Effects of Mg doping on the gate bias and thermal stability of solution-processed InGaZnO thin-film transistors

2013 ◽  
Vol 580 ◽  
pp. 10-14 ◽  
Author(s):  
Bo-Yuan Su ◽  
Sheng-Yuan Chu ◽  
Yung-Der Juang ◽  
Ssu-Yin Liu
Keyword(s):  
Thin Film ◽  
Thermal Stability ◽  
Thin Film Transistors ◽  
Gate Bias ◽  
Solution Processed ◽  
Mg Doping ◽  
Stability Of Solution ◽  
Thermal Stability Of

Stability of Solution-processed ZrInZnO Thin-film Transistors under Gate Bias Stress

2011 ◽  
Vol 59 (2) ◽  
pp. 353-356
Author(s):  
Tae Hoon Jeong ◽  
Si Joon Kim ◽  
Doo Hyun Yoon ◽  
Woong Hee Jeong ◽  
Dong Lim Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Gate Bias ◽  
Solution Processed ◽  
Bias Stress ◽  
Stability Of Solution ◽  
Gate Bias Stress

Environmental and operational stability of solution-processed 6,13-bis(triisopropyl-silylethynyl) pentacene thin film transistors

2009 ◽  
Vol 10 (3) ◽  
pp. 486-490 ◽  
Author(s):  
Sung Kyu Park ◽  
Devin A. Mourey ◽  
Jeong-In Han ◽  
John E. Anthony ◽  
Thomas N. Jackson
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Operational Stability ◽  
Solution Processed ◽  
Stability Of Solution

Effects of Mg on the electrical characteristics and thermal stability of MgxZn1−xO thin film transistors

2011 ◽  
Vol 98 (12) ◽  
pp. 123511 ◽  
Author(s):  
Chieh-Jen Ku ◽  
Ziqing Duan ◽  
Pavel I. Reyes ◽  
Yicheng Lu ◽  
Yi Xu ◽  
...  
Keyword(s):  
Thin Film ◽  
Thermal Stability ◽  
Thin Film Transistors ◽  
Electrical Characteristics ◽  
Thermal Stability Of
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