Nature of the large scale mobility in dense network epoxide polymers

1988 ◽  
Vol 30 (5) ◽  
pp. 931-938
Author(s):  
I.N. Zakirov ◽  
V.I. Irzhak ◽  
V.M. Lantsov ◽  
B.A. Rozenbyerg
Keyword(s):  
Large Scale ◽  
Dense Network ◽  
Epoxide Polymers

scholarly journals Active Fault Systems in the Inner Northwest Apennines, Italy: A Reappraisal One Century after the 1920 Mw ~6.5 Fivizzano Earthquake

Geosciences ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 139
Author(s):  
Giancarlo Molli ◽  
Isabelle Manighetti ◽  
Rick Bennett ◽  
Jacques Malavieille ◽  
Enrico Serpelloni ◽  
...  
Keyword(s):  
Large Scale ◽  
Active Fault ◽  
Active Faults ◽  
Dense Network ◽  
Earthquake Fault ◽  
Slip Rates ◽  
Fault Systems ◽  
Seismological Data ◽  
Seismogenic Faults

Based on the review of the available stratigraphic, tectonic, morphological, geodetic, and seismological data, along with new structural observations, we present a reappraisal of the potential seismogenic faults and fault systems in the inner northwest Apennines, Italy, which was the site, one century ago, of the devastating Mw ~6.5, 1920 Fivizzano earthquake. Our updated fault catalog provides the fault locations, as well as the description of their architecture, large-scale segmentation, cumulative displacements, evidence for recent to present activity, and long-term slip rates. Our work documents that a dense network of active faults, and thus potential earthquake fault sources, exists in the region. We discuss the seismogenic potential of these faults, and propose a general tectonic scenario that might account for their development.

scholarly journals A Novel Coarse-to-Fine Method of Ship Detection in Optical Remote Sensing Images Based on a Deep Residual Dense Network

2020 ◽  
Vol 12 (19) ◽  
pp. 3115 ◽  
Author(s):  
Liqiong Chen ◽  
Wenxuan Shi ◽  
Cien Fan ◽  
Lian Zou ◽  
Dexiang Deng
Keyword(s):  
Remote Sensing ◽  
Large Scale ◽  
False Alarms ◽  
Discrete Wavelet ◽  
Detection Accuracy ◽  
Optical Remote Sensing ◽  
Dense Network ◽  
Remote Sensing Images ◽  
Ship Detection ◽  
Coarse To Fine

Automatic ship detection in optical remote sensing images is of great significance due to its broad applications in maritime security and fishery control. Most ship detection algorithms utilize a single-band image to design low-level and hand-crafted features, which are easily influenced by interference like clouds and strong waves and not robust for large-scale variation of ships. In this paper, we propose a novel coarse-to-fine ship detection method based on discrete wavelet transform (DWT) and a deep residual dense network (DRDN) to address these problems. First, multi-spectral images are adopted for sea-land segmentation, and an enhanced DWT is employed to quickly extract ship candidate regions with missing alarms as low as possible. Second, panchromatic images with clear spatial details are used for ship classification. Specifically, we propose the local residual dense block (LRDB) to fully extract semantic feature via local residual connection and densely connected convolutional layers. DRDN mainly consists of four LRDBs and is designed to further remove false alarms. Furthermore, we exploit the multiclass classification strategy, which can overcome the large intra-class difference of targets and identify ships of different sizes. Extensive experiments demonstrate that the proposed method has high robustness in complex image backgrounds and achieves higher detection accuracy than other state-of-the-art methods.

