Low-frequency broadband absorption of underwater composite anechoic coating with periodic subwavelength arrays of shunted piezoelectric patches

2019 ◽  
Vol 216 ◽  
pp. 449-463 ◽  
Author(s):  
Zhifu Zhang ◽  
Yizhe Huang ◽  
Qibai Huang
Keyword(s):  
Low Frequency ◽  
Broadband Absorption

Broadband low-frequency acoustic absorber based on a metaporous composite

2022 ◽  
Author(s):  
Jia-Hao Xu ◽  
Xing-Feng Zhu ◽  
Di-Chao Chen ◽  
Qi Wei ◽  
Da-Jian Wu
Keyword(s):  
Acoustic Waves ◽  
High Efficiency ◽  
Low Frequency ◽  
Frequency Noise ◽  
Sound Waves ◽  
Broadband Absorption ◽  
Trapped Mode ◽  
Potential Applications ◽  
Simulation And Experiment ◽  
Interest In Research

Abstract Broadband absorption of low-frequency sound waves via a deep subwavelength structure is of great and ongoing interest in research and engineering. Here, we numerically and experimentally present a design of a broadband low-frequency absorber based on an acoustic metaporous composite (AMC). The AMC absorber is constructed by embedding a single metamaterial resonator into a porous layer. The finite element simulations show that a high absorption (absorptance A > 0.8) can be achieved within a broad frequency range (from 290 Hz to 1074 Hz), while the thickness of AMC is 1/13 of the corresponding wavelength at 290 Hz. The broadband and high-efficiency performances of the absorber are attributed to the coupling between the two resonant absorptions and the trapped mode. A good agreement between the numerical simulation and experiment is obtained. Moreover, the high broadband absorption can be maintained under random incident acoustic waves. The proposed absorber provides potential applications in low-frequency noise reduction especially when limited space is demanded.

Acoustical siphon effect for reducing the thickness in membrane-type metamaterials with low-frequency broadband absorption

2019 ◽  
Vol 148 ◽  
pp. 1-8 ◽  
Author(s):  
Chong Rui Liu ◽  
Jiu Hui Wu ◽  
Kuan Lu ◽  
Zi Ting Zhao ◽  
Zhen Huang
Keyword(s):  
Low Frequency ◽  
Broadband Absorption ◽  
Membrane Type

Low-frequency resistive-type metamaterial with broadband absorption by employing screen-printing method

2020 ◽  
Vol 34 (31) ◽  
pp. 2050298
Author(s):  
Longhui He ◽  
Cuixiu Xiong ◽  
Hui Xu ◽  
Sheng Liu ◽  
Yunchao Xu ◽  
...  
Keyword(s):  
Reflection Loss ◽  
Low Frequency ◽  
Surface Current ◽  
Transverse Magnetic ◽  
Metamaterial Absorber ◽  
Effective Bandwidth ◽  
Low Frequencies ◽  
Broadband Absorption ◽  
Microwave Absorbing Materials ◽  
Resistive Type

A broadband and wide-angled microwave absorber based on resistive-type metamaterial has been proposed and demonstrated in the low-frequency regime of 2–8 GHz. The minimum reflection loss of the absorption peak located at 5.27 GHz is −51.41 dB. Effective bandwidth better than −10 dB reflection loss is able to achieve 2.70 GHz in the range from 3.81 GHz to 6.51 GHz. The underlying physical mechanisms of electromagnetic wave energy attenuation are illustrated in detail by means of surface current, electromagnetic field and power loss density. Furthermore, the influence of structural dimensions on the attenuation properties of the proposed resistive-type metamaterial absorber is also investigated. More importantly, the designed resistive-type metamaterial absorber could operate well with incident angles changing from 0[Formula: see text] to 60[Formula: see text] under the transverse electric (TE) and transverse magnetic (TM) waves. Research results will be capable of providing guidance for the design and preparation of broadband microwave absorbing materials at low frequencies.

A Study on the Fine Structure of the Lateral Line Organ of the Sea Eel

1973 ◽  
Vol 31 ◽  
pp. 648-649
Author(s):  
K. Hama
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Lateral Line ◽  
Low Frequency ◽  
Sensory Cells ◽  
Apical Surface ◽  
Voltage Electron ◽  
Sensory Epithelia ◽  
Low Frequency Vibration ◽  
Transmission Electron

The lateral line organs of the sea eel consist of canal and pit organs which are different in function. The former is a low frequency vibration detector whereas the latter functions as an ion receptor as well as a mechano receptor.The fine structure of the sensory epithelia of both organs were studied by means of ordinary transmission electron microscope, high voltage electron microscope and of surface scanning electron microscope.The sensory cells of the canal organ are polarized in front-caudal direction and those of the pit organ are polarized in dorso-ventral direction. The sensory epithelia of both organs have thinner surface coats compared to the surrounding ordinary epithelial cells, which have very thick fuzzy coatings on the apical surface.

