Non-destructive X-ray methods for quality control of thin ceramic coatings

1996 ◽  
Vol 51 (11) ◽  
pp. 36
Keyword(s):  
Quality Control ◽  
Ceramic Coatings ◽  
X Ray ◽  
Non Destructive ◽  
Ray Methods

scholarly journals Seam welds quality control improvement using method of pseudo-color coding images

2021 ◽  
Vol 2094 (2) ◽  
pp. 022058
Author(s):  
M F Noskov
Keyword(s):  
Quality Control ◽  
Color Image ◽  
Color Coding ◽  
Visual Examination ◽  
X Ray ◽  
Black And White ◽  
Optical Mixing ◽  
Pseudo Color ◽  
Ray Methods ◽  
Methods Of Control

Abstract The method of seam welds quality control using X-ray is considered. The X-ray methods of control are based on the capability of gamma radiation to penetrate through a metal including welded areas. Regions having defects - pores, faulty welds, cracks, scale inclusions - look darker on images. Appearance, linear dimensions and depths of the defects usually are determined by a visual examination comparing the X-ray image with standard defects images. It is known that a human eye can distinguish not more than 12-15 shades on a black and white image but more than a hundred on a colored image. The paper considers possibilities of the developed method by the author and based on the optical mixing of two or three complementary colors - red, blue and green. The method can use only one pair of the colors at a time, i.e. it is possible to have three various pairs for a pseudo-color image. The obtained pseudo-color image has the same informational capacity as the original black and white image. But the greater fraction of the saved information becomes available for visual examination of the X-ray image. In the end the efficiency of the seam weld quality control increases.

scholarly journals Non-Invasive and Non-Destructive Examination of Artistic Pigments, Paints, and Paintings by Means of X-Ray Methods

2016 ◽  
Vol 374 (6) ◽  
Author(s):  
Koen Janssens ◽  
Geert Van der Snickt ◽  
Frederik Vanmeert ◽  
Stijn Legrand ◽  
Gert Nuyts ◽  
...  
Keyword(s):  
X Ray ◽  
Non Invasive ◽  
Non Destructive ◽  
Ray Methods

Grazing Incidence X-Ray Reflectance Measurement of Surface and Interface Roughness on the Sub-Nanometre Scale

1994 ◽  
Vol 332 ◽  
Author(s):  
M. Wormington ◽  
K. Sakurai ◽  
D.K. Bowen ◽  
B.K. Tanner
Keyword(s):  
Grazing Incidence ◽  
Interface Roughness ◽  
Reflectance Measurement ◽  
Correlation Lengths ◽  
X Ray ◽  
Surface And Interface ◽  
Atomic Force ◽  
Fractal Representation ◽  
Non Destructive ◽  
Ray Methods

ABSTRACTGrazing incidence X-ray reflectivity may be used to measure surface topography including roughness and correlation lengths to sub-nanometre precision. A study is made of a technically important surface, a carefully-polished specimen of Zerodur glass-ceramic, which has been measured by diffuse scatter of CuKα X-radiation and atomic-force profilometry methods. The data have been analysed in terms of a fractal representation of the surface correlation function. Results from the two methods agreed within their estimated errors, with the X-ray data showing roughnesses of 1.3 nm, correlation length of 1 μm and fractal parameter (bandwidth) of 0.35. The X-ray methods have a lower cut-off length, are much more rapid for averaged information and are both non-contacting and non-destructive. They also show potential for the study of interface roughness in thin films.

scholarly journals X-ray fan beam coded aperture transmission and diffraction imaging for fast material analysis

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Stefan Stryker ◽  
Joel A. Greenberg ◽  
Shannon J. McCall ◽  
Anuj J. Kapadia
Keyword(s):  
High Resolution ◽  
Spatial Resolution ◽  
Imaging System ◽  
Coded Aperture ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Imaging ◽  
Diffraction Imaging ◽  
Non Destructive ◽  
Ray Methods

AbstractX-ray transmission imaging has been used in a variety of applications for high-resolution measurements based on shape and density. Similarly, X-ray diffraction (XRD) imaging has been used widely for molecular structure-based identification of materials. Combining these X-ray methods has the potential to provide high-resolution material identification, exceeding the capabilities of either modality alone. However, XRD imaging methods have been limited in application by their long measurement times and poor spatial resolution, which has generally precluded combined, rapid measurements of X-ray transmission and diffraction. In this work, we present a novel X-ray fan beam coded aperture transmission and diffraction imaging system, developed using commercially available components, for rapid and accurate non-destructive imaging of industrial and biomedical specimens. The imaging system uses a 160 kV Bremsstrahlung X-ray source while achieving a spatial resolution of ≈ 1 × 1 mm2 and a spectral accuracy of > 95% with only 15 s exposures per 150 mm fan beam slice. Applications of this technology are reported in geological imaging, pharmaceutical inspection, and medical diagnosis. The performance of the imaging system indicates improved material differentiation relative to transmission imaging alone at scan times suitable for a variety of industrial and biomedical applications.

