Effect of the stray field of Fe/Fe3O4 nanoparticles on the surface of the CoFeB thin films

Scanning Hall probe microscopy is attractive for minimally invasive characterization of magnetic thin films and nanostructures by measurement of the emanating magnetic stray field. Established sensor probes operating at room temperature employ highly miniaturized spin-valve elements or semimetals, such as Bi. As the sensor layer structures are fabricated by patterning of planar thin films, their adaption to custom-made sensor probe geometries is highly challenging or impossible. Here we show how nanogranular ferromagnetic Hall devices fabricated by the direct-write method of focused electron beam induced deposition (FEBID) can be tailor-made for any given probe geometry. Furthermore, we demonstrate how the magnetic stray field sensitivity can be optimized in situ directly after direct-write nanofabrication of the sensor element. First proof-of-principle results on the use of this novel scanning Hall sensor are shown.

Download Full-text

Out-of-plane stray field at magnetization reversal in epitaxial magnetite thin films

Journal of Magnetism and Magnetic Materials ◽

10.1016/s0304-8853(01)01107-6 ◽

2002 ◽

Vol 242-245 ◽

pp. 1097-1099 ◽

Cited By ~ 9

Author(s):

M.K. Krause ◽

P. Esquinazi ◽

M. Ziese ◽

R. Höhne ◽

A. Pan ◽

...

Keyword(s):

Thin Films ◽

Magnetization Reversal ◽

Stray Field ◽

Out Of Plane

Download Full-text

Fabrication and Characterization of Permanent Magnetic SmCo5 Thin Films by SQUID Magnetometer

Materials Science Forum ◽

10.4028/www.scientific.net/msf.915.16 ◽

2018 ◽

Vol 915 ◽

pp. 16-21 ◽

Cited By ~ 1

Author(s):

Mehmet Kuru ◽

Erhan Ongun ◽

Asım Özmeti̇n ◽

Mehmet Hançer ◽

Ali Esad Özmeti̇n

Keyword(s):

Thin Films ◽

Magnetic Properties ◽

Quantum Interference ◽

Advanced Characterization ◽

Rf Magnetron Sputtering ◽

Magnetic Thin Films ◽

Stray Field ◽

Micro Electro Mechanical Systems ◽

Force Microscopy ◽

Tools And Techniques

Fabrication of hard magnetic thin films is a key issue on the development of new micro electro mechanical systems. As the magnetically hard SmCo thin-films offer excellent intrinsic magnetic properties, such as moderate saturation magnetization, large magnetic anisotropy, and high Curie temperature, they are considered as a promising candidate to be used for novel MEMS applications. In this work, SmCo5 thin films with Cu underlayer were grown onto Si (100) substrate at room temperature by RF magnetron sputtering technique. The samples were annealed at 400 ̊C and 500 ̊C under Ar atmosphere condition. Microstructural and magnetic properties of sputtered SmCo5 thin films were investigated by a number of advanced characterization tools and techniques. Phase composition of SmCo5 thin films was analyzed by grazing incident X-ray diffraction (GIXRD) with Cu-Kα radiation. Surface morphology was investigated by scanning electron microscopy (SEM) and atomic force microscopy (AFM) techniques. Magnetic force microscopy (MFM) technique was used to take stray-field images of SmCo5 thin films, and finally magnetic properties were investigated to explain the coercivity of SmCo5 thin films using superconducting quantum interference device (SQUID) as a magnetometer.

Download Full-text

Enhanced superconducting properties in epitaxial FeSe thin films with self-assembled Fe3O4 nanoparticles

Physica C Superconductivity ◽

10.1016/j.physc.2011.05.248 ◽

2011 ◽

Vol 471 (17-18) ◽

pp. 515-519 ◽

Cited By ~ 13

Author(s):

Li Chen ◽

Chen-Fong Tsai ◽

Yuanyuan Zhu ◽

Zhenxing Bi ◽

Haiyan Wang

Keyword(s):

Thin Films ◽

Fe3o4 Nanoparticles ◽

Superconducting Properties ◽

Self Assembled

Download Full-text

Magnetic force microscopy study of magnetic stray-field effects due to mechanical surface modifications of patterned Permalloy thin films

Applied Physics A ◽

10.1007/s003390050171 ◽

1995 ◽

Vol 61 (1) ◽

pp. 93-97

Author(s):

M. L�hndorf ◽

R. Wiesendanger

Keyword(s):

Thin Films ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Surface Modifications ◽

Microscopy Study ◽

Stray Field ◽

Force Microscopy ◽

Field Effects ◽

Mechanical Surface ◽

Permalloy Thin Films

Download Full-text

The study of interfacial reactions of nickel thin films on GaAs

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100074616 ◽

1983 ◽

Vol 41 ◽

pp. 156-157

Author(s):

L.J. Chen ◽

Y.F. Hsieh

Keyword(s):

Thin Films ◽

Integrated Circuits ◽

Interfacial Reactions ◽

Metal Contacts ◽

Nickel Thin Films ◽

Thin Foils ◽

The Status ◽

Si Doped ◽

Electron Microscopes

One measure of the maturity of a device technology is the ease and reliability of applying contact metallurgy. Compared to metal contact of silicon, the status of GaAs metallization is still at its primitive stage. With the advent of GaAs MESFET and integrated circuits, very stringent requirements were placed on their metal contacts. During the past few years, extensive researches have been conducted in the area of Au-Ge-Ni in order to lower contact resistances and improve uniformity. In this paper, we report the results of TEM study of interfacial reactions between Ni and GaAs as part of the attempt to understand the role of nickel in Au-Ge-Ni contact of GaAs.N-type, Si-doped, (001) oriented GaAs wafers, 15 mil in thickness, were grown by gradient-freeze method. Nickel thin films, 300Å in thickness, were e-gun deposited on GaAs wafers. The samples were then annealed in dry N2 in a 3-zone diffusion furnace at temperatures 200°C - 600°C for 5-180 minutes. Thin foils for TEM examinations were prepared by chemical polishing from the GaA.s side. TEM investigations were performed with JE0L- 100B and JE0L-200CX electron microscopes.

Download Full-text

Studies on Water in the Hydration Chamber of a Modified Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100069715 ◽

1970 ◽

Vol 28 ◽

pp. 544-545

Author(s):

R. C. Moretz ◽

G. G. Hausner ◽

D. F. Parsons

Keyword(s):

Thin Film ◽

Thin Films ◽

Electron Microscope ◽

Steady State ◽

Room Temperature ◽

Small Mass ◽

Equilibrium Pressure ◽

Biological Objects ◽

Mechanical Pump ◽

Differential Pumping

Use of the electron microscope to examine wet objects is possible due to the small mass thickness of the equilibrium pressure of water vapor at room temperature. Previous attempts to examine hydrated biological objects and water itself used a chamber consisting of two small apertures sealed by two thin films. Extensive work in our laboratory showed that such films have an 80% failure rate when wet. Using the principle of differential pumping of the microscope column, we can use open apertures in place of thin film windows.Fig. 1 shows the modified Siemens la specimen chamber with the connections to the water supply and the auxiliary pumping station. A mechanical pump is connected to the vapor supply via a 100μ aperture to maintain steady-state conditions.

Download Full-text