A floating-point systolic array processing element with serial communication and built-in self-test

1994 ◽  
Vol 8 (3) ◽  
pp. 241-251
Author(s):  
T. C. Davies ◽  
D. Al-Khalili ◽  
V. Szwarc
Keyword(s):  
Systolic Array ◽  
Array Processing ◽  
Serial Communication ◽  
Processing Element ◽  
Floating Point ◽  
Self Test ◽  
Built In Self Test

Built-in self-test in a 24 bit floating point digital signal processor

2002 ◽  
Author(s):  
N. Sakashita ◽  
H. Sawai ◽  
E. Teraoka ◽  
T. Fujiyama ◽  
T. Kengaku ◽  
...  
Keyword(s):  
Digital Signal Processor ◽  
Digital Signal ◽  
Floating Point ◽  
Self Test ◽  
Built In Self Test ◽  
Signal Processor

Memory Implementation in a System on Chip with Built-in Self-Test and Recovery Tools

2019 ◽  
Vol 24 (3) ◽  
pp. 239-247
Author(s):  
Vladimir G. Ryabtsev ◽  
◽  
Sergey V. Volobuev ◽  
Keyword(s):  
System On Chip ◽  
Self Test ◽  
Built In Self Test ◽  
On Chip ◽  
Recovery Tools

RF Phase Error Built-In-Self-Test for A GSM SOC

2008 ◽  
Vol 1 (4) ◽  
pp. 39-44
Author(s):  
Dallas Webster ◽  
Loi Phan ◽  
Oren Eliezer ◽  
Rick Hudgens ◽  
Donald Lie
Keyword(s):  
Phase Error ◽  
Self Test ◽  
Built In Self Test

Fault-based Built-in Self-test and Evaluation of Phase Locked Loops

2021 ◽  
Vol 26 (3) ◽  
pp. 1-18
Author(s):  
Mehmet Ince ◽  
Ender Yilmaz ◽  
Wei Fu ◽  
Joonsung Park ◽  
Krishnaswamy Nagaraj ◽  
...  
Keyword(s):  
Phase Locked Loops ◽  
Test And Evaluation ◽  
Self Test ◽  
Built In Self Test

Design and implementation of a GaAs systolic floating-point processing element

1996 ◽  
Vol 143 (5) ◽  
pp. 325
Author(s):  
A. Beaumont-Smith ◽  
W. Marwood ◽  
C.C. Lim ◽  
K. Eshraghian
Keyword(s):  
Processing Element ◽  
Floating Point ◽  
Design And Implementation

Built-in-self-test 3-D ring oscillator for stacked 3DIC

2014 ◽  
Author(s):  
Cheng Jin ◽  
Ni Wang ◽  
Xiaowen Xu ◽  
Houjun Sun
Keyword(s):  
Ring Oscillator ◽  
Self Test ◽  
Built In Self Test

Exploiting Network-on-Chip structural redundancy for a cooperative and scalable built-in self-test architecture

2011 ◽  
Author(s):  
A Strano ◽  
C Gómez ◽  
D Ludovici ◽  
M Favalli ◽  
M E Gómez ◽  
...  
Keyword(s):  
Network On Chip ◽  
Structural Redundancy ◽  
Self Test ◽  
Built In Self Test ◽  
On Chip ◽  
Test Architecture
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