SEM of polymer materials

1987 ◽  
Vol 45 ◽  
pp. 426-429
Author(s):  
Linda C. Sawyer
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Beam ◽  
Essential Feature ◽  
Three Dimensional ◽  
Image Formation ◽  
Sem Analysis ◽  
Polymer Materials ◽  
Specimen Preparation ◽  
Scanning Electron

Scanning electron microscopy (SEM) has become an analytical tool widely used in universities, industrial laboratories and modern plants in applications ranging from fundamental research and applied research to quality control. The SEM provides important and insightful observations, in the form of three dimensional images of bulk materials and surfaces, which provide input to conduct process-structure-properties studies of polymer materials. SEM analysis requires knowledge of the instruments, image formation and specimen preparation methods.Consideration must be given to the interaction of the electron beam with the specimen, image formation and the effect of the electron beam on the specimen, e.g. beam damage. Scanning electron microscopy has been described and SEM of polymers has been reviewed. The essential feature of a scanning microscope is that the image is formed point by point, by scanning a probe across the specimen. The probe of an SEM is a focused electron beam and a detected signal is displayed as a TV type image.

Three Dimensional Imaging of Light Metals Using Serial Block Face Scanning Electron Microscopy (SBFSEM)

2013 ◽  
Vol 765 ◽  
pp. 501-505 ◽  
Author(s):  
Teruo Hashimoto ◽  
George E. Thompson ◽  
Michele Curioni ◽  
Xiao Rong Zhou ◽  
Peter Skeldon
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Low Voltage ◽  
Three Dimensional ◽  
Specimen Preparation ◽  
Light Metals ◽  
Metallic Materials ◽  
Block Face ◽  
Scanning Electron

Ultramicrotomy is used extensively as a specimen preparation method for transmission electron microscopy (TEM) in the biological and polymer fields, where relatively soft materials are sectioned to generate electron transparent specimens. Additionally, in corrosion control studies of light metals, e.g. aluminium and magnesium and their alloys, ultramictrotomy has been progressed at Manchester for characterisation of the metallic materials and their filming behaviour as well as the propagation of corrosion into the material interior at selected sites. The benefits of ultramicrotomy include the ability to generate uniform thicknesses of multiphase specimens with relatively large observation areas that include, for example, randomly distributed intermetallic particles in the alloy. However, mechanical sectioning with a diamond knife generates artefacts that include chattering and local damage; localised corrosion of the thin slices may also result from their residence on a water bath at the rear of the knife prior to collection for TEM study. Recently, ultramicrotomy has also been utilised to assist high resolution imaging in the scanning electron microscope (SEM); the generation of relatively flat specimens removes roughness effects from the secondary electron signal and improves the backscattered electron yield due to removal of an oxidised or carbon contaminated surface. The combination of ultramicrotomy and low voltage scanning electron microscopy has also enabled generation of high resolution, three dimensional images using sectioning and subsequent imaging of the fresh surface by SEM. However, importantly, recent instrumental developments, i.e. the GATAN 3View System, now enable ultramicrotomy to be performed in-SEM. Consequently, rapid in-SEM sectioning and imaging can now be undertaken with ready reconstruction of electron tomographs for light metallic materials. Here, the application of the Gatan 3View system in a Quanta 250 FEG-ESEM is presented, with consideration of artefacts introduced by the electron beam for serial block face sectioning imaging of light alloys.

Image simulation in scanning electron microscopy

1993 ◽  
Vol 51 ◽  
pp. 544-545
Author(s):  
Z. J. Radzimski
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Beam ◽  
Single Scattering ◽  
High Energy ◽  
Sem Analysis ◽  
Image Quality Enhancement ◽  
Signal Collection ◽  
Precise Tool ◽  
Scanning Electron

The development of image acquisition and processing software has made microscopy, including scanning electron microscopy (SEM), a very precise tool. Various processing techniques for image quality enhancement and image quantification have been introduced. However, the theoretical bases for SEM analysis are not always fully understood. Using Monte-Carlo (MC) methods several important issues have been successfully addressed, for example, X-ray production and backscattered electron (BSE) simulation. MC methods provide insight into the physical basis of electron beam/solid interactions and offer a wide degree of freedom in setting the simulation conditions regarding sample geometry, the electron beam, and signal collection. The results can be extracted at any stage of electron-target interactions to determine energy, angular and/or spatial distributions. MC programs with a single scattering approach, Mott scattering cross section and corrected Bethe's formula for energy loss can be used for both low and high energy electrons. The simulation can be performed for complicated structures with multi-element phases of various shapes.

