High-resolution transmission electron microscopy and electron backscatter diffraction in nanoscaled ferritic and ferritic–martensitic oxide dispersion strengthened–steels

2009 ◽  
Vol 385 (2) ◽  
pp. 231-235 ◽  
Author(s):  
Ch.Ch. Eiselt ◽  
M. Klimenkov ◽  
R. Lindau ◽  
A. Möslang ◽  
H.R.Z. Sandim ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Electron Backscatter Diffraction ◽  
Oxide Dispersion Strengthened ◽  
Oxide Dispersion ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Where are the geometrically necessary dislocations accommodating small imprints?

2009 ◽  
Vol 24 (3) ◽  
pp. 647-651 ◽  
Author(s):  
M. Rester ◽  
C. Motz ◽  
R. Pippan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Twin Boundary ◽  
Crystal Orientation ◽  
Electron Backscatter Diffraction ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Copper Single Crystals ◽  
Backscatter Diffraction ◽  
Small Misorientation

Electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM) analyses of small indentations in copper single crystals exhibit only slight changes of the crystal orientation in the surroundings of the imprints. Far-reaching dislocations might be the reason for these small misorientation changes. Using EBSD and TEM technique, this work makes an attempt to visualize the far-propagating dislocations by introducing a twin boundary in the vicinity of small indentations. Because dislocations piled up at the twin boundary produce a misorientation gradient, the otherwise far-propagating dislocations can be detected.

Heteroepitaxial CVD Growth of 3C-SiC on Diamond Substrate

2014 ◽  
Vol 778-780 ◽  
pp. 226-229 ◽  
Author(s):  
Véronique Soulière ◽  
Arthur Vo-Ha ◽  
Davy Carole ◽  
Alexandre Tallaire ◽  
Ovidiu Brinza ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Backscatter Diffraction ◽  
Heteroepitaxial Growth ◽  
Silicon Deposition ◽  
Transmission Electron ◽  
Diamond Substrate ◽  
Electron Backscatter ◽  
Cvd Growth ◽  
Backscatter Diffraction

This work presents the successful CVD heteroepitaxial growth of 3C-SiC on diamond (100) substrates. When performing a direct SiC growth at 1500°C on such substrate, it leads to polycrystalline deposit. The use of a substrate pretreatment involving silicon deposition allows forming a more continuous and smoother layer. Electron BackScatter Diffraction and Transmission Electron Microscopy all revealed that the 3C-SiC layer grown on the (100) diamond substrate is monocrystalline and well oriented.

Recrystallization Behavior of the Nickel-Based ODS Superalloy PM 1000

2007 ◽  
Vol 558-559 ◽  
pp. 313-318
Author(s):  
Hugo Ricardo Zschommler Sandim ◽  
Alexandra O.F. Hayama ◽  
Dierk Raabe
Keyword(s):  
Electron Microscopy ◽  
Volume Fraction ◽  
Electron Backscatter Diffraction ◽  
Oxide Dispersion Strengthened ◽  
Primary Recrystallization ◽  
Oxide Dispersion ◽  
Nickel Based Superalloy ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Backscatter Diffraction

PM 1000 is a nickel-based oxide dispersion strengthened (ODS) superalloy used for high-temperature applications. The primary recrystallization of a <100>-fiber textured coarsegrained oxide dispersion strengthened nickel-based superalloy (PM 1000) has been investigated. The annealing behavior of this alloy is quite complex. Even when annealing is performed at high homologous temperatures (e.g. 0.9 Tm, Tm is the melting point), recrystallization is partial. In order to understand such a behavior, the microstructure of specimens in both the as-received, deformed, and annealed conditions has been imaged in detail using scanning electron microscopy (SEM), transmission electron microscopy (TEM), and high-resolution electron backscatter diffraction (EBSD). In the annealed state we observe a significant volume fraction of tiny crystals in the interior of the recovered grains. These tiny grains are elongated and grow mostly along the existing low angle dislocation boundaries (anisotropic growth). In the present paper we propose a twinningassisted nucleation mechanism to clarify their origin during recrystallization.

scholarly journals Dislocation Creep of Olivine and Amphibole in Amphibole Peridotites from Åheim, Norway

