Analysis of Surface Topography of Diamond Burnished Aluminium Alloy Components

2017 ◽  
pp. 143-154 ◽  
Author(s):  
Gyula Varga ◽  
Viktória Ferencsik
Keyword(s):  
Aluminium Alloy ◽  
Surface Topography

scholarly journals Surface Roughness after Milling of the Al/CFRP Stacks with a Diamond Tool

Materials ◽  
2021 ◽  
Vol 14 (22) ◽  
pp. 6835
Author(s):  
Elżbieta Doluk ◽  
Anna Rudawska ◽  
Józef Kuczmaszewski ◽  
Izabela Miturska-Barańska
Keyword(s):  
Surface Roughness ◽  
Aluminium Alloy ◽  
Surface Topography ◽  
Feed Rate ◽  
Metal Layer ◽  
Composite Layer ◽  
Periodic Pattern ◽  
Roughness Parameters ◽  
Surface Roughness Parameters ◽  
Carbon Fibre Reinforced Polymer

This study presents the results of research on the surface quality of hybrid sandwich structures after milling with a diamond blade tool. It identifies the effects of feed and machining strategy on the roughness and topography of the surface. It provides an analysis of Ra and Rz surface roughness parameters as well as Sp, Sz, and Sv surface topography parameters. The processed object was a two-layer sandwich structure consisting of aluminium alloy 2024 and CFRP (carbon fibre-reinforced polymer) composite. The minimum values of the Ra and Rz surface roughness parameters were obtained on the aluminium alloy surface, whereas the maximum values were obtained on the CFRP surface. The same was true for the 3D surface roughness parameters—the lowest values of Sp, Sz, and Sv parameters were obtained on the surface of the metal layer, while the highest values were obtained on the surface of the composite layer (the maximum value of the Sp parameter was an exception). A surface topography analysis has revealed a targeted and periodic pattern of micro-irregularities for the vast majority of the samples considered. The statistical analysis shows that the surface roughness of the aluminium alloy was only affected by the feed rate. For the CFRP, the feed rate and the interaction of milling strategy and feed rate (Sfz) had a statistically significant effect. The obtained results provide a basis for designing such sandwich element processing technology, for which differences in roughness and topography parameters for the component materials are lowest.

Influence of Surface Topography on the Tribological Behaviour of Aluminium Alloy 5182 with EDT Surface

2010 ◽  
Vol 39 (2) ◽  
pp. 135-142 ◽  
Author(s):  
Mathias Liewald ◽  
Stefan Wagner ◽  
Dina Becker
Keyword(s):  
Aluminium Alloy ◽  
Surface Topography ◽  
Tribological Behaviour

scholarly journals Strain sequence effect on fatigue life and fracture surface topography of 7075-T651 aluminium alloy

2021 ◽  
pp. 103972
Author(s):  
Wojciech Macek ◽  
Ricardo Branco ◽  
José Domingos Costa ◽  
Cândida Pereira
Keyword(s):  
Fatigue Life ◽  
Fracture Surface ◽  
Aluminium Alloy ◽  
Surface Topography ◽  
Sequence Effect

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Effects of Ion Beam Milling on Surface Topography

1973 ◽  
Vol 31 ◽  
pp. 84-85
Author(s):  
P.G. Pawar ◽  
P. Duhamel ◽  
G.W. Monk
Keyword(s):  
Surface Topography ◽  
Ion Beam ◽  
Solid Material ◽  
Beam Current ◽  
Atomic Mass ◽  
Micro Milling ◽  
Ion Milling ◽  
Controlled Atmospheres ◽  
Milling Operations ◽  
Sufficient Energy

A beam of ions of mass greater than a few atomic mass units and with sufficient energy can remove atoms from the surface of a solid material at a useful rate. A system used to achieve this purpose under controlled atmospheres is called an ion miliing machine. An ion milling apparatus presently available as IMMI-III with a IMMIAC was used in this investigation. Unless otherwise stated, all the micro milling operations were done with Ar+ at 6kv using a beam current of 100 μA for each of the two guns, with a specimen tilt of 15° from the horizontal plane.It is fairly well established that ion bombardment of the surface of homogeneous materials can produce surface topography which resembles geological erosional features.

