X-ray diffraction analysis of aluminum nitride sintered with cubic boron nitride

1997 ◽  
Vol 6 (8) ◽  
pp. 927-930 ◽  
Author(s):  
N.P. Bezhenar ◽  
S.A. Bozhko ◽  
N.N. Belyavina ◽  
V.Ya. Markiv
Keyword(s):  
Boron Nitride ◽  
Aluminum Nitride ◽  
Diffraction Analysis ◽  
Cubic Boron Nitride ◽  
X Ray Diffraction ◽  
X Ray

Effects of CaB2O4 Content on the Sintering Behavior of Hexagonal Boron Nitride

2011 ◽  
Vol 675-677 ◽  
pp. 131-134
Author(s):  
Yu Xia Cao ◽  
Ling Zhong Du ◽  
Wei Gang Zhang
Keyword(s):  
Boron Nitride ◽  
Diffraction Analysis ◽  
Apparent Density ◽  
Cross Sections ◽  
Hexagonal Boron Nitride ◽  
Sintering Behavior ◽  
Rockwell Hardness ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grain Sizes

CaB2O4 was added into hexagonal boron nitride (hBN) to improve the sintering behaviors of hBN. CaB2O4 and hBN were mixed and then pressed into plates. The plates were sintered at 2000°C for 5h under a N2 ambience. The phase compositions with different CaB2O4 contents were examined with X-ray diffraction analysis. The fracture cross-sections of the hBN plates were investigated by SEM. The apparent density and Rockwell hardness were also measured. The results show that the hBN particles had a plate-like shape and the grain sizes of hBN increased with increasing CaB2O4 contents. The apparent density and Rockwell hardness decreased with increasing CaB2O4 contents. When the CaB2O4 content was 15(wt) %, the hBN has the average grain sizes of 3μm in diameter and 200nm in thickness, the apparent density of 1.06 g/cm3 and the Rockwell hardness of 3, respectively.

Fundamental Technology and Properties Research of Brazing CBN Grinding Wheels

2010 ◽  
Vol 154-155 ◽  
pp. 209-213
Author(s):  
Qian Wang
Keyword(s):  
Boron Nitride ◽  
Cubic Boron Nitride ◽  
Vacuum Furnace ◽  
Ti Alloy ◽  
X Ray Diffraction ◽  
Grinding Wheels ◽  
X Ray ◽  
Active Filler ◽  
New Generation

In order to produce new generation monolayer brazing CBN(cubic boron nitride) grinding wheels, an active filler alloys(Ag-Cu-Ti) were tested in vacuum furnace. The results show that Ag-Cu-Ti alloy exhibits good wetting and bonding toward as CBN grits. SEMEDS microanalyses have shown that during brazing Ti in Ag-Cu-Ti alloy segregated preferentially to the surface of the CBN to form a Ti-rich reaction produce. X-ray diffraction reveals that the wetting and bonding behaviour on CBN surface by Ag-Cu-Ti alloy melt is realized through TiN and TiB2 which is produced by interaction between Ti atoms of Ag-Cu-Ti alloy and N or B atoms of CBN surface.

Powder X-ray Diffraction Electron Density of Cubic Boron Nitride

2015 ◽  
Vol 119 (11) ◽  
pp. 6164-6173 ◽  
Author(s):  
Nanna Wahlberg ◽  
Niels Bindzus ◽  
Lasse Bjerg ◽  
Jacob Becker ◽  
Sebastian Christensen ◽  
...  
Keyword(s):  
Boron Nitride ◽  
Electron Density ◽  
Cubic Boron Nitride ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Electron

Microstructural studies of boron nitride films deposited by microwave plasma-assisted chemical vapor deposition by using trimethyl borazine precursor

1999 ◽  
Vol 14 (3) ◽  
pp. 829-833 ◽  
Author(s):  
A. Ratna Phani
Keyword(s):  
Boron Nitride ◽  
Microwave Plasma ◽  
Cubic Boron Nitride ◽  
Chemical Vapor ◽  
Interplanar Distance ◽  
Stoichiometric Ratio ◽  
X Ray Diffraction ◽  
X Ray ◽  
Different Temperatures ◽  
Deposited Films

Thin films of cubic boron nitride (c-BN) were synthesized using an organometallic precursor trimethylborazine (TMB) which contains both boron and nitrogen in 1 : 1 stoichiometric ratio. The films were deposited at different temperatures ranging from 300 to 500 °C at a pressure of 2 Torr and at 360 W microwave power, using N2 as carrier gas. The deposited films were characterized by Fourier transform infrared spectroscopy (FTIR), x-ray diffraction (XRD), and scanning electron microscopy (SEM), which reveal the presence of amorphous BN and crystalline c-BN in varying proportions. The x-ray diffraction pattern of the deposited films showed a strongest peak at 2θ = 57.1° where the interplanar distance value, d = 2.06 Å, agreed well with the (111) crystallographic orientation of c-BN phase.