Minerals ◽  
2021 ◽  
Vol 11 (9) ◽  
pp. 1018
Author(s):  
Sejin Jung ◽  
Takafumi Yamamoto ◽  
Jun-ichi Ando ◽  
Haemyeong Jung
Keyword(s):  
Electron Microscopy ◽  
Slip System ◽  
Electron Backscatter Diffraction ◽  
Microstructural Analysis ◽  
Dislocation Creep ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Different Types ◽  
Localized Shear Deformation ◽  
Backscatter Diffraction

Amphibole peridotite samples from Åheim, Norway, were analyzed to understand the deformation mechanism and microstructural evolution of olivine and amphibole through the Scandian Orogeny and subsequent exhumation process. Three Åheim amphibole peridotite samples were selected for detailed microstructural analysis. The Åheim amphibole peridotites exhibit porphyroclastic texture, abundant subgrain boundaries in olivine, and the evidence of localized shear deformation in the tremolite-rich layer. Two different types of olivine lattice preferred orientations (LPOs) were observed: B- and A-type LPOs. Electron backscatter diffraction (EBSD) mapping and transmission electron microscopy (TEM) observations revealed that most subgrain boundaries in olivine consist of dislocations with a (001)[100] slip system. The subgrain boundaries in olivine may have resulted from the deformation of olivine with moderate water content. In addition, TEM observations using a thickness-fringe method showed that the free dislocations of olivine with the (010)[100] slip system were dominant in the peridotites. Our data suggest that the subgrain boundaries and free dislocations in olivine represent a product of later-stage deformation associated with the exhumation process. EBSD mapping of the tremolite-rich layer revealed intracrystalline plasticity in amphibole, which can be interpreted as the activation of the (100)[001] slip system.

Synthesis of New-structured PbTiO3 Nanowires With Reversible Bending Properties

2014 ◽  
Vol 67 (5) ◽  
pp. 790
Author(s):  
Jiang Wang ◽  
Jian Li ◽  
Youwen Wang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Backscatter Diffraction ◽  
X Ray Diffraction ◽  
Acicular Crystal ◽  
One Dimensional ◽  
X Ray ◽  
Transmission Electron ◽  
Bending Process ◽  
Backscatter Diffraction

One-dimensional PbTiO3 nanowires 40–500 nm in diameter and ~400 μm in length were synthesized via a hydrothermal strategy and characterized by X-ray diffraction, electron backscatter diffraction, scanning electron microscopy, and transmission electron microscopy. The results show that the PbTiO3 nanowires exhibit a new acicular crystal structure, which is a tetragonal superstructure composed of a large unit cell of 40 atoms (Pb : Ti : O = 1 : 1 : 3) with a = 12.35 Å, c = 3.83 Å. The PbTiO3 has a feature of unidirectional bending when observed through transmission electron microscopy several times. The bending can be controlled by the electron beam intensity in transmission electron microscopy and the bending process is reversible. Moreover, a possible mechanism for the bending behaviour was also studied, which indicates that macroscopic polarization is in the {110} plane and the direction is not consistent with the electric field, giving the possible driving force for the bending.

scholarly journals Texture and Microtexture of Pure (6N) and Commercially Pure Aluminum after Deformation by Extrusion with Forward-Backward Rotating Die (Kobo)

2016 ◽  
Vol 61 (1) ◽  
pp. 461-468 ◽  
Author(s):  
M. Bieda ◽  
S. Boczkal ◽  
P. Koprowski ◽  
K. Sztwiertnia ◽  
K. Pieła
Keyword(s):  
Electron Microscopy ◽  
Grain Size ◽  
Electron Backscatter Diffraction ◽  
Pure Aluminum ◽  
Pure Aluminium ◽  
Commercially Pure ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Crystallographic Orientations

Pure aluminium (6N) and commercially pure aluminium (99.7) was deformed by KOBO method. Microstructure and texture of both materials after deformation was analyzed by means of scanning and transmission electron microscopy. Advanced methods of crystallographic orientations measurements like Electron Backscatter Diffraction - EBSD (SEM) and microdiffraction (TEM) was used. Grain size distribution and misorientation between grains in cross and longitudinal sections of the samples were analyzed. Differences in size and homogeneity of the grains were observed in both materials. Pure aluminium was characterized by larger grain size in both sections of extruded material. Whereas commercially pure aluminium reveals smaller grain size and more homogeneous and stable microstructure.

Sign in / Sign up

Export Citation Format

Share Document