Fatigue analysis and experiment of leaf-spring pivots for high precision flexural static balancing instruments

2019 ◽  
Vol 55 ◽  
pp. 408-416 ◽  
Author(s):  
Shusheng Bi ◽  
Yongzhen Li ◽  
Hongzhe Zhao
2016 ◽  
Vol 30 (7) ◽  
pp. 3061-3067 ◽  
Author(s):  
Liang Duan ◽  
Chuanxue Song ◽  
Shukai Yang ◽  
Shiqi Fan ◽  
Bingwu Lu

2018 ◽  
Vol 7 (1) ◽  
pp. 66-69
Author(s):  
Chatwant Singh Pandher . ◽  
Gurinder Singh Brar ◽  
Tejeet Singh

Different fields of mechanical, automobile, aerospace, electronics and communication engineering uses composite material. The automobile industries have shown great interest to change traditional use of steel leaf spring with light weight composite leaf spring with same strength. This research paper presents the general study, fabrication, static and fatigue analysis on carbon epoxy composite leaf spring. A rear leaf spring of Tata Ace (mini truck) made of material EN45 spring steel was selected as practical application. Hand Lay-up technique was used to make a carbon epoxy leaf spring. A single carbon epoxy composite leaf spring is compared with EN45 steel leaf spring. Static test was performed on both steel spring and composite spring from initial load of 1000 N to full load of 5400 N. Results shows that deflection of carbon epoxy composite leaf spring is 14% less as compared to the steel leaf spring which means increase in stiffness. Also fatigue life of composite leaf spring is more than desire 100000 cycles.


2018 ◽  
Vol 8 (9) ◽  
pp. 1476 ◽  
Author(s):  
Rui-Jun Li ◽  
Peng-Yu Wang ◽  
Dan-Dong Li ◽  
Kuang-Chao Fan ◽  
Fang-Fang Liu ◽  
...  

Patterned leaf springs made of a beryllium bronze sheet are the key components of certain micro/nano contact probes. The accuracy of the probe is determined based on the precision of the formed pattern. However, a traditional manufacturing method using wire-electrode discharge machining (wire-EDM) is subject to poor tolerance at the sharp edges and corners. In addition, high energy consumption and costs are incurred for complex patterns. This paper presents a new chemical etching method for the manufacturing of a patterned leaf spring with high precision. Both the principle and process are introduced. Taguchi experiments were designed and conducted and the optimal process parameters were obtained based on the mean value and a variance analysis. Four V-shaped and some other complex patterned leaf springs were successfully fabricated. Comparison experiments concerning the characteristic parameters of the leaf spring were also conducted. The experimental results reveal that the patterned leaf springs manufactured through this method are much better than those achieved using wire-EDM. This manufacturing method can be used to fabricate different high-precision patterned leaf springs or membranes for coordinate measuring machines (CMM) probes and other measuring equipment.


Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.


Author(s):  
K. Z. Botros ◽  
S. S. Sheinin

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.


Author(s):  
Klaus-Ruediger Peters

Differential hysteresis processing is a new image processing technology that provides a tool for the display of image data information at any level of differential contrast resolution. This includes the maximum contrast resolution of the acquisition system which may be 1,000-times higher than that of the visual system (16 bit versus 6 bit). All microscopes acquire high precision contrasts at a level of <0.01-25% of the acquisition range in 16-bit - 8-bit data, but these contrasts are mostly invisible or only partially visible even in conventionally enhanced images. The processing principle of the differential hysteresis tool is based on hysteresis properties of intensity variations within an image.Differential hysteresis image processing moves a cursor of selected intensity range (hysteresis range) along lines through the image data reading each successive pixel intensity. The midpoint of the cursor provides the output data. If the intensity value of the following pixel falls outside of the actual cursor endpoint values, then the cursor follows the data either with its top or with its bottom, but if the pixels' intensity value falls within the cursor range, then the cursor maintains its intensity value.


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