Features of the quasi-brittle fracture of dense-network epoxide polymers modified with rubbers

1985 ◽  
Vol 27 (4) ◽  
pp. 846-853 ◽  
Author(s):  
V.P. Volkov ◽  
G.G. Aleksanyan ◽  
Al.Al. Berlin ◽  
B.A. Rozenberg
Keyword(s):  
Brittle Fracture ◽  
Dense Network ◽  
Epoxide Polymers

scholarly journals An Estimation of QoS for Classified Based Approach and Nonclassified Based Approach of Wireless Agriculture Monitoring Network Using a Network Model

2017 ◽  
Vol 2017 ◽  
pp. 1-14 ◽  
Author(s):  
Ismail Ahmedy ◽  
Hisham A. Shehadeh ◽  
Mohd Yamani Idna Idris
Keyword(s):  
Large Scale ◽  
Monitoring Network ◽  
Wireless Sensor ◽  
Dense Network ◽  
High Quality ◽  
Multihop Network ◽  
Simulation Results ◽  
Test Scenarios ◽  
Higher Sensitivity

Wireless Sensor Network (WSN) can facilitate the process of monitoring the crops through agriculture monitoring network. However, it is challenging to implement the agriculture monitoring network in large scale and large distributed area. Typically, a large and dense network as a form of multihop network is used to establish communication between source and destination. This network continuously monitors the crops without sensitivity classification that can lead to message collision and packets drop. Retransmissions of drop messages can increase the energy consumption and delay. Therefore, to ensure a high quality of service (QoS), we propose an agriculture monitoring network that monitors the crops based on their sensitivity conditions wherein the crops with higher sensitivity are monitored constantly, while less sensitive crops are monitored occasionally. This approach selects a set of nodes rather than utilizing all the nodes in the network which reduces the power consumption in each node and network delay. The QoS of the proposed classified based approach is compared with the nonclassified approach in two scenarios; the backoff periods are changed in the first scenario while the numbers of nodes are changed in the second scenario. The simulation results demonstrate that the proposed approach outperforms the nonclassified approach on different test scenarios.

Some comments about observations and image processing of comet 29P/Schwassmann-Wachmann 1

1999 ◽  
Vol 173 ◽  
pp. 243-248
Author(s):  
D. Kubáček ◽  
A. Galád ◽  
A. Pravda
Keyword(s):  
Image Processing ◽  
Large Scale ◽  
Harvard College ◽  
Oak Ridge ◽  
Large Scale Structures ◽  
Short Period Comet ◽  
Short Period ◽  
Scale Structures ◽  
Harvard College Observatory ◽  
Period Comet

AbstractUnusual short-period comet 29P/Schwassmann-Wachmann 1 inspired many observers to explain its unpredictable outbursts. In this paper large scale structures and features from the inner part of the coma in time periods around outbursts are studied. CCD images were taken at Whipple Observatory, Mt. Hopkins, in 1989 and at Astronomical Observatory, Modra, from 1995 to 1998. Photographic plates of the comet were taken at Harvard College Observatory, Oak Ridge, from 1974 to 1982. The latter were digitized at first to apply the same techniques of image processing for optimizing the visibility of features in the coma during outbursts. Outbursts and coma structures show various shapes.

Evolution of Large-Scale Coronal Structures

1994 ◽  
Vol 144 ◽  
pp. 29-33
Author(s):  
P. Ambrož
Keyword(s):  
Magnetic Field ◽  
Field Line ◽  
Large Scale ◽  
Coronal Magnetic Field ◽  
Source Surface ◽  
Solar Cycles ◽  
Characteristic Relationship ◽  
The Magnetic Field ◽  
Coronal Structures

AbstractThe large-scale coronal structures observed during the sporadically visible solar eclipses were compared with the numerically extrapolated field-line structures of coronal magnetic field. A characteristic relationship between the observed structures of coronal plasma and the magnetic field line configurations was determined. The long-term evolution of large scale coronal structures inferred from photospheric magnetic observations in the course of 11- and 22-year solar cycles is described.Some known parameters, such as the source surface radius, or coronal rotation rate are discussed and actually interpreted. A relation between the large-scale photospheric magnetic field evolution and the coronal structure rearrangement is demonstrated.