Low-Loss Images in a Stem/Tem Microscope

1976 ◽  
Vol 34 ◽  
pp. 496-497 ◽  
Author(s):  
David C. Joy ◽  
Dennis M. Maher
Keyword(s):  
High Resolution ◽  
Surface Topography ◽  
Beam Direction ◽  
Low Loss ◽  
Specimen Holder ◽  
Glancing Angle ◽  
High Resolution Images ◽  
Set Up ◽  
Conventional Manner ◽  
Objective Type

High-resolution images of the surface topography of solid specimens can be obtained using the low-loss technique of Wells. If the specimen is placed inside a lens of the condenser/objective type, then it has been shown that the lens itself can be used to collect and filter the low-loss electrons. Since the probeforming lenses in TEM instruments fitted with scanning attachments are of this type, low-loss imaging should be possible.High-resolution, low-loss images have been obtained in a JEOL JEM 100B fitted with a scanning attachment and a thermal, fieldemission gun. No modifications were made to the instrument, but a wedge-shaped, specimen holder was made to fit the side-entry, goniometer stage. Thus the specimen is oriented initially at a glancing angle of about 30° to the beam direction. The instrument is set up in the conventional manner for STEM operation with all the lenses, including the projector, excited.

A procedure for cross-sectioning materials for TEM analysis without ion milling

1990 ◽  
Vol 48 (4) ◽  
pp. 742-743
Author(s):  
J.P. Benedict ◽  
Ron Anderson ◽  
S. J. Klepeis
Keyword(s):  
Surface Topography ◽  
Milling Time ◽  
Specimen Preparation ◽  
Ion Milling ◽  
Cleaning Operation ◽  
Tem Analysis ◽  
Platinum Silicide ◽  
Surface Alteration ◽  
Polishing Damage ◽  
Tools And Methods

Traditional specimen preparation procedures for non-biological samples, especially cross section preparation procedures, involves subjecting the specimen to ion milling for times ranging from minutes to tens of hours. Long ion milling time produces surface alteration, atomic number and rough-surface topography artifacts, and high temperatures. The introduction of new tools and methods in this laboratory improved our ability to mechanically thin specimens to a point where ion milling time was reduced to one to ten minutes. Very short ion milling times meant that ion milling was more of a cleaning operation than a thinning operation. The preferential thinning and the surface topography that still existed in briefly ion milled samples made the study of interfaces between materials such as platinum silicide and silicon difficult. These two problems can be eliminated by completely eliminating the ion milling step and mechanically polishing the sample to TEM transparency with the procedure outlined in this communication. Previous successful efforts leading to mechanically thinned specimens have shown that problems center on tool tilt control, removal of polishing damage, and specimen cleanliness.

High Resolution Low Loss Microscopy of Crystalline Surfaces

1980 ◽  
Vol 38 ◽  
pp. 162-163
Author(s):  
William Krakow ◽  
Alec N. Broers
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Surface Topography ◽  
Secondary Electron ◽  
Objective Lens ◽  
Surface Imaging ◽  
Low Loss ◽  
Fine Grained ◽  
Scanning Electron ◽  
Crystalline Surfaces

Low-loss scanning electron microscopy can be used to investigate the surface topography of solid specimens and provides enhanced image contrast over secondary electron images. A high resolution-condenser objective lens has allowed the low-loss technique to resolve separations of Au nucleii of 50Å and smaller dimensions of 25Å in samples coated with a fine grained carbon-Au-palladium layer. An estimate of the surface topography of fine grained vapor deposited materials (20 - 100Å) and the surface topography of underlying single crystal Si in the 1000 - 2000Å range has also been investigated. Surface imaging has also been performed on single crystals using diffracted electrons scattered through 10−2 rad in a conventional TEM. However, severe tilting of the specimen is required which degrades the resolution 15 to 100 fold due to image forshortening.

How nanoscale surface steps promote ice growth on feldspar: microscopy observation of morphology-enhanced condensation and freezing

Nanoscale ◽  
2019 ◽  
Vol 11 (44) ◽  
pp. 21147-21154 ◽  
Author(s):  
Raymond W. Friddle ◽  
Konrad Thürmer
Keyword(s):  
Surface Topography ◽  
Video Microscopy ◽  
Microscopy Observation ◽  
Atmospheric Dust ◽  
Ice Growth ◽  
Surface Steps

Video microscopy and AFM are used to relate surface topography to a mineral's ability to promote ice growth. On feldspar, abundant as atmospheric dust, basic surface steps can facilitate condensation and freezing when air becomes saturated.

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