Thermal- and acoustic-wave techniques in scanning electron microscopy

1986 ◽  
Vol 64 (9) ◽  
pp. 1238-1246 ◽  
Author(s):  
Ludwig Josef Balk
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Beam ◽  
Acoustic Wave ◽  
Three Dimensional ◽  
Acoustic Microscopy ◽  
Wave Form ◽  
Time Resolved ◽  
In Situ Experiments ◽  
Scanning Electron

Since their introduction in 1980, thermal- and acoustic-wave techniques utilizing electron-beam excitation, denoted in the following as scanning electron acoustic microscopy (SEAM), have developed to include methods in the realm of scanning electron microscopy (SEM), giving additional and important information on material parameters compared with other SEM techniques. However, the SEAM method still has shortcomings, both theoretically and experimentally. New theories have to consider various principal sound-generation mechanisms, especially for semiconductors, ceramics, and ferromagnets. Furthermore, they must include three-dimensional and time-resolved calculations. From experimental evidence there is obviously the need for additional consideration of nonlinear signal generation. The theoretical discussion has to be supported by experiments; both phase analysis of the SEAM signal with respect to the electron-beam wave form and evaluation of the temporal SEAM behaviour are important for revealing information about the specimen. With special detectors, in situ experiments can be carried out for varying process parameters, as shown for the investigation of steel sheets. The SEAM performance has to be compared to other SEM modes by simultaneous experiments, especially for applications to semiconductors. Finally, extension to gigahertz frequencies and use of tomographic methods should increase the importance of SEAM in future.

Model-Based Correction of Image Distortion in Scanning Electron Microscopy

2010 ◽  
Vol 437 ◽  
pp. 40-44 ◽  
Author(s):  
Dominic Gnieser ◽  
Carl Georg Frase ◽  
Harald Bosse ◽  
Rainer Tutsch
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Monte Carlo ◽  
Three Dimensional ◽  
Image Formation ◽  
Image Distortion ◽  
3D Analysis ◽  
Monte Carlo Program ◽  
Simulated Images ◽  
Scanning Electron

A new Monte-Carlo program for simulation image formation in scanning electron microscopy for real three-dimensional use is presented; factors of image distortions are realized in the program, in respect of future photogrammetric evaluation. A first attempt for generating a 3D-analysis of simulated images is shown.

Scanning and Transmission Microscopy of Nematocyst Batteries in Epitheliomuscular Cells of Hydra

1971 ◽  
Vol 29 ◽  
pp. 410-411 ◽  
Author(s):  
Jane A. Westfall ◽  
S. Yamataka ◽  
Paul D. Enos
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Osmium Tetroxide ◽  
External Surface ◽  
Three Dimensional ◽  
Surface Structures ◽  
Transmission Microscopy ◽  
Transmission Electron ◽  
Freeze Dried ◽  
Scanning Electron

Scanning electron microscopy (SEM) provides three dimensional details of external surface structures and supplements ultrastructural information provided by transmission electron microscopy (TEM). Animals composed of watery jellylike tissues such as hydras and other coelenterates have not been considered suitable for SEM studies because of the difficulty in preserving such organisms in a normal state. This study demonstrates 1) the successful use of SEM on such tissue, and 2) the unique arrangement of batteries of nematocysts within large epitheliomuscular cells on tentacles of Hydra littoralis.Whole specimens of Hydra were prepared for SEM (Figs. 1 and 2) by the fix, freeze-dry, coat technique of Small and Màrszalek. The specimens were fixed in osmium tetroxide and mercuric chloride, freeze-dried in vacuo on a prechilled 1 Kg brass block, and coated with gold-palladium. Tissues for TEM (Figs. 3 and 4) were fixed in glutaraldehyde followed by osmium tetroxide. Scanning micrographs were taken on a Cambridge Stereoscan Mark II A microscope at 10 KV and transmission micrographs were taken on an RCA EMU 3G microscope (Fig. 3) or on a Hitachi HU 11B microscope (Fig. 4).

