Analysis of Interface Phenomena for High-Performance Dual-Stacked Oxide Thin-Film Transistors via Equivalent Circuit Modeling

2021 ◽  
Author(s):  
Changik Im ◽  
Jiyeon Kim ◽  
Nam-Kwang Cho ◽  
Jintaek Park ◽  
Eun Goo Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Equivalent Circuit ◽  
Thin Film Transistors ◽  
High Performance ◽  
Oxide Thin Film ◽  
Circuit Modeling ◽  
Interface Phenomena ◽  
Equivalent Circuit Modeling

High Performance Solution-Processed Indium Oxide Thin-Film Transistors

2008 ◽  
Vol 130 (38) ◽  
pp. 12580-12581 ◽  
Author(s):  
Hyun Sung Kim ◽  
Paul D. Byrne ◽  
Antonio Facchetti ◽  
Tobin J. Marks
Keyword(s):  
Thin Film ◽  
Indium Oxide ◽  
Thin Film Transistors ◽  
High Performance ◽  
Oxide Thin Film ◽  
Solution Processed ◽  
Indium Oxide Thin Film
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