scholarly journals Non-Invasive and Non-Destructive Examination of Artistic Pigments, Paints, and Paintings by Means of X-Ray Methods

2016 ◽  
pp. 77-128 ◽  
Author(s):  
Koen Janssens ◽  
Geert Van der Snickt ◽  
Frederik Vanmeert ◽  
Stijn Legrand ◽  
Gert Nuyts ◽  
...  
Keyword(s):  
X Ray ◽  
Non Invasive ◽  
Non Destructive ◽  
Ray Methods

Imaging Defect Luminescence of 4H-SiC by Ultraviolet-Photoluminescence

2015 ◽  
Vol 242 ◽  
pp. 484-489 ◽  
Author(s):  
Patrick Berwian ◽  
Daniel Kaminzky ◽  
Katharina Roßhirt ◽  
Birgit Kallinger ◽  
Jochen Friedrich ◽  
...  
Keyword(s):  
Silicon Carbide ◽  
Quality Control ◽  
Electronic Devices ◽  
Stacking Faults ◽  
Extended Defects ◽  
Production Environment ◽  
X Ray ◽  
Related Defect ◽  
Non Destructive ◽  
Defect Luminescence

A new tool for characterizing extended defects in Silicon Carbide (SiC) based on photoluminescence imaging is presented. In contrast to other techniques like Defect Selective Etching (DSE) or X-ray topography this technique is both fast and non-destructive. It is shown that several defect types, especially those relevant for the performance of electronic devices on SiC (i.e. Stacking Faults and Basal Plane Dislocations) can be investigated. The tool is therefore usable in research and development for a quick feedback on process related defect generation as well as in a production environment for quality control.

In-Situ Delamination Studies Using X-Ray Microtomography

2002 ◽  
Author(s):  
Ryszard Pyrz ◽  
Jens V. Nygaard
Keyword(s):  
Internal Structure ◽  
Cross Sections ◽  
Three Dimensional ◽  
Natural Conditions ◽  
X Ray ◽  
Fibre Bridging ◽  
Transmission Technique ◽  
Non Destructive ◽  
Ray Methods

Considering existing microscopical techniques to study microstructures of materials, one can find that non-destructive information from the internal structure of an object in natural conditions can be obtained by transmission X-ray microscopy. Combination of X-ray transmission technique with tomographical reconstruction allows to get three-dimensional information about the internal microstructure. In this case any internal area can be reconstructed as a set of flat cross sections which can be used to analyse the two- and three-dimensional morphological parameters. For X-ray methods the contrast in the images is a mixed combination of density and compositional information which provides means for non-destructive reconstruction of the internal structure. The paper presents experimental results of crack propagation and fibre bridging glass fibre epoxy samples that were collected in-situ during loading in a X-ray scanner.

scholarly journals Identification of inversion domains in KTiOPO4viaresonant X-ray diffraction

2015 ◽  
Vol 71 (4) ◽  
pp. 361-367 ◽  
Author(s):  
Federica Fabrizi ◽  
Pamela A. Thomas ◽  
Gareth Nisbet ◽  
Stephen P. Collins
Keyword(s):  
Bragg Reflection ◽  
Crystallographic Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Polar Materials ◽  
Novel Method ◽  
Physical Phenomena ◽  
Non Destructive ◽  
Ray Methods

A novel method is presented for the identification of the absolute crystallographic structure in multi-domain polar materials such as ferroelectric KTiOPO4. Resonant (or `anomalous') X-ray diffraction spectra collected across the absorptionKedge of Ti (4.966 keV) on a single Bragg reflection demonstrate a huge intensity ratio above and below the edge, providing a polar domain contrast of ∼270. This allows one to map the spatial domain distribution in a periodically inverted sample, with a resolution of ∼1 µm achieved with a microfocused beam. This non-contact, non-destructive technique is well suited for samples of large dimensions (in contrast with traditional resonant X-ray methods based on diffraction from Friedel pairs), and its potential is particularly relevant in the context of physical phenomena connected with an absence of inversion symmetry, which require characterization of the underlying absolute atomic structure (such as in the case of magnetoelectric coupling and multiferroics).

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