Scanning Electron Microscopy and Electron Microprobe Analysis of Malignant Cell Cultures

1968 ◽  
Vol 26 ◽  
pp. 164-165
Author(s):  
R. I. Johnsson-Hegyeli ◽  
A. F. Hegyeli ◽  
D. K. Landstrom ◽  
W. C. Lane
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Cell Cultures ◽  
Electron Microprobe ◽  
Microprobe Analysis ◽  
Electron Microprobe Analysis ◽  
Three Dimensional ◽  
Malignant Cell ◽  
Interference Microscopy ◽  
Scanning Electron

Last year we reported on the use of reflected light interference microscopy (RLIM) for the direct color photography of the surfaces of living normal and malignant cell cultures without the use of replicas, fixatives, or stains. The surface topography of living cells was found to follow underlying cellular structures such as nuceloli, nuclear membranes, and cytoplasmic organelles, making possible the study of their three-dimensional relationships in time. The technique makes possible the direct examination of cells grown on opaque as well as transparent surfaces. The successful in situ electron microprobe analysis of the elemental composition and distribution within single tissue culture cells was also reported.This paper deals with the parallel and combined use of scanning electron microscopy (SEM) and the two previous techniques in a study of living and fixed cancer cells. All three studies can be carried out consecutively on the same experimental specimens without disturbing the cells or their structural relationships to each other and the surface on which they are grown. KB carcinoma cells were grown on glass coverslips in closed Leighto tubes as previously described. The cultures were photographed alive by means of RLIM, then fixed with a fixative modified from Sabatini, et al (1963).

High Resolution Scanning Electron Microscopy

1991 ◽  
Vol 49 ◽  
pp. 478-479
Author(s):  
David Joy ◽  
James Pawley
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Beam ◽  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Electron Probe ◽  
Impact Point ◽  
Interaction Volume ◽  
Scanning Electron

The scanning electron microscope (SEM) builds up an image by sampling contiguous sub-volumes near the surface of the specimen. A fine electron beam selectively excites each sub-volume and then the intensity of some resulting signal is measured. The spatial resolution of images made using such a process is limited by at least three factors. Two of these determine the size of the interaction volume: the size of the electron probe and the extent to which detectable signal is excited from locations remote from the beam impact point. A third limitation emerges from the fact that the probing beam is composed of a finite number of discrete particles and therefore that the accuracy with which any detectable signal can be measured is limited by Poisson statistics applied to this number (or to the number of events actually detected if this is smaller).

SEM analysis of fish scale cross sections: A technique study

1992 ◽  
Vol 50 (1) ◽  
pp. 744-745
Author(s):  
M.E. Lee ◽  
A. Moller ◽  
P.S.O. Fouche ◽  
I.G Gaigher
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Cross Sections ◽  
Soft Tissues ◽  
Close Association ◽  
Sem Analysis ◽  
Fish Scale ◽  
Fish Scales ◽  
Micro Structures ◽  
Scanning Electron

Scanning electron microscopy of fish scales has facilitated the application of micro-structures to systematics. Electron microscopy studies have added more information on the structure of the scale and the associated cells, many problems still remain unsolved, because of our incomplete knowledge of the process of calcification. One of the main purposes of these studies has been to study the histology, histochemistry, and ultrastructure of both calcified and decalcified scales, and associated cells, and to obtain more information on the mechanism of calcification in the scales. The study of a calcified scale with the electron microscope is complicated by the difficulty in sectioning this material because of the close association of very hard tissue with very soft tissues. Sections often shatter and blemishes are difficult to avoid. Therefore the aim of this study is firstly to develop techniques for the preparation of cross sections of fish scales for scanning electron microscopy and secondly the application of these techniques for the determination of the structures and calcification of fish scales.

Scanning electron microscopy of human iliac bone by a simple preparation method

1990 ◽  
Vol 48 (3) ◽  
pp. 226-227
Author(s):  
Toshihiko Takita ◽  
Tomonori Naguro ◽  
Toshio Kameie ◽  
Akihiro Iino ◽  
Kichizo Yamamoto
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Preparation Method ◽  
Specimen Preparation ◽  
Real Surface ◽  
Public Attention ◽  
Preparation Methods ◽  
The Real ◽  
Simple Preparation ◽  
Scanning Electron

Recently with the increase in advanced age population, the osteoporosis becomes the object of public attention in the field of orthopedics. The surface topography of the bone by scanning electron microscopy (SEM) is one of the most useful means to study the bone metabolism, that is considered to make clear the mechanism of the osteoporosis. Until today many specimen preparation methods for SEM have been reported. They are roughly classified into two; the anorganic preparation and the simple preparation. The former is suitable for observing mineralization, but has the demerit that the real surface of the bone can not be observed and, moreover, the samples prepared by this method are extremely fragile especially in the case of osteoporosis. On the other hand, the latter has the merit that the real information of the bone surface can be obtained, though it is difficult to recognize the functional situation of the bone.

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