scholarly journals Micro-analytical studies of discontinuous precipitation in Fe-13.5 at.% Zn alloy

2020 ◽  
Vol 20 (3) ◽  
Author(s):  
Paweł Zięba ◽  
Mateusz Chronowski ◽  
Jerzy Morgiel
Keyword(s):  
Volume Diffusion ◽  
Discontinuous Precipitation ◽  
Analytical Electron Microscopy ◽  
Solute Concentration ◽  
Original Form ◽  
Left Behind ◽  
Analytical Electron ◽  
First Time ◽  
Zn Alloy ◽  
Boundary Diffusivity

Abstract For the first time, the analytical electron microscopy has been used to determine the solute concentration profiles left behind the moving reaction front (RF) of the discontinuous precipitation (DP) reaction in a Fe-13.5 at.% Zn alloy. These profiles have been converted into grain boundary diffusivity (sδDb) values, using Cahn’s diffusion equation in its original form and the data of the growth rate of the discontinuous precipitates obtained from independent measurements. This approach has essentially removed existing difference in comparison to sδDb values obtained from Cahn′s simplified and Petermann–Hornbogen models relevant for the global approach to the DP. Simultaneously, the local values of sδDb have been up to 8–10 orders of magnitude higher than the data for volume diffusion coefficients and much greater than for diffusion at the stationary grain boundaries of Zn in pure Fe. This is clear indication that the rate controlling factor for DP reaction in the Fe-13 at.% Zn alloy is diffusion at the moving RF.

The Application of Analytical Electron Microscopy to Improving the Sensitization Resistance of Type 304 Stainless Steels

1985 ◽  
Vol 62 ◽  
Author(s):  
H. S. Betrabet ◽  
W. A. T. Clark
Keyword(s):  
Electron Microscopy ◽  
Stainless Steels ◽  
Volume Diffusion ◽  
Discontinuous Precipitation ◽  
Analytical Electron Microscopy ◽  
Austenitic Stainless Steels ◽  
Analytical Electron ◽  
Type 304 ◽  
Kinetics Of ◽  
Apparent Conflict

ABSTRACTThe sensitization resistance of austenitic stainless steels can be improved by replacing some of the C with N. Electrochemical potentionkinetic reactivation (EPR) tests indicate that this is effective up to ∼0.16 wt.%N, but that above this level sensitization is enhanced. Thermodynamic calculations indicate that N should continue to reduce sensitization up to at least 0.25 wt.%N, as it retards the growth kinetics of Cr carbides. Analytical electron microscopy was used to investigate this apparent conflict and showed that, while N did decrease the volume diffusion coefficient of Cr beyond 0.16 wt.%, an increase in the amount of discontinuous precipitation of carbides with increasing N was responsible for the sensitization at higher N levels.

Analytical Electron Microscopy of Surface-Modified Ceramics

1985 ◽  
Vol 43 ◽  
pp. 276-279
Author(s):  
P. S. Sklad
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Theoretical Models ◽  
Ceramic Materials ◽  
Solute Concentration ◽  
Second Phase ◽  
Analytical Electron ◽  
Implantation Techniques ◽  
Lattice Damage ◽  
Surface Modified

Over the past several years, it has become increasingly evident that materials for proposed advanced energy systems will be required to operate at high temperatures and in aggressive environments. These constraints make structural ceramics attractive materials for these systems. However it is well known that the condition of the specimen surface of ceramic materials is often critical in controlling properties such as fracture toughness, oxidation resistance, and wear resistance. Ion implantation techniques offer the potential of overcoming some of the surface related limitations.While the effects of implantation on surface sensitive properties may be measured indpendently, it is important to understand the microstructural evolution leading to these changes. Analytical electron microscopy provides a useful tool for characterizing the microstructures produced in terms of solute concentration profiles, second phase formation, lattice damage, crystallinity of the implanted layer, and annealing behavior. Such analyses allow correlations to be made with theoretical models, property measurements, and results of complimentary techniques.

