In-situ thin film growth/etch measurement and control by laser light reflectance analysis
1999 ◽
Vol 150
(1-4)
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pp. 95-100
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Keyword(s):
2018 ◽
Vol 89
(12)
◽
pp. 123702
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Keyword(s):
Keyword(s):
Keyword(s):
2011 ◽
pp. 180-211
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Keyword(s):
Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
◽
Keyword(s):
2002 ◽
Vol 62
(4)
◽
pp. 1251-1280
◽
Keyword(s):