Viscocapillary Response of Gas Bubbles Probed by Thermal Noise Atomic Force Measurement

AbstractHighly sensitive force measurements of a single microscopic particle with femto-Newton sensitivity have remained elusive owing to the existence of fundamental thermal noise. Now, researchers have proposed an optically controlled hydrodynamic manipulation method, which can measure the weak force of a single microscopic particle with femto-Newton sensitivity.

Download Full-text

Anomalous Interfacial Structuring of a Non-Halogenated Ionic Liquid: Effect of Substrate and Temperature

Colloids and Interfaces ◽

10.3390/colloids2040060 ◽

2018 ◽

Vol 2 (4) ◽

pp. 60 ◽

Cited By ~ 5

Author(s):

Milad Radiom ◽

Patricia Pedraz ◽

Georgia Pilkington ◽

Patrick Rohlmann ◽

Sergei Glavatskih ◽

...

Keyword(s):

Ionic Liquid ◽

Surface Charge ◽

Force Measurement ◽

Surface Force ◽

Solid Surfaces ◽

Effect Of Temperature ◽

Decay Length ◽

Force Microscopy ◽

Large Size ◽

Atomic Force

We investigate the interfacial properties of the non-halogenated ionic liquid (IL), trihexyl(tetradecyl)phosphonium bis(mandelato)borate, [P6,6,6,14][BMB], in proximity to solid surfaces, by means of surface force measurement. The system consists of sharp atomic force microscopy (AFM) tips interacting with solid surfaces of mica, silica, and gold. We find that the force response has a monotonic form, from which a characteristic steric decay length can be extracted. The decay length is comparable with the size of the ions, suggesting that a layer is formed on the surface, but that it is diffuse. The long alkyl chains of the cation, the large size of the anion, as well as crowding of the cations at the surface of negatively charged mica, are all factors which are likely to oppose the interfacial stratification which has, hitherto, been considered a characteristic of ionic liquids. The variation in the decay length also reveals differences in the layer composition at different surfaces, which can be related to their surface charge. This, in turn, allows the conclusion that silica has a low surface charge in this aprotic ionic liquid. Furthermore, the effect of temperature has been investigated. Elevating the temperature to 40 °C causes negligible changes in the interaction. At 80 °C and 120 °C, we observe a layering artefact which precludes further analysis, and we present the underlying instrumental origin of this rather universal artefact.

Download Full-text

Force Measurement for the Interaction between Cucurbit[7]uril and Mica and Self-Assembled Monolayer in the Presence of Zn2+Studied with Atomic Force Microscopy

Langmuir ◽

10.1021/acs.langmuir.7b02168 ◽

2017 ◽

Vol 33 (43) ◽

pp. 11884-11892 ◽

Cited By ~ 3

Author(s):

Young-In Bae ◽

Ilha Hwang ◽

Ikjin Kim ◽

Kimoon Kim ◽

Joon Won Park

Keyword(s):

Atomic Force Microscopy ◽

Force Measurement ◽

Self Assembled Monolayer ◽

Force Microscopy ◽

Atomic Force ◽

Self Assembled

Download Full-text

Force measurement using an ac atomic force microscope

Journal of Applied Physics ◽

10.1063/1.344961 ◽

1990 ◽

Vol 67 (9) ◽

pp. 4045-4052 ◽

Cited By ~ 32

Author(s):

William A. Ducker ◽

Robert F. Cook ◽

David R. Clarke

Keyword(s):

Atomic Force Microscope ◽

Force Measurement ◽

Atomic Force

Download Full-text

Uncertainty in least-squares fits to the thermal noise spectra of nanomechanical resonators with applications to the atomic force microscope

Review of Scientific Instruments ◽

10.1063/1.4864086 ◽

2014 ◽

Vol 85 (2) ◽

pp. 025104 ◽

Cited By ~ 13

Author(s):

John E. Sader ◽

Morteza Yousefi ◽

James R. Friend

Keyword(s):

Atomic Force Microscope ◽

Least Squares ◽

Thermal Noise ◽

Nanomechanical Resonators ◽

Atomic Force ◽

Noise Spectra

Download Full-text

Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

Beilstein Journal of Nanotechnology ◽

10.3762/bjnano.4.4 ◽

2013 ◽

Vol 4 ◽

pp. 32-44 ◽

Cited By ~ 20

Author(s):

Jannis Lübbe ◽

Matthias Temmen ◽

Sebastian Rode ◽

Philipp Rahe ◽

Angelika Kühnle ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Signal Processing ◽

