Relative x-ray collection efficiency, spatial resolution, and spectral resolution of spherically-bent quartz, mica, germanium, and pyrolytic graphite crystals

Author(s):  
T. Ao ◽  
E.C. Harding ◽  
J.E. Bailey ◽  
G. Loisel ◽  
S. Patel ◽  
...  
Author(s):  
J. R. Michael

X-ray microanalysis in the analytical electron microscope (AEM) refers to a technique by which chemical composition can be determined on spatial scales of less than 10 nm. There are many factors that influence the quality of x-ray microanalysis. The minimum probe size with sufficient current for microanalysis that can be generated determines the ultimate spatial resolution of each individual microanalysis. However, it is also necessary to collect efficiently the x-rays generated. Modern high brightness field emission gun equipped AEMs can now generate probes that are less than 1 nm in diameter with high probe currents. Improving the x-ray collection solid angle of the solid state energy dispersive spectrometer (EDS) results in more efficient collection of x-ray generated by the interaction of the electron probe with the specimen, thus reducing the minimum detectability limit. The combination of decreased interaction volume due to smaller electron probe size and the increased collection efficiency due to larger solid angle of x-ray collection should enhance our ability to study interfacial segregation.


1998 ◽  
Vol 4 (S2) ◽  
pp. 136-137
Author(s):  
M. Watanabe ◽  
D. B. Williams

Since the first demonstration by Cosslett and Duncumb, X-ray mapping by an electron probe microanalyzer (EPMA) has become a most popular approach in microanalysis because elemental distributions of constituents in a bulk sample can be displayed visually. The major disadvantage of EPMA mapping is poor spatial resolution (∼ 1 μm). The spatial resolution of X-ray microanalysis can be improved to a few nanometers using electron transparent thin-specimens in the analytical electron microscope (AEM). However, X-ray count rates from thin specimens are strictly limited because of the improved spatial resolution (i.e. smaller interaction volume) and the poor collection efficiency of X-ray. To obtain reasonable counts for accurate quantification in the AEM, extraordinarily long mapping times are required. Therefore, quantitative X-ray mapping is rarely attempted in the AEM. However, these limitations can be overcome by use of intermediate-volt age instruments combined with field-emission guns to increase the beam current-density, careful stage design to maximize the X-ray collection efficiency and the peak-to-background ratio, and ultrahigh vacuum system to reduce contamination.


2006 ◽  
Vol 14 (10) ◽  
pp. 4570 ◽  
Author(s):  
H. Legall ◽  
H. Stiel ◽  
V. Arkadiev ◽  
A. A. Bjeoumikhov

2006 ◽  
Vol 24 (3) ◽  
pp. 335-345 ◽  
Author(s):  
M. SCHOLLMEIER ◽  
G. RODRÍGUEZ PRIETO ◽  
F.B. ROSMEJ ◽  
G. SCHAUMANN ◽  
A. BLAZEVIC ◽  
...  

The chlorine Heαradiation of polyvinyl chloride (PVC) was investigated with respect to X-ray scattering experiments on dense plasmas. The X-ray source was a laser-produced plasma that was observed with a highly reflective highly oriented pyrolytic graphite (HOPG) crystal spectrometer as it is used in current x-ray scattering experiments on dense plasmas. The underlying dielectronic satellites of Heαcannot be resolved, therefore the plasma was observed at the same time with a focusing spectrometer with spatial resolution. To reconstruct the spectrum a simple model to calculate the spectral line emission based on dielectronic recombination and inner shell excitation of helium- and lithium-like ions was used. The analysis shows that chlorine dielectronic satellite emission is intense compared to Heαin laser-produced chlorine plasmas with a temperature of 300 eV in this wavelength range of Δλ = 0.07 Å (ΔE= 43 eV). The method proposed in this paper allows deducing experimentally the role of the underlying dielectronic satellites in the scatter spectrum measured with a HOPG crystal spectrometer. It is shown that the dielectronic satellites can be neglected when the scattering is measured with low spectral resolution in the non-collective regime. They are of major importance in the collective scatter regime where a high spectral resolution is necessary.


1998 ◽  
Vol 188 ◽  
pp. 341-342
Author(s):  
E. Poretti ◽  
S. Campana ◽  
O. Citterio ◽  
P. Conconi ◽  
M. Ghigo ◽  
...  

The Joint European X-ray Telescope (JET-X) is one of the core scientific instruments of the SPECTRUM RONTGEN-γ astrophysics mission. The project is a collaboration of British, Italian and Russian consortia, with the participation of the Max Planck Institut (Germany). JET-X was designed to study the emission from X-ray sources in the band of 0.3-10 keV. Citterio et al. (1996 and references therein) describe its structure, composed by two identical and coaligned Wolter I telescopes. Focal plane imaging is provided by cooled X-ray sensitive CCD detectors which combine high spatial resolution with good spectral resolution, including coverage of the iron line complex around 7 keV at a resolution of ΔE/E ~ 2%.


