“Interpretation of Micrographs from a Scanning Electron Microscope”
1969 ◽
Vol 27
◽
pp. 22-23
Keyword(s):
The Past
◽
In the past two years, there has been a great increase in interest in the scanning electron microscope as a research tool. Coupled with this has been a large increase in the number of instruments being used throughout the world. The reasons for this popularity stems from the unique abilities of this form of in strumentation which include: (a) a large depth of field which allows one to view a very rough surface; (b) a minimal requirement of specimen preparation; and (c) its ability to make use of voltage contrast in the study of semiconductors.
1969 ◽
Vol 27
◽
pp. 20-21
1989 ◽
Vol 47
◽
pp. 74-75
1990 ◽
Vol 48
(1)
◽
pp. 414-415
1975 ◽
pp. 211-262
◽
Keyword(s):
2020 ◽
Vol 1
(3)
◽
pp. 52-55
2009 ◽
Vol 69
(4)
◽
pp. 1059-1071
◽
Keyword(s):