Lectin Binding to Human Breast Tumor Cells

1976 ◽  
Vol 34 ◽  
pp. 34-35
Author(s):  
Robert E. Nordquist ◽  
J. Hill Anglin ◽  
Michael P. Lerner
Keyword(s):  
Carcinoma Cell ◽  
Ricinus Communis ◽  
Lectin Binding ◽  
Low Frequency ◽  
Breast Carcinoma Cell Line ◽  
Human Breast ◽  
Human Breast Tumor ◽  
Duct Carcinoma ◽  
Specific Antigens ◽  
Ricin Agglutinin

A human breast carcinoma cell line (BOT-2) was derived from an infiltrating duct carcinoma (1). These cells were shown to have antigens that selectively bound antibodies from breast cancer patient sera (2). Furthermore, these tumor specific antigens could be removed from the living cells by low frequency sonication and have been partially characterized (3). These proteins have been shown to be around 100,000 MW and contain approximately 6% hexose and hexosamines. However, only the hexosamines appear to be available for lectin binding. This study was designed to use Concanavalin A (Con A) and Ricinus Communis (Ricin) agglutinin for the topagraphical localization of D-mannopyranosyl or glucopyranosyl and D-galactopyranosyl or DN- acetyl glactopyranosyl configurations on BOT-2 cell surfaces.

Practical High Resolution Microscopy

1968 ◽  
Vol 26 ◽  
pp. 302-303
Author(s):  
P. A. Marsh ◽  
T. Mullens ◽  
D. Price
Keyword(s):  
High Resolution ◽  
Magnetic Fields ◽  
Low Frequency ◽  
Resolving Power ◽  
Careful Attention ◽  
Electron Microscopes ◽  
The Relationship ◽  
High Resolution Microscopy ◽  
New Facilities

It is possible to exceed the guaranteed resolution on most electron microscopes by careful attention to microscope parameters essential for high resolution work. While our experience is related to a Philips EM-200, we hope that some of these comments will apply to all electron microscopes.The first considerations are vibration and magnetic fields. These are usually measured at the pre-installation survey and must be within specifications. It has been our experience, however, that these factors can be greatly influenced by the new facilities and therefore must be rechecked after the installation is completed. The relationship between the resolving power of an EM-200 and the maximum tolerable low frequency interference fields in milli-Oerstedt is 10 Å - 1.9, 8 Å - 1.4, 6 Å - 0.8.

Simulations of high-resolution images of amorphous silicon films

1986 ◽  
Vol 44 ◽  
pp. 544-545
Author(s):  
G. Y. Fan ◽  
J. M. Cowley
Keyword(s):  
Electron Microscope ◽  
High Frequency ◽  
Fourier Transformation ◽  
Amorphous Materials ◽  
Low Frequency ◽  
Chromatic Aberration ◽  
Structure Information ◽  
Frequency Components ◽  
High Resolution Images ◽  
Spatial Frequency Spectrum

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.

SEM image sharpness analysis

1996 ◽  
Vol 54 ◽  
pp. 142-143
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
High Frequency ◽  
Low Frequency ◽  
Quantitative Information ◽  
Primary Electron ◽  
Image Sharpness ◽  
Critical Dimensions ◽  
Sem Image ◽  
Frequency Changes ◽  
Electron Microscopes ◽  
Scanning Electron

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.

Real Ear Sound Pressure Levels Developed by Three Portable Stereo System Earphones

1992 ◽  
Vol 1 (4) ◽  
pp. 52-55 ◽  
Author(s):  
Gail L. MacLean ◽  
Andrew Stuart ◽  
Robert Stenstrom
Keyword(s):  
High Frequency ◽  
Sound Pressure ◽  
Low Frequency ◽  
Test System ◽  
Output Frequency ◽  
Frequency Effects ◽  
Adult Men ◽  
Frequency Responses ◽  
Significant Difference ◽  
Sound Pressure Levels

Differences in real ear sound pressure levels (SPLs) with three portable stereo system (PSS) earphones (supraaural [Sony Model MDR-44], semiaural [Sony Model MDR-A15L], and insert [Sony Model MDR-E225]) were investigated. Twelve adult men served as subjects. Frequency response, high frequency average (HFA) output, peak output, peak output frequency, and overall RMS output for each PSS earphone were obtained with a probe tube microphone system (Fonix 6500 Hearing Aid Test System). Results indicated a significant difference in mean RMS outputs with nonsignificant differences in mean HFA outputs, peak outputs, and peak output frequencies among PSS earphones. Differences in mean overall RMS outputs were attributed to differences in low-frequency effects that were observed among the frequency responses of the three PSS earphones. It is suggested that one cannot assume equivalent real ear SPLs, with equivalent inputs, among different styles of PSS earphones.

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