High-Resolution X-ray Spectroscopy Close to Room Temperature

1998 ◽  
Vol 4 (6) ◽  
pp. 622-631 ◽  
Author(s):  
L. Strüder ◽  
N. Meidinger ◽  
D. Stotter ◽  
J. Kemmer ◽  
P. Lechner ◽  
...  
Keyword(s):  
High Resolution ◽  
Count Rate ◽  
High Speed ◽  
Room Temperature ◽  
Single Photon ◽  
Low Noise ◽  
Detector System ◽  
Wide Field ◽  
X Rays ◽  
X Ray

Originally designed as position-sensitive detectors for particle tracking, silicon drift detectors (SDDs) are now used for high-count rate X-ray spectroscopy, operating close to room temperature. Their low-capacitance read-node concept places them among the fastest high-resolution detector systems. They have been used in a new spectrum of experiments in the wide field of X-ray spectroscopy: fluorescent analysis, diffrac-tometry, materials analysis, and synchrotron experiments such as X-ray holography and element imaging in scanning electron microscopes. The fact that the detector system can be used at room temperature with good spectroscopic performance and at −10°C with excellent energy resolution, avoiding liquid nitrogen for cooling and high-quality vacuum, guarantees a large variety of new applications, independent of the laboratory environment. A brief description of the device principles is followed by basics on low noise amplification. The performance results of a complete detector system are presented as well as some dedicated applications already realized, including use in a surface mapping instrument and use of a “mini-spectrometer” for the analysis of works of art. Fully depleted pn-charge-coupled devices (pn-CCDs) have been fabricated for the European X-ray Multi-Mirror mission (XMM) and the German X-ray satellite ABRIXAS, enabling high-speed, low-noise, position-resolving X-ray spectroscopy. The detector was designed and fabricated with a homogeneously sensitive area of 36 cm2. At −70°C it has a noise of 4 e- rms, with a readout time of the total focal plane array of 4 msec. The maximum count rate for single photon counting was 105 cps under flat field conditions. In the integration mode, more than 109 cps can be detected at 6 keV. Its position resolution is on the order of 100 μm. The quantum efficiency is higher than 90%, ranging from carbon K X-rays (277 eV) up to 10 keV.

High-Resolution High-Count-Rate X-ray Spectroscopy with State-of-the-Art Silicon Detectors

1998 ◽  
Vol 5 (3) ◽  
pp. 268-274 ◽  
Author(s):  
L. Strüder ◽  
C. Fiorini ◽  
E. Gatti ◽  
R. Hartmann ◽  
P. Holl ◽  
...  
Keyword(s):  
Count Rate ◽  
Room Temperature ◽  
Single Photon ◽  
Low Noise ◽  
Light Sources ◽  
X Rays ◽  
X Ray ◽  
Synchrotron Light ◽  
On Chip ◽  
Synchrotron Light Sources

For the European X-ray multi-mirror (XMM) satellite mission and the German X-ray satellite ABRIXAS, fully depleted pn-CCDs have been fabricated, enabling high-speed low-noise position-resolving X-ray spectroscopy. The detector was designed and fabricated with a homogeneously sensitive area of 36 cm2. At 150 K it has a noise of 4 e− r.m.s., with a readout time of the total focal plane array of 4 ms. The maximum count rate for single-photon counting was 105 counts s−1 under flat-field conditions. In the integration mode more than 109 counts s−1 can be detected at 6 keV. Its position resolution is of the order of 100 µm. The quantum efficiency is higher than 90% from carbon K X-rays (277 eV) up to 10 keV. New cylindrical silicon drift detectors have been designed, fabricated and tested. They comprise an integrated on-chip amplifier system with continuous reset, on-chip voltage divider, electron accumulation layer stabilizer, large area, homogeneous radiation entrance window and a drain for surface-generated leakage current. At count rates as high as 2 × 106 counts cm−2 s−1, they still show excellent spectroscopic behaviour at room-temperature operation in single-photon detection mode. The energy resolution at room temperature is 220 eV at 6 keV X-ray energy and 140 eV at 253 K, being achieved with Peltier coolers. These systems were operated at synchrotron light sources (ESRF, HASYLAB and NLS) as X-ray fluorescence spectrometers in scanning electron microscopes and as ultra low noise photodiodes. The operation of a multi-channel silicon drift detector system is already foreseen at synchrotron light sources for X-ray holography experiments. All systems are fabricated in planar technology having the detector and amplifiers monolithically integrated on high-resistivity silicon.