Synthesis and Decomposition of Ti3SiC2 under 1-5GPa at 1400°C

2014 ◽  
Vol 602-603 ◽  
pp. 499-502 ◽  
Author(s):  
Yuan Yuan Zhu ◽  
Shang Sheng Li ◽  
Liang Li ◽  
Ai Guo Zhou
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Pressure ◽  
Phase Transformation ◽  
Boron Nitride ◽  
Cubic Boron Nitride ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ternary Carbide ◽  
Scanning Electron

Ternary carbide Ti3SiC2 is a good binder to make superhard composites with diamonds or cubic boron nitride. Superhard composites are normally made at high temperature and under high pressure around 5 GPa to avoid the phase transformation of diamonds or cubic boron nitride. This paper researched the synthesis of Ti3SiC2 from the powders of Ti, Si, and graphite by a cubic presser under 1 GPa to 4 GPa at 1400°C. The decomposition of Ti3SiC2 under 5GPa at 1400°C was also researched. From X-ray diffraction (XRD) and scanning electron microscopy (SEM) results, Ti3SiC2 was synthesized in 30 min under 1 GPa at 1400°C. The impurities were TiSi2, Ti5Si3Cx, and TiC. As the pressure increased from 1GPa to 4GPa, less Ti3SiC2 more TiSi2 was synthesized. Therefore, high presser > 1GPa is unfavorable for the synthesis of Ti3SiC2. After treated under 5GPa at 1400°C, pure Ti3SiC2 was decomposed.

X-Ray Diffraction Study of Cubic Boron Nitride Grown Epitaxially on Silicon

1990 ◽  
Vol 202 ◽  
Author(s):  
G. L. Doll ◽  
J. A. Sell ◽  
A. Wims ◽  
C. A. Taylor ◽  
R. Clarke
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Boron Nitride ◽  
Cubic Boron Nitride ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Matching ◽  
Excimer Laser Ablation ◽  
Transmission Electron ◽  
Boron Nitride Films

ABSTRACTWe report the growth of boron nitride films on (001), (110), and (111) faces of silicon using the method of pulsed excimer laser ablation. The structure of the Alms grown on the (001) and (110) orientations of Si is cubic zincblende with a lattice constant of 3.619 Å. The films were found to be heteroepitaxial on silicon (001) with the cubic BN (100) axes parallel to Si (100), as characterized by x-ray diffraction and high-resolution transmission electron microscopy. In that system, we find evidence for an unusual 3:2 commensurate lattice matching. The films appear to cubic but randomly oriented on the Si (110), and no evidence for crystallinity is found for films grown on Si (111).

Stress analysis in cubic boron nitride films by x-ray diffraction using sin 2 ψ method

1998 ◽  
Vol 7 (1) ◽  
pp. 61-67 ◽  
Author(s):  
Zhang Xing-wang ◽  
Yue Jin-shun ◽  
Chen Guang-hua ◽  
Yan Hui ◽  
Liu Wen-jun
Keyword(s):  
Boron Nitride ◽  
Stress Analysis ◽  
Cubic Boron Nitride ◽  
X Ray Diffraction ◽  
X Ray ◽  
Boron Nitride Films

High Pressure and High Temperature Sintered PcBN Using Al, B4C and C as Sintering Additive

2016 ◽  
Vol 697 ◽  
pp. 521-525 ◽  
Author(s):  
Yao Ma ◽  
Jian Li ◽  
Hai Long Wang ◽  
Rui Zhang
Keyword(s):  
High Pressure ◽  
High Temperature ◽  
Boron Nitride ◽  
Cubic Boron Nitride ◽  
High Strength ◽  
X Ray Diffraction ◽  
X Ray ◽  
Polycrystalline Cubic Boron Nitride ◽  
Starting Mixture ◽  
Sintering Additive

Polycrystalline cubic boron nitride (PcBN) composites were sintered by high pressure and high temperature sintering (HPHT) at 1450 °C for 3 min under a pressure of 5.0 GPa. Aluminium,boron carbide and carbon in the starting mixture reacts with cubic boron nitride (cBN) to form Al3BC3 and AlN bonding among cBN grains during sintering. X-ray diffraction (XRD) and Scanning electron microscope (SEM) were used to analyze phases and micro-structure of the sintered samples. The dense structure of super hard cBN grains bonded together with Al3BC3 and AlN offers superior hardness and high strength. The Vickers hardness of PcBN composites was 45±5 GPa, and the strength of PcBN composites was 345±15 MPa.

Sign in / Sign up

Export Citation Format

Share Document