High-Stable X-ray Imaging from All-Inorganic Perovskite Nanocrystals under a High Dose Radiation

2020 ◽  
Vol 11 (21) ◽  
pp. 9203-9209 ◽  
Author(s):  
Liuli Yang ◽  
Hao Zhang ◽  
Min Zhou ◽  
Lei Zhao ◽  
Weiqing Chen ◽  
...  
2022 ◽  
Author(s):  
Lu Lu ◽  
Mingzi Sun ◽  
Tong Wu ◽  
Qiuyang Lu ◽  
Baian Chen ◽  
...  

With super strong penetrability, high-energy X-rays can be applied to probe the inner structure of target objects under nondestructive situations. Scintillation materials can down-convert X-rays into visible light, enabling the...


2020 ◽  
Vol 62 (1) ◽  
pp. 73-78
Author(s):  
Kentaro Ariyoshi ◽  
Yota Hiroyama ◽  
Naoya Fujiwara ◽  
Tomisato Miura ◽  
Kosuke Kasai ◽  
...  

Abstract Alopecia is one of the common symptoms after high-dose radiation exposure. In our experiments, neonatal mice that received 7 Gy X-ray exhibited defects in overall hair growth, except for their cheeks. This phenomenon might suggest that some substances were secreted and prevented hair follicle loss in the infant tissues around their cheeks after radiation damage. In this study, we focused on exosome-like vesicles (ELV) secreted from cheek skin tissues and back skin tissues, as control, and examined their radiation protective effects on mouse fibroblast cell lines. We observed that ELV from irradiated cheek skin showed protective effects from radiation. Our results suggest that ELV from radiation-exposed cheek skin tissue is one of the secreted factors that prevent hair follicle loss after high-dose radiation.


Dose-Response ◽  
2020 ◽  
Vol 18 (3) ◽  
pp. 155932582095954 ◽  
Author(s):  
Paul A. Oakley ◽  
Deed E. Harrison

All too often the family physician, orthopedic surgeon, dentist or chiropractor is met with radiophobic concerns about X-ray imaging in the clinical setting. These concerns, however, are unwarranted fears based on common but ill-informed and perpetuated ideology versus current understanding of the effects of low-dose radiation exposures. Themes of X-ray hesitancy come in 3 forms: 1. All radiation exposures are harmful (i.e. carcinogenic); 2. Radiation exposures are cumulative; 3. Children are more susceptible to radiation. Herein we address these concerns and find that low-dose radiation activates the body’s adaptive responses and leads to reduced cancers. Low-dose radiation is not cumulative as long as enough time (e.g. 24 hrs) passes prior to a repeated exposure, and any damage is repaired, removed, or eliminated. Children have more active immune systems; the literature shows children are no more affected than adults by radiation exposures. Medical X-rays present a small, insignificant addition to background radiation exposure that is not likely to cause harm. Doctors and patients alike should be better informed of the lack of risks from diagnostic radiation and the decision to image should rely on the best evidence, unique needs of the patient, and the expertise of the physician—not radiophobia.


2021 ◽  
Vol 11 (14) ◽  
pp. 6475
Author(s):  
Seon-Chil Kim

Radiation exposure in medical institutions is mainly due to low doses. Low-dose radiation mainly means scattered radiation, and such scattered radiation can be shielded with a lightweight shielding suit. In this study, the shielding performance of shielding fabrics woven by winding polyethylene (PE) yarn around a 30 μm tungsten wire was evaluated. To improve the shielding performance, an air pressure dispersion process of coating tungsten nanopowder on the fiber was developed. The radiation shielding effectiveness of the shielding fibers with and without dispersed tungsten nanopowder were compared by measuring the spatial dose inside the diagnostic X-ray imaging room of a medical institution. The results of the experiment confirmed that the fabric coated with tungsten nanopowder improved the shielding performance of the general tungsten fiber by approximately 15% and provided relatively effective low-dose radiation shielding at approximately 1.2 m of the X-ray imaging equipment. This study shows that tungsten fiber can be helpful in manufacturing lightweight shielding clothing for protection from scattered radiation in medical institutions.


2021 ◽  
pp. 2107424
Author(s):  
Weiqing Chen ◽  
Min Zhou ◽  
Yang Liu ◽  
Xue Yu ◽  
Chaojie Pi ◽  
...  

1997 ◽  
Vol 24 (10) ◽  
pp. 1643-1646 ◽  
Author(s):  
R. A. Geise ◽  
B. A. Schueler ◽  
W. Lien ◽  
S. C. Jones
Keyword(s):  
X Ray ◽  

2019 ◽  
Vol 7 (2A) ◽  
Author(s):  
Rodrigo Uchida Ichikawa ◽  
Horacio Marconi da Silva Matias Dantas Linhares ◽  
Andre Santos Barros Silva ◽  
Maria Ines Teixeira ◽  
Izilda Marcia Ranieri ◽  
...  

In this work, the structure and microstructure of Nd:KY3F10 nanoparticles was probed using X-ray synchrotron diffraction analysis. Rietveld refinement was applied to obtain cell parameters, atomic positions and atomic displacement factors to be compared with the ones found in literature. X-ray line profile methods were applied to determine mean crystallite size and crystallite size distribution. Thermoluminescent (TL) emission curves were measured for different radiation doses, from 0.10 kGy up to 10.0 kGy. Dose-response curves were obtained by area integration beneath the peaks from TL. The reproducibility of the results in this work has shown that this material can be considered a good dosimetric material.


2019 ◽  
Vol 30 (18) ◽  
pp. 16740-16746 ◽  
Author(s):  
Farley Chicilo ◽  
Cyril Koughia ◽  
Richard Curry ◽  
Russel Gwilliam ◽  
Ruben Ahumada-Lazo ◽  
...  

Author(s):  
Joy Y. Liao ◽  
Somayyeh Rahimi ◽  
Christian Schmidt ◽  
Howard Lee Marks

Abstract X-ray imaging for both Failure Analysis and In-line Inspection has been utilized widely in the semiconductor industry, especially for surface mount device applications. During the investigation of total ionizing dose (TID) induced degradation of logic ICs with bulk FinFET technology, we observed that the degradation is mainly in the form of an increase in I/O leakage and IDDQ. Using filters during radiation was shown to impact TID. Failure Analysis was performed to localize the excessive current in both I/O leakage and IDDQ.


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