Large-scale Motion of Solar Filaments

2000 ◽  
Vol 179 ◽  
pp. 205-208
Author(s):  
Pavel Ambrož ◽  
Alfred Schroll
Keyword(s):  
Magnetic Flux ◽  
Proper Motion ◽  
Time Scale ◽  
Large Scale ◽  
Accuracy Of Measurements ◽  
Solar Filaments ◽  
General Movement ◽  
Scale Motion ◽  
Velocity Scatter

AbstractPrecise measurements of heliographic position of solar filaments were used for determination of the proper motion of solar filaments on the time-scale of days. The filaments have a tendency to make a shaking or waving of the external structure and to make a general movement of whole filament body, coinciding with the transport of the magnetic flux in the photosphere. The velocity scatter of individual measured points is about one order higher than the accuracy of measurements.

Some applications of electron beam microanalysis techniques in VLSI process evaluation

1983 ◽  
Vol 41 ◽  
pp. 160-161
Author(s):  
Simon Thomas
Keyword(s):  
Integrated Circuits ◽  
Process Evaluation ◽  
Large Scale ◽  
Technology Development ◽  
Analytical Techniques ◽  
Successful Implementation ◽  
Analysis Of Failures ◽  
Characterization Of Materials ◽  
Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

Electron microscopy study of reactively sputter-deposited Ti/N films on silicon

1992 ◽  
Vol 50 (2) ◽  
pp. 1362-1363
Author(s):  
V. C. Kannan ◽  
A. K. Singh ◽  
R. B. Irwin ◽  
S. Chittipeddi ◽  
F. D. Nkansah ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Large Scale ◽  
Hexagonal Phase ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Process Conditions ◽  
Tin Films ◽  
Wide Range ◽  
Fcc Phase ◽  
Circuits Vlsi

Titanium nitride (TiN) films have historically been used as diffusion barrier between silicon and aluminum, as an adhesion layer for tungsten deposition and as an interconnect material etc. Recently, the role of TiN films as contact barriers in very large scale silicon integrated circuits (VLSI) has been extensively studied. TiN films have resistivities on the order of 20μ Ω-cm which is much lower than that of titanium (nearly 66μ Ω-cm). Deposited TiN films show resistivities which vary from 20 to 100μ Ω-cm depending upon the type of deposition and process conditions. TiNx is known to have a NaCl type crystal structure for a wide range of compositions. Change in color from metallic luster to gold reflects the stabilization of the TiNx (FCC) phase over the close packed Ti(N) hexagonal phase. It was found that TiN (1:1) ideal composition with the FCC (NaCl-type) structure gives the best electrical property.

Evolution of the microstructure of Cu(Ti)/SiO2 layers annealed in NH3

1995 ◽  
Vol 53 ◽  
pp. 452-453
Author(s):  
J. Liu ◽  
N. D. Theodore ◽  
D. Adams ◽  
S. Russell ◽  
T. L. Alford ◽  
...  
Keyword(s):  
Thermal Stability ◽  
Titanium Nitride ◽  
Large Scale ◽  
Standard Procedure ◽  
Alloy Film ◽  
Electron Beam Evaporation ◽  
Copper Metallization ◽  
Nominal Composition ◽  
Ti Alloy ◽  
Thermally Grown

Copper-based metallization has recently attracted extensive research because of its potential application in ultra-large-scale integration (ULSI) of semiconductor devices. The feasibility of copper metallization is, however, limited due to its thermal stability issues. In order to utilize copper in metallization systems diffusion barriers such as titanium nitride and other refractory materials, have been employed to enhance the thermal stability of copper. Titanium nitride layers can be formed by annealing Cu(Ti) alloy film evaporated on thermally grown SiO2 substrates in an ammonia ambient. We report here the microstructural evolution of Cu(Ti)/SiO2 layers during annealing in NH3 flowing ambient.The Cu(Ti) films used in this experiment were prepared by electron beam evaporation onto thermally grown SiO2 substrates. The nominal composition of the Cu(Ti) alloy was Cu73Ti27. Thermal treatments were conducted in NH3 flowing ambient for 30 minutes at temperatures ranging from 450°C to 650°C. Cross-section TEM specimens were prepared by the standard procedure.

Sign in / Sign up

Export Citation Format

Share Document