35 Years of EDS Software

AbstractThe computerized multichannel analyzer running software specifically designed for X-ray analysis appeared very early in the commercialization of the energy dispersive X-ray spectrometer (EDS) and, like the solid-state X-ray detector itself, was built on a technology foundation originally developed for nuclear spectroscopy. However, software techniques employed for gamma-ray spectra could not accommodate the continuum component of EDS spectra, and a new approach was required. Least-squares fitting with “top-hat” filtered spectra proved to be an effective solution that is still widely used today. Though modern computer technology has subsequently contributed greatly to the speed and convenience of present-day EDS software, it seems that the achievable accuracy and precision of spectrum analysis has not fundamentally improved, and most of the early challenges are still quite relevant, although they may appear in new guises. The availability of the high speed silicon drift detector, however, may provide both the incentive and the data precision to drive future advances. This article traces the formative years of EDS software from the personalized perspective of a participant. Factors that shaped the development of the industry are identified, and future directions are speculated.

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Radiology of Joints in Welded Piping for Power Plants

Proceedings of the Institution of Mechanical Engineers ◽

10.1243/pime_proc_1948_158_008_02 ◽

1948 ◽

Vol 158 (1) ◽

pp. 1-8 ◽

Cited By ~ 1

Author(s):

E. Thomas

Keyword(s):

High Speed ◽

Power Plants ◽

Gamma Ray ◽

Postage Stamp ◽

Absorption Factor ◽

Double Exposure ◽

X Ray ◽

Fine Grain

The type of equipment needed for the examination by radiology of joints in welded piping may vary considerably, especially when the work is carried out both in the shops and on the installation site. Portable X-ray equipment should be robust and improvements in present equipment could be made. The portability of gamma-ray apparatus is a great advantage, but it has disadvantages in its inferior absorption factor. The examination of large and of small pipes calls for different procedure as do also the methods of assessing the radiographs. The determination of the size of fine cracks is largely dependent upon the film-screen combination and there is a need for high-speed fine-grain film. Care should be taken on length of exposure and good facilities should be available for processing work. The location of large faults can be accurately obtained by a technique of double exposure. Of the various types of penetrameters, the “postage stamp” type is considered to be the most suitable for the examination of the welds of pipes.

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Future directions in X-ray/gamma-ray observations

10.1063/1.33489 ◽

1982 ◽

Author(s):

Da. A. Kniffen

Keyword(s):

Gamma Ray ◽

Future Directions ◽

X Ray

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HIGH-SPEED ANALYSIS TECHNIQUE FOR GAMMA-RAY AND X-RAY SPECTRA USING AN ASSOCIATIVE NEURAL NETWORK

International Journal of PIXE ◽

10.1142/s0129083593000227 ◽

1993 ◽

Vol 03 (03) ◽

pp. 267-273 ◽

Cited By ~ 5

Author(s):

S. IWASAKI ◽

H. FUKUDA ◽

M. KITAMURA

Keyword(s):

Neural Network ◽

High Speed ◽

Performance Test ◽

Gamma Ray ◽

Germanium Detector ◽

Pixe Analysis ◽

X Ray ◽

High Speed Analysis ◽

Analysis Technique ◽

A New Technique

A new technique for gamma-ray and X-ray spectral analyses is described. It employs an artificial neural network in order to meet requirements of easiness, compactness and promptness of the analysis. This technique only needs a suitable set of component spectra for the network training. Performance test of the network shows good results for gamma-ray spectra obtained by a 3"×3" NaI(Tl) spectrometer, and both for gamma- and X-ray spectra obtained with an 80cc high purity germanium detector. Degradation conditions and applicability to a PIXE analysis are discussed.

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A 2D pixel detector for very high-rate X- and gamma-ray spectroscopy and imaging

Powder Diffraction ◽

10.1017/s0885715617000392 ◽

2017 ◽

Vol 32 (2) ◽

pp. 133-139

Author(s):

Einar Nygård ◽

Nail Malakhov ◽

Peter Weilhammer ◽

Ole Dorholt ◽

Ole M. Røhne ◽

...

Keyword(s):

High Speed ◽

Gamma Ray ◽

Energy Dispersive ◽

High Rate ◽

Pixel Detector ◽

X Ray ◽

Early Results ◽

Gamma Ray Spectroscopy ◽

Very High

A new methodology for very high-speed, energy-dispersive detection of X-ray fluorescence is being developed. The underlying reasoning behind it, as well as early results from the evaluation of the first prototype, is presented.

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Considerations in the Design of Goniometers for Use in X-Ray Powder Diffractometers

Powder Diffraction ◽

10.1017/s0885715600011982 ◽

1986 ◽

Vol 1 (4) ◽

pp. 305-319 ◽

Cited By ~ 9

Author(s):

R. Jenkins ◽

W. N. Schreiner

Keyword(s):

Diffraction Data ◽

High Speed ◽

State Of The Art ◽

Mechanical Design ◽

Design Parameters ◽

Bench Tests ◽

X Ray ◽

Accuracy And Precision ◽

High Speed Data Acquisition ◽

High Speed Data

AbstractMost modern X-ray powder diffraction work is carried out using the parafocusing powder diffractometer. The typical instrument employs a mechanical goniometer to control the basic geometric movements required for recording diffraction data. Modern trends toward high speed data acquisition and computerized analytical procedures make the need for a well designed and well maintained goniometer system increasingly critical. This paper reviews the mechanical design parameters of typical goniometer systems in light of their influence on the accuracy and precision obtainable in diffraction data. Data on typical vertical and horizontal goniometer systems are compared, along with bench tests using a state of the art “anti-backlash” gearing system. By examining the nature of the errors typically encountered in today's goniometers it becomes evident why the next major improvement will likely be in software rather than hardware.

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Scanning x-ray fluorescence microscopy and principal component analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100133394 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1752-1753

Author(s):

Brian Cross

Keyword(s):

Principal Component Analysis ◽

Fluorescence Microscopy ◽

Spatial Resolution ◽

High Speed ◽

Image Acquisition ◽

Principal Component ◽

Fluorescence Microscope ◽

Acquisition Rate ◽

X Ray ◽

Speed Up

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.

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PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152252 ◽

1989 ◽

Vol 47 ◽

pp. 56-57

Author(s):

Marc H. Peeters ◽

Max T. Otten

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

High Speed ◽

High Performance ◽

Functional Integration ◽

Energy Dispersive ◽

X Rays ◽

X Ray ◽

High Speed Analysis ◽

Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

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