2017 ◽  
Vol 78 (2) ◽  
pp. 20702 ◽  
Author(s):  
Karine Le Guen ◽  
Rabah Benbalagh ◽  
Jean-Michel André ◽  
Jean-René Coudevylle ◽  
Philippe Jonnard

An etched multilayer, a 2D structure fabricated by etching a periodic multilayer according to the pattern of a laminar grating, is applied in the soft X-ray range to improve the spectral resolution of wavelength dispersive spectrometers. The present article gathers all the successive stages of the development of such a device optimized to analyze the characteristic emission of light elements: design, structural and optical characterization and applications to X-ray spectroscopy. The evolution of the shape of the C Kα emission band of highly oriented pyrolytic graphite (HOPG), as a function of the angle between the emission direction and the (0 0 0 1) planes, is measured. These results, compared to those with a grating, demonstrate that the achieved spectral resolution enables disentangling σ → 1s and π → 1s transitions within the C K emission band.


1974 ◽  
Vol 57 ◽  
pp. 489-490
Author(s):  
R. M. MacQueen

The Skylab Apollo Telescope Mount contains six principal instruments spanning the X-ray to visible wavelength range. These experiments include an externally occulted white light coronagraph from the High Altitude Observatory which observes the outer solar corona from 1.5 to 6.0 radii from Sun center, in broadband (3500–7000 Å) white light with approximately 10″ spatial resolution. An X-ray spectrographic telescope of the American Science and Engineering, Inc. employs six filters and an objective grating to observe a 48′ field of view in the wavelength range 3.5–6.0 Å, with approximately 3″ spatial resolution. A scanning ultraviolet polychromator, spectroheliometer of the Harvard College Observatory is capable of observing 1.2 Å spectral resolution from 300–1350 Å with a 7 detector array. The field of view of the instrument is determined by its operational mode and ranges from 5′ × 5′ to 5″ × 5″. An X-ray telescope from the Marshall Space Flight Center employs five metal filters to observe the 5–33 Å spectral region with 2.5″ spatial resolution over the 40′ field of view. The Naval Research Laboratory has supplied two instruments: the first, an XUV spectroheliograph, covers wavelength regions 150–335 Å and 321–625 Å, with somewhat better than 5″ spatial resolution and a spectral resolution of 0.13 Å (for a 10″ feature). The second instrument, a slit spectrograph, covers the spectral range 970–3940 Å in two bands, 970–1970 and 1940–3940, and has 0.5 and 0.1 Å spectral resolution respectively, with a 2″ × 60″ slit. Additionally, these principal experiments are supported by two Hα telescopes and a broadband (150–600 Å) ultraviolet monitor for astronaut use. All experiments except that of the Harvard College Observatory (which utilizes photoelectric detectors) employ film to be recovered and installed during astronaut extravehicular activity. Operating in concert in a joint observing program designed to obtain observations of certain solar phenomena, the experiments have now completed more than two months of manned operation and, in the case of the AS&E, HCO and HAO instruments, approximately two additional months of unmanned operations. Representative preliminary results are outlined from several of the experiments below.


2021 ◽  
Vol 7 (1) ◽  
pp. 1
Author(s):  
Veronica De Leo ◽  
Alessandro Scordo ◽  
Catalina Curceanu ◽  
Marco Miliucci ◽  
Florin Sirghi

The VOXES collaboration at INFN National Laboratories of Frascati developed a prototype of a high resolution Von Hamos X-ray spectrometer using HAPG (Highly Annealed Pyrolytic Graphite) mosaic crystals. This technology allows the employment of extended isotropic sources and could find application in several physics fields. The capability of the spectrometer to reach energy precision and resolution below 1 and 10 eV, respectively, when used with wide sources, has been already demonstrated. Recently, the response of this device, for a ρ = 206.7 mm cylindrically bent HAPG crystal using CuKα1,2 and FeKα1,2 XRF lines, has been investigated in terms of reflection efficiency by a dedicated ray-tracing simulation. Details of the simulation procedure and the comparison with the experimental results are presented. This study is crucial in order to retrieve information on the spectrometer signal collection efficiency, especially in the energy range in which the standard calibration procedures cannot be applied.


1988 ◽  
Vol 102 ◽  
pp. 339-342
Author(s):  
J.M. Laming ◽  
J.D. Silver ◽  
R. Barnsley ◽  
J. Dunn ◽  
K.D. Evans ◽  
...  

AbstractNew observations of x-ray spectra from foil-excited heavy ion beams are reported. By observing the target in a direction along the beam axis, an improvement in spectral resolution, δλ/λ, by about a factor of two is achieved, due to the reduced Doppler broadening in this geometry.


Author(s):  
R. Hutchings ◽  
I.P. Jones ◽  
M.H. Loretto ◽  
R.E. Smallman

There is increasing interest in X-ray microanalysis of thin specimens and the present paper attempts to define some of the factors which govern the spatial resolution of this type of microanalysis. One of these factors is the spreading of the electron probe as it is transmitted through the specimen. There will always be some beam-spreading with small electron probes, because of the inevitable beam divergence associated with small, high current probes; a lower limit to the spatial resolution is thus 2αst where 2αs is the beam divergence and t the specimen thickness.In addition there will of course be beam spreading caused by elastic and inelastic interaction between the electron beam and the specimen. The angle through which electrons are scattered by the various scattering processes can vary from zero to 180° and it is clearly a very complex calculation to determine the effective size of the beam as it propagates through the specimen.


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