Correction factors to strength of thin silicon die in three- and four-point bending tests due to nonlinear effects
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2006 ◽
Vol 309-311
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pp. 1191-1194
2020 ◽
pp. 391-411
2005 ◽
Vol 290
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pp. 336-339
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1998 ◽
Vol 201
(22)
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pp. 3057-3065
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2019 ◽
Vol 53
(28-30)
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pp. 4137-4148
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2019 ◽
Vol 211
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pp. 371-381
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2010 ◽
Vol 168-170
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pp. 1325-1329
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1999 ◽
Vol 8
(1)
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pp. 096369359900800
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