Growth behavior of electroless copper on silicon substrate

Author(s):  
Shin-Shyan Wu ◽  
Wei-Long Liu ◽  
Ting-Kan Tsai ◽  
Shu-Huei Hsieh ◽  
Wen-Jauh Chen
2007 ◽  
Vol 253 (8) ◽  
pp. 3843-3848 ◽  
Author(s):  
W.L. Liu ◽  
W.J. Chen ◽  
T.K. Tsai ◽  
S.H. Hsieh ◽  
S.Y. Chang

2019 ◽  
Vol 28 (6) ◽  
pp. 066802
Author(s):  
Jing-Yuan Yan ◽  
Yong-Wei Wang ◽  
Yong-Ming Guo ◽  
Wei Zhang ◽  
Cong Wang ◽  
...  

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Jin-Tak Jeong ◽  
Mun-Ki Choi ◽  
Yumin Sim ◽  
Jung-Taek Lim ◽  
Gil-Sung Kim ◽  
...  

Author(s):  
S. Cao ◽  
A. J. Pedraza ◽  
L. F. Allard

Excimer-laser irradiation strongly modifies the near-surface region of aluminum nitride (AIN) substrates. The surface acquires a distinctive metallic appearance and the electrical resistivity of the near-surface region drastically decreases after laser irradiation. These results indicate that Al forms at the surface as a result of the decomposition of the Al (which has been confirmed by XPS). A computer model that incorporates two opposing phenomena, decomposition of the AIN that leaves a metallic Al film on the surface, and thermal evaporation of the Al, demonstrated that saturation of film thickness and, hence, of electrical resistance is reached when the rate of Al evaporation equals the rate of AIN decomposition. In an electroless copper bath, Cu is only deposited in laser-irradiated areas. This laser effect has been designated laser activation for electroless deposition. Laser activation eliminates the need of seeding for nucleating the initial layer of electroless Cu. Thus, AIN metallization can be achieved by laser patterning followed by electroless deposition.


2002 ◽  
Vol 716 ◽  
Author(s):  
Seok Woo Hong ◽  
Yong Sun Lee ◽  
Ki-Chul Park ◽  
Jong-Wan Park

AbstractThe effect of microstructure of dc magnetron sputtered TiN and TaN diffusion barriers on the palladium activation for autocatalytic electroless copper deposition has been investigated by using X-ray diffraction, sheet resistance measurement, field emission scanning electron microscopy (FE-SEM) and plan view transmission electron microscopy (TEM). The density of palladium nuclei on TaN diffusion barrier increases as the grain size of TaN films decreases, which was caused by increasing nitrogen content in TaN films. Plan view TEM results of TiN and TaN diffusiton barriers showed that palladium nuclei formed mainly on the grain boundaries of the diffusion barriers.


2014 ◽  
Vol E97.C (7) ◽  
pp. 677-682
Author(s):  
Sung YUN WOO ◽  
Young JUN YOON ◽  
Jae HWA SEO ◽  
Gwan MIN YOO ◽  
Seongjae CHO ◽  
...  

2014 ◽  
Vol 2 (1) ◽  
pp. 20-23
Author(s):  
Jaskiran Kaur ◽  
◽  
Surinder Singh ◽  

Alloy Digest ◽  
1984 ◽  
Vol 33 (1) ◽  

Abstract INDALLOY 160-190 is a bismth-base low-melting alloy that melts through th temperature range 160-190 F. It shrinks immediately upon solidification, grows back to zero in about one hour and then shows additional growth. This shrinkage-growth behavior makes it an ideal alloy for proof casting and precision measurement of internal dimensions. This alloy originally was developed for use by children for casting soldiers and other small objects. It performs best among the low-melting alloys for spraying in the spray forming of masks and molds and in metallizing. This datasheet provides information on composition, physical properties, hardness, and tensile properties. It also includes information on casting, heat treating, machining, and joining. Filing Code: Bi-34. Producer or source: Indium Corporation of America.


Author(s):  
J.G. van Hassel ◽  
Xiao-Mei Zhang

Abstract Failures induced in the silicon substrate by process marginalities or process mistakes need continuous attention in new as well as established technologies. Several case studies showing implant related defects and dislocations in silicon will be discussed. Depending on the electrical characteristics of the failure the localization method has to be chosen. The emphasis of the discussion will be on the importance of the right choice for further physical de-processing to reveal the defect. This paper focuses on the localization method, the de- processing technique and the use of Wright etch for subsequent TEM preparation.


Author(s):  
Younan Hua ◽  
Bingsheng Khoo ◽  
Henry Leong ◽  
Yixin Chen ◽  
Eason Chan ◽  
...  

Abstract In wafer fabrication, a silicon nitride (Si3N4) layer is widely used as passivation layer. To qualify the passivation layers, traditionally chemical recipe PAE (H3PO4+ HNO3) is used to conduct passivation pinhole test. However, it is very challenging for us to identify any pinholes in the Si3N4 layer with different layers underneath. For example, in this study, the wafer surface is Si3N4 layer and the underneath layer is silicon substrate. The traditional receipt of PAE cannot be used for passivation qualification. In this paper, we will report a new recipe using KOH solution to identify the pinhole in the Si3N4 passivation layer.


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