundary Scan Test
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