Growth of Lamellar Products During Discontinuous Solid State Reactions

1999 ◽  
Vol 580 ◽  
Author(s):  
P. Zieba ◽  
W. Gust
Keyword(s):  
Electron Microscopy ◽  
Solid State ◽  
Discontinuous Precipitation ◽  
Analytical Electron Microscopy ◽  
Morphological Features ◽  
Solid State Reactions ◽  
Analytical Electron ◽  
Nucleation Growth

AbstractThe nucleation, growth and dissolution of lamellar precipitates formed due to discontinuous solid state reactions like: discontinuous precipitation, coarsening and dissolution, are reviewed. Emphasis is given on recent studies based on analytical electron microscopy in describing the microchemistry, and in situ electron microscopy for revealing the morphological features of the reactions.

Application of Analytical Electron Microscopy to Ion Implantation and Near Surface Microstructures

1985 ◽  
Vol 62 ◽  
Author(s):  
P. S. Sklad
Keyword(s):  
Electron Microscopy ◽  
Ion Implantation ◽  
Ion Beam ◽  
Analytical Electron Microscopy ◽  
Theoretical Models ◽  
Solute Concentration ◽  
Specimen Preparation ◽  
Second Phase ◽  
Near Surface ◽  
Analytical Electron

ABSTRACTSurface modification using ion beam techniques is recognized as an important method for improving surface controlled properties of metallic, ceramic, and semiconductor materials. Determination of the microstructure and composition in regions located within a few hundred nanometers of the surface is essential to gaining an understanding of the mechanisms responsible for the improved properties. Analytical electron microscopy (AEM), high resolution microscopy, and microdiffraction are ideally suited for this purpose. These techniques are powerful tools for characterizing microstructure in terms of solute concentration profiles, second phase formation, lattice damage, crystallinity of the implanted layer and annealing behavior. Such analyses allow correlations with theoretical models, property measurements and results of complementary techniques. The proximity of the regions of interest to the surface also places stringent requirements on specimen preparation techniques. The power of AEM in examining the effects of ion implantation will be illustrated by reviewing the results of several investigations. A brief discussion of some important aspects of specimen preparation will also be included.

Electron Beam Damage of Biomolecules Assessed by Energy Loss Spectroscopy

1978 ◽  
Vol 36 (3) ◽  
pp. 61-69
Author(s):  
M. Isaacson ◽  
M.L. Collins ◽  
M. Listvan
Keyword(s):  
Electron Microscopy ◽  
Radiation Damage ◽  
Structural Integrity ◽  
Analytical Electron Microscopy ◽  
High Dose ◽  
Dose Rates ◽  
Special Cases ◽  
Analytical Electron ◽  
Atom Migration ◽  
Beam Damage

Over the past five years it has become evident that radiation damage provides the fundamental limit to the study of blomolecular structure by electron microscopy. In some special cases structural determinations at very low doses can be achieved through superposition techniques to study periodic (Unwin & Henderson, 1975) and nonperiodic (Saxton & Frank, 1977) specimens. In addition, protection methods such as glucose embedding (Unwin & Henderson, 1975) and maintenance of specimen hydration at low temperatures (Taylor & Glaeser, 1976) have also shown promise. Despite these successes, the basic nature of radiation damage in the electron microscope is far from clear. In general we cannot predict exactly how different structures will behave during electron Irradiation at high dose rates. Moreover, with the rapid rise of analytical electron microscopy over the last few years, nvicroscopists are becoming concerned with questions of compositional as well as structural integrity. It is important to measure changes in elemental composition arising from atom migration in or loss from the specimen as a result of electron bombardment.

Analytical Electron Microscopy (AEM) of Meningeal Cells Exposed to Particulate Cobalt During Studies of Experimental Epilepsy

1982 ◽  
Vol 40 ◽  
pp. 186-187
Author(s):  
R.G. Frederickson ◽  
R.G. Ulrich ◽  
J.L. Culberson
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Experimental Epilepsy ◽  
Metallic Cobalt ◽  
Experimental Animals ◽  
X Ray ◽  
Brain Surface ◽  
Meningeal Cells ◽  
Analytical Electron ◽  
The Brain

Metallic cobalt acts as an epileptogenic agent when placed on the brain surface of some experimental animals. The mechanism by which this substance produces abnormal neuronal discharge is unknown. One potentially useful approach to this problem is to study the cellular and extracellular distribution of elemental cobalt in the meninges and adjacent cerebral cortex. Since it is possible to demonstrate the morphological localization and distribution of heavy metals, such as cobalt, by correlative x-ray analysis and electron microscopy (i.e., by AEM), we are using AEM to locate and identify elemental cobalt in phagocytic meningeal cells of young 80-day postnatal opossums following a subdural injection of cobalt particles.

