New Insights into the Atomic-Scale Structures and Behavior of Steels

2012 ◽  
Vol 20 (4) ◽  
pp. 44-48 ◽  
Author(s):  
E. A. Marquis ◽  
P.-Pa Choi ◽  
F. Danoix ◽  
K. Kruska ◽  
S. Lozano-Perez ◽  
...  
Keyword(s):  
Cluster Formation ◽  
Atom Probe ◽  
Design Criterion ◽  
Atomic Scale ◽  
Grain Structure ◽  
Microstructural Stability ◽  
Scale Structures ◽  
Boundary Chemistry ◽  
And Behavior ◽  
Controlled Precipitation

Atom probe tomography (APT) has significantly contributed to our understanding and development of structural materials through the detailed analysis of solute behavior, cluster formation, precipitate evolution, and interfacial and grain boundary chemistry. Whether one is concerned with light alloys, Ni-based superalloys, or steels, the design objectives are similar: developing alloys with optimum properties (strength, toughness, ductility, fatigue resistance, creep strength) through controlled precipitation, grain structure, solute state, and combination of phases. Performance in service, through microstructural stability and resistance to degradation, is also a major design criterion for the development of novel materials.

Atomic-scale study of TbCo2.5/Fe multilayers by laser-assisted tomographic atom probe

2007 ◽  
Vol 102 (3) ◽  
pp. 033912 ◽  
Author(s):  
A. Grenier ◽  
R. Lardé ◽  
E. Cadel ◽  
F. Vurpillot ◽  
J. Juraszek ◽  
...  
Keyword(s):  
Atom Probe ◽  
Atomic Scale ◽  
Tomographic Atom Probe

scholarly journals Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography

2016 ◽  
Vol 22 (S3) ◽  
pp. 1534-1535
Author(s):  
Isabelle Martin ◽  
Robert Estivill ◽  
Marc Juhel ◽  
Adeline Grenier ◽  
Ty J. Prosa ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale ◽  
Scale Analysis

Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography

2010 ◽  
Vol 654-656 ◽  
pp. 2366-2369 ◽  
Author(s):  
Feng Zai Tang ◽  
Talukder Alam ◽  
Michael P. Moody ◽  
Baptiste Gault ◽  
Julie M. Cairney
Keyword(s):  
Quantitative Analysis ◽  
Atom Probe Tomography ◽  
Nanocrystalline Materials ◽  
Atom Probe ◽  
Atomic Scale ◽  
Three Dimensions ◽  
Specimen Preparation ◽  
Compositional Information

Atom probe tomography provides compositional information in three dimensions at the atomic scale, and is therefore extremely suited to the study of nanocrystalline materials. In this paper we present atom probe results from the investigation of nanocomposite TiSi¬Nx coatings and nanocrystalline Al. We address some of the major challenges associated with the study of nanocrystalline materials, including specimen preparation, visualisation, common artefacts in the data and approaches to quantitative analysis. We also discuss the potential for the technique to relate crystallographic information to the compositional maps.

scholarly journals Atomic Scale Investigation of Orthopyroxene and Olivine Grain Boundaries by Atom Probe Tomography

2015 ◽  
Vol 21 (S3) ◽  
pp. 1315-1316 ◽  
Author(s):  
Mukesh Bachhav ◽  
Yan Dong ◽  
Philip Skemer ◽  
Emmanuelle A. Marquis
Keyword(s):  
Grain Boundaries ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale

Direct Nanoscale Patterning by Atomic Manipulation

1995 ◽  
Vol 380 ◽  
Author(s):  
Craig T. Salling
Keyword(s):  
Scanning Tunneling Microscope ◽  
Room Temperature ◽  
Atomic Layer ◽  
Sample Surface ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Nanoscale Patterning ◽  
Direct Patterning ◽  
Scale Structures ◽  
Atomic Manipulation

ABSTRACTThe ability to create atomic-scale structures with the scanning tunneling microscope (STM) plays an important role in the development of a future nanoscale technology. I briefly review the various modes of STM-based fabrication and atomic manipulation. I focus on using a UHV-STM to directly pattern the Si(001) surface by atomic manipulation at room temperature. By carefully adjusting the tip morphology and pulse voltage, a single atomic layer can be removed from the sample surface to define features one atom deep. Segments of individual dimer rows can be removed to create structures with atomically straight edges and with lateral features as small as one dimer wide. Trenches ∼3 nm wide and 2–3 atomic layers deep can be created with less stringent control of patterning parameters. Direct patterning provides a straightforward route to the fabrication of nanoscale test structures under UHV conditions of cleanliness.

scholarly journals Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations

2018 ◽  
Vol 33 (23) ◽  
pp. 4018-4030 ◽  
Author(s):  
Baptiste Gault ◽  
Andrew J. Breen ◽  
Yanhong Chang ◽  
Junyang He ◽  
Eric A. Jägle ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale ◽  
Image Position

Abstract

scholarly journals A near atomic-scale view at the composition of amyloid-beta fibrils by atom probe tomography

2018 ◽  
Vol 8 (1) ◽  
Author(s):  
Kristiane A. K. Rusitzka ◽  
Leigh T. Stephenson ◽  
Agnieszka Szczepaniak ◽  
Lothar Gremer ◽  
Dierk Raabe ◽  
...  
Keyword(s):  
Amyloid Beta ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale

scholarly journals Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis

2008 ◽  
Vol 16 (4) ◽  
pp. 42-47 ◽  
Author(s):  
Brian P. Gorman ◽  
David Diercks ◽  
Norman Salmon ◽  
Eric Stach ◽  
Gonzalo Amador ◽  
...  
Keyword(s):  
A Priori ◽  
Atom Probe ◽  
Atomic Scale ◽  
Original Position ◽  
3 Dimensional ◽  
Original Specimen ◽  
High Electrical Field ◽  
Scale Characterization ◽  
Surface Monolayers

Atom probe tomography has primarily been used for atomic scale characterization of high electrical conductivity materials. A high electrical field applied to needle-shaped specimens evaporates surface atoms, and a time of flight measurement determines each atom's identity. A 2-dimensional detector determines each atom's original position on the specimen. When repeated successively over many surface monolayers, the original specimen can be reconstructed into a 3-dimensional representation. In order to have an accurate 3-D reconstruction of the original, the field required for atomic evaporation must be known a-priori. For many metallic materials, this evaporation field is well characterized, and 3-D reconstructions can be achieved with reasonable accuracy.

Tuning Local Electrical Conductivity via Fine Atomic Scale Structures of Two-Dimensional Interfaces

Nano Letters ◽  
2018 ◽  
Vol 18 (9) ◽  
pp. 6030-6036 ◽  
Author(s):  
Shuai Zhang ◽  
Lei Gao ◽  
Aisheng Song ◽  
Xiaohu Zheng ◽  
Quanzhou Yao ◽  
...  
Keyword(s):  
Electrical Conductivity ◽  
Atomic Scale ◽  
Two Dimensional ◽  
Scale Structures
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