A novel transient technique is developed to measure the thermal diffusivity of one-dimensional microscale wires. In this technique, a pulsed nanosecond laser is used to quickly heat the wire. After laser heating, the wire temperature decays slowly. Such temperature decay is sensed and used to determine the thermal diffusivity of the wire. A 25.4 μm thin Pt wire is characterized to verify this technique. The thermal diffusivity of multi-wall carbon nanotube bundles is measured. Based on the measurement result and the inside structure, the thermal diffusivity of individual carbon nanotubes is estimated.
Failure Analysis and Reliability of Low-Temperature-Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