Transfer Function ◽

Spectral Density ◽

Thermal Noise ◽

Noise Spectral Density ◽

Force Microscopy ◽

Atomic Force ◽

Noise Limit ◽

Signal Processing Electronics

The noise of the frequency-shift signal Δf in noncontact atomic force microscopy (NC-AFM) consists of cantilever thermal noise, tip–surface-interaction noise and instrumental noise from the detection and signal processing systems. We investigate how the displacement-noise spectral density d z at the input of the frequency demodulator propagates to the frequency-shift-noise spectral density d Δ f at the demodulator output in dependence of cantilever properties and settings of the signal processing electronics in the limit of a negligible tip–surface interaction and a measurement under ultrahigh-vacuum conditions. For a quantification of the noise figures, we calibrate the cantilever displacement signal and determine the transfer function of the signal-processing electronics. From the transfer function and the measured d z , we predict d Δ f for specific filter settings, a given level of detection-system noise spectral density d z ds and the cantilever-thermal-noise spectral density d z th. We find an excellent agreement between the calculated and measured values for d Δ f . Furthermore, we demonstrate that thermal noise in d Δ f , defining the ultimate limit in NC-AFM signal detection, can be kept low by a proper choice of the cantilever whereby its Q-factor should be given most attention. A system with a low-noise signal detection and a suitable cantilever, operated with appropriate filter and feedback-loop settings allows room temperature NC-AFM measurements at a low thermal-noise limit with a significant bandwidth.

Download Full-text

Effect of Tip Size on Force Measurement in Atomic Force Microscopy

Langmuir ◽

10.1021/la703231h ◽

2008 ◽

Vol 24 (6) ◽

pp. 2271-2273 ◽

Cited By ~ 19

Author(s):

Leonard T. W. Lim ◽

Andrew T. S. Wee ◽

Sean J. O'Shea

Keyword(s):

Atomic Force Microscopy ◽

Force Measurement ◽

Force Microscopy ◽

Atomic Force

Download Full-text

Calibration of Carbon Nanotube Probes for Pico-Newton Order Force Measurement Inside a Scanning Electron Microscope

Journal of Robotics and Mechatronics ◽

10.20965/jrm.2004.p0155 ◽

2004 ◽

Vol 16 (2) ◽

pp. 155-162 ◽

Cited By ~ 10

Author(s):

Masahiro Nakajima ◽

◽

Fumihito Arai ◽

Lixin Dong ◽

Toshio Fukuda

Keyword(s):

Electron Microscope ◽

Carbon Nanotube ◽

Scanning Electron Microscope ◽

Elastic Moduli ◽

Force Measurement ◽

Ultrasonic Waves ◽

Copper Electrodes ◽

Atomic Force ◽

Afm Cantilever ◽

Scanning Electron

A method is presented for pico-Newton (pN) order force measurement using a carbon nanotube (CNT) probe, which is calibrated by electromechanical resonance. A CNT probe is constructed by attaching a CNT to the end of a tungsten needle or an atomic force microscope (AFM) cantilever using nanorobotic manipulators inside a field-emission scanning electron microscope (FE-SEM). Conductive electron-beam-induced deposition (EBID) is used for the fixation of CNTs with an internal vaporized precursor W(CO)6. For manipulating them easily and quickly, CNTs are dispersed in ethanol by ultrasonic waves and oriented on copper electrodes by electrophoresis. The elastic moduli of CNT probes are calibrated for use as a force measurement probe by electrically exciting at fundamental frequency. We analyzed the resolution of force measurement using a CNT probe. This force measurement can be used to characterize the mechanical properties of nanostructures and to measure friction or exfoliation forces in nanometer order.

Download Full-text

The Study on the Ultrasonic Nanomachining of Au/Ti Thin Film by Atomic Force Microscopy

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.627.35 ◽

2014 ◽

Vol 627 ◽

pp. 35-39

Author(s):

Jen Ching Huang ◽

Ho Chang ◽

Yong Chin You ◽

Hui Ti Ling

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Quartz Crystal ◽

Normal Force ◽

Force Measurement ◽

Great Influence ◽

Measurement Model ◽

Cutting Depth ◽

Force Microscopy ◽

Atomic Force

This study focused on the ultrasonic nanomachining by atomic force microscopy (AFM) to understand the phenomena of the ultrasonic nanomachining. The workpiece is an Au/Ti thin film and coated on the quartz crystal resonator (QCR). The ultrasound vibration of workpiece is carried out by used the Quartz crystal microbalance (QCM). And a normal force measurement model was built by force curve measurements in ultrasound vibration environment. The influence of different experimental parameters can be studied such as normal force and repeat number on the cutting depth and chip stacking. After the experiments, it can be found that the ultrasonic nanomachining by AFM is possessed great influence on the cutting depth.

Download Full-text