scholarly journals Ultra-stable sub-meV monochromator for hard X-rays

2015 ◽  
Vol 22 (5) ◽  
pp. 1155-1162 ◽  
Author(s):  
T. S. Toellner ◽  
J. Collins ◽  
K. Goetze ◽  
M. Y. Hu ◽  
C. Preissner ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
High Speed ◽  
Room Temperature ◽  
Energy Calibration ◽  
Nuclear Transition ◽  
X Rays ◽  
Excitation Energies ◽  
Transmitted Beam ◽  
X Ray

A high-resolution silicon monochromator suitable for 21.541 keV synchrotron radiation is presented that produces a bandwidth of 0.27 meV. The operating energy corresponds to a nuclear transition in151Eu. The first-of-its-kind, fully cryogenic design achieves an energy-alignment stability of 0.017 meV r.m.s. per day, or a 100-fold improvement over other meV-monochromators, and can tolerate higher X-ray power loads than room-temperature designs of comparable resolution. This offers the potential for significantly more accurate measurements of lattice excitation energies using nuclear resonant vibrational spectroscopy if combined with accurate energy calibration using, for example, high-speed Doppler shifting. The design of the monochromator along with its performance and impact on transmitted beam properties are presented.

C05 Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy at Room Temperature

2003 ◽  
Vol 18 (2) ◽  
pp. 175-175 ◽  
Author(s):  
P. Lechner ◽  
H. Soltau ◽  
C. Fiorini ◽  
A. Longoni ◽  
G. Lutz ◽  
...  
Keyword(s):  
High Resolution ◽  
Count Rate ◽  
Room Temperature ◽  
High Count ◽  
High Count Rate ◽  
X Ray ◽  
Silicon Drift Detectors

scholarly journals X-ray imaging with ePix100a: a high-speed, high-resolution, low-noise camera

2016 ◽  
Author(s):  
G. Blaj ◽  
P. Caragiulo ◽  
A. Dragone ◽  
G. Haller ◽  
J. Hasi ◽  
...  
Keyword(s):  
High Resolution ◽  
High Speed ◽  
Low Noise ◽  
X Ray ◽  
X Ray Imaging

A Low Noise Silicon Detector Preamplifier System for Room Temperature X-Ray Spectroscopy

1993 ◽  
Vol 302 ◽  
Author(s):  
G. Bertuccio ◽  
A. Pullia
Keyword(s):  
High Resolution ◽  
Room Temperature ◽  
Silicon Detector ◽  
Low Noise ◽  
High Resistivity ◽  
Charge Amplifier ◽  
X Ray ◽  
High Resistivity Silicon ◽  
Ultra Low Noise ◽  
Low Capacitance

ABSTRACTThe design and performances of a system for high resolution X-ray spectroscopy are presented. The detector is a low capacitance diode built on high resistivity silicon. The signal preamplification is made by means of an ultra-low noise charge amplifier of new conception. Presently the system exhibits an equivalent noise charge of 61 r.m.s. electrons at 297 K and 32 r.m.s. electrons at 223 K. It is shown how an improvement down to 30 r.m.s. electrons at room temperature is expected employing an integrated transistor on the detector chip.

scholarly journals A New Improved Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications

2004 ◽  
Vol 12 (6) ◽  
pp. 36-37 ◽  
Author(s):  
Shaul Barkan ◽  
Valeri D. Saveliev ◽  
Jan S. Iwanczyk ◽  
Liangyuan Feng ◽  
Carolyn R. Tull ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Count Rate ◽  
Spectral Response ◽  
Rate Capability ◽  
High Sensitivity ◽  
Low Noise ◽  
X Rays ◽  
High Count ◽  
High Count Rate ◽  
X Ray

