A Combined Conventional and Scanning Electron Microscope
1969 ◽
Vol 27
◽
pp. 84-85
Keyword(s):
In electron optical instrumentation, it would be generally desirable to have a lens with a short focal length. Both spherical and chromatical aberration decreases with focal length and this will result in a better resolution and image brightness. This consideration has been taken into account in the design of conventional electron microscopes, and the focal length of the objective lens of such instrumentation ranges from a few millimeters to a fraction of a millimeter. A short focal length lens requires that the specimen be located in a magnetic field i.e., within the pole piece gap. This results in (a) a limitation in the size of the specimen and (b) a restriction, to use the microscope to nonmagnetic specimens only.
1971 ◽
Vol 29
◽
pp. 14-15
1974 ◽
Vol 32
◽
pp. 422-423
1971 ◽
Vol 29
◽
pp. 22-23
Keyword(s):
1983 ◽
Vol 41
◽
pp. 412-413
1990 ◽
Vol 48
(1)
◽
pp. 382-383
1971 ◽
Vol 29
◽
pp. 26-27
1970 ◽
Vol 28
◽
pp. 386-387
1981 ◽
Vol 39
◽
pp. 320-321
1989 ◽
Vol 47
◽
pp. 74-75
1990 ◽
Vol 48
(1)
◽
pp. 404-405