Effect of KOH molarity and annealing temperature on ZnO nanostructure properties
2018 ◽
Vol 56
(3)
◽
pp. 1001-1009
◽
1967 ◽
Vol 25
◽
pp. 312-313
1991 ◽
Vol 49
◽
pp. 562-563
1984 ◽
Vol 42
◽
pp. 498-499
Defect reduction in oxygen implanted silicon-on-insulator material during high-temperature annealing
1989 ◽
Vol 47
◽
pp. 604-605