A silicon multi-cathode detector (SMCD) has been developed for microanalysis and x-ray mapping applications. The SMCD has a large active area (∼0.5 cm2), excellent energy resolution, and high count rate capability. The detector utilizes novel structures that have produced very low dark current, high electric field, uniform charge collection, low noise and high sensitivity to low energy x-rays. The detector's spectral response was evaluated using a 55Fe radioisotope source, as well as by fluorescing materials with an x-ray generator. Figure 1 shows a 55Fe spectrum with an energy resolution of 125 eV FWHM at 5.9 keV collected at 12 μs peaking time. This energy resolution has been repeatably measured on many different detectors. To evaluate the high count rate x-ray performance, which is very important for fast x-ray mapping, a Cu sample was fluoresced using a Rh-anode x-ray tube.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

scholarly journals Measurement of synchrotron-radiation-excited Kossel patterns

2016 ◽  
Vol 23 (1) ◽  
pp. 214-218 ◽  
Author(s):  
G. Bortel ◽  
G. Faigel ◽  
M. Tegze ◽  
A. Chumakov
Keyword(s):  
High Resolution ◽  
Dynamic Range ◽  
Structural Information ◽  
Photon Counting ◽  
Spot Size ◽  
Low Noise ◽  
X Rays ◽  
Technical Problems ◽  
Pixel Detectors ◽  
Exciting Beam

Kossel line patterns contain information on the crystalline structure, such as the magnitude and the phase of Bragg reflections. For technical reasons, most of these patterns are obtained using electron beam excitation, which leads to surface sensitivity that limits the spatial extent of the structural information. To obtain the atomic structure in bulk volumes, X-rays should be used as the excitation radiation. However, there are technical problems, such as the need for high resolution, low noise, large dynamic range, photon counting, two-dimensional pixel detectors and the small spot size of the exciting beam, which have prevented the widespread use of Kossel pattern analysis. Here, an experimental setup is described, which can be used for the measurement of Kossel patterns in a reasonable time and with high resolution to recover structural information.

Cryogenic high-resolution X-ray spectrometers for SR-XRF and microanalysis

1998 ◽  
Vol 5 (3) ◽  
pp. 515-517 ◽  
Author(s):  
M. Frank ◽  
C. A. Mears ◽  
S. E. Labov ◽  
L. J. Hiller ◽  
J. B. le Grand ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Resolution ◽  
Superconducting Tunnel Junction ◽  
Semiconductor Detectors ◽  
X Rays ◽  
X Ray ◽  
Sr Xrf ◽  
Demonstration Experiment ◽  
Near Future ◽  
Stj Detector

Experimental results are presented obtained with a cryogenically cooled high-resolution X-ray spectrometer based on a 141 × 141 µm Nb-Al-Al2O3-Al-Nb superconducting tunnel junction (STJ) detector in an SR-XRF demonstration experiment. STJ detectors can operate at count rates approaching those of semiconductor detectors while still providing a significantly better energy resolution for soft X-rays. By measuring fluorescence X-rays from samples containing transition metals and low-Z elements, an FWHM energy resolution of 6–15 eV for X-rays in the energy range 180–1100 eV has been obtained. The results show that, in the near future, STJ detectors may prove very useful in XRF and microanalysis applications.

The crystal structures of solvent-free alkali-metal squarates from powder diffraction data

2005 ◽  
Vol 220 (11) ◽  
Author(s):  
Robert E. Dinnebier ◽  
Hanne Nuss ◽  
Martin Jansen
Keyword(s):  
High Resolution ◽  
Alkali Metal ◽  
Crystal Structures ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Room Temperature ◽  
Solvent Free ◽  
Crystallographic Data ◽  
Powder Diffraction Data ◽  
X Ray

AbstractThe crystal structures of solvent-free lithium, sodium, rubidium, and cesium squarates have been determined from high resolution synchrotron and X-ray laboratory powder patterns. Crystallographic data at room temperature of Li

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