Optimizing conditions for x-ray microchemical analysis in analytical electron microscopy

1978 ◽  
Vol 36 (1) ◽  
pp. 548-549 ◽  
Author(s):  
N. J. Zaluzec
Keyword(s):  
Solid Angle ◽  
Analytical Electron Microscopy ◽  
Incident Beam ◽  
Thin Foil ◽  
Experimental Conditions ◽  
X Ray ◽  
Microchemical Analysis ◽  
Analytical Electron ◽  
Image Position ◽  
Incident Beam Energy

The ultimate sensitivity of microchemical analysis using x-ray emission rests in selecting those experimental conditions which will maximize the measured peak-to-background (P/B) ratio. This paper presents the results of calculations aimed at determining the influence of incident beam energy, detector/specimen geometry and specimen composition on the P/B ratio for ideally thin samples (i.e., the effects of scattering and absorption are considered negligible). As such it is assumed that the complications resulting from system peaks, bremsstrahlung fluorescence, electron tails and specimen contamination have been eliminated and that one needs only to consider the physics of the generation/emission process.The number of characteristic x-ray photons (Ip) emitted from a thin foil of thickness dt into the solid angle dΩ is given by the well-known equation

Analytical Electron Microscopy Characterization of Electric Arc Furnace Dust

1981 ◽  
Vol 39 ◽  
pp. 134-135
Author(s):  
J. R. Porter ◽  
J. I. Goldstein ◽  
D. B. Williams
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Electric Arc Furnace ◽  
Electric Arc ◽  
Dust Particles ◽  
Particle Analysis ◽  
Arc Furnace ◽  
Analytical Electron ◽  
Residual Elements ◽  
Industry Practice

Alloy scrap metal is increasingly being used in electric arc furnace (EAF) steelmaking and the alloying elements are also found in the resulting dust. A comprehensive characterization program of EAF dust has been undertaken in collaboration with the steel industry and AISI. Samples have been collected from the furnaces of 28 steel companies representing the broad spectrum of industry practice. The program aims to develop an understanding of the mechanisms of formation so that procedures to recover residual elements or recycle the dust can be established. The multi-phase, multi-component dust particles are amenable to individual particle analysis using modern analytical electron microscopy (AEM) methods.Particles are ultrasonically dispersed and subsequently supported on carbon coated formvar films on berylium grids for microscopy. The specimens require careful treatment to prevent agglomeration during preparation which occurs as a result of the combined effects of the fine particle size and particle magnetism. A number of approaches to inhibit agglomeration are currently being evaluated including dispersal in easily sublimable organic solids and size fractioning by centrifugation.

Application of analytical electron microscopy to the study of partitioning of silicon in a 2 wt% Si eutectoid steel

1978 ◽  
Vol 36 (1) ◽  
pp. 616-617
Author(s):  
N. Ridley ◽  
S.A. Al-Salman ◽  
G.W. Lorimer
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Analytical Electron Microscopy ◽  
Eutectoid Steel ◽  
Minimum Diameter ◽  
Thin Foils ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Transformation Front

The application of the technique of analytical electron microscopy to the study of partitioning of Mn (1) and Cr (2) during the austenite-pearlite transformation in eutectoid steels has been described in previous papers. In both of these investigations, ‘in-situ’ analyses of individual cementite and ferrite plates in thin foils showed that the alloying elements partitioned preferentially to cementite at the transformation front at higher reaction temperatures. At lower temperatures partitioning did not occur and it was possible to identify a ‘no-partition’ temperature for each of the steels examined.In the present work partitioning during the pearlite transformation has been studied in a eutectoid steel containing 1.95 wt% Si. Measurements of pearlite interlamellar spacings showed, however, that except at the highest reaction temperatures the spacing would be too small to make the in-situ analysis of individual cementite plates possible, without interference from adjacent ferrite lamellae. The minimum diameter of the analysis probe on the instrument used, an EMMA-4 analytical electron microscope, was approximately 100 nm.

Sign in / Sign up

Export Citation Format

Share Document