Characterization of unintentionally or lightly doped polysilicon films by improved Hall effect measurements
1997 ◽
Vol 301
(1-2)
◽
pp. 230-235
◽
Keyword(s):
Keyword(s):
2003 ◽
Vol 356-357
◽
pp. 575-578
◽
Hall Factor Calculation for the Characterization of Transport Properties in N-Channel 4H-SiC MOSFETs
2014 ◽
Vol 778-780
◽
pp. 483-486
◽
Keyword(s):