Propylene Oxidation Mechanisms and Intermediates Using in Situ Soft X-ray Fluorescence Methods on the Pt(111) Surface

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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In Situ X-Ray Absorption Studies of the Electrochemical Reduction of Hydroxocobalamin

Journal de Physique IV (Proceedings) ◽

10.1051/jp4/1997116 ◽

1997 ◽

Vol 7 (C2) ◽

pp. C2-619-C2-620 ◽

Cited By ~ 1

Author(s):

M. Giorgett ◽

I. Ascone ◽

M. Berrettoni ◽

S. Zamponi ◽

R. Marassi

Keyword(s):

Electrochemical Reduction ◽

X Ray ◽

Absorption Studies ◽

X Ray Absorption

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In-situ investigation by X-ray diffraction and wafer curvature of phase formation and stress evolution during metal thin film – silicon reactions

Zeitschrift für Kristallographie Supplements ◽

10.1524/zksu.2007.2007.suppl_26.81 ◽

2007 ◽

Vol 2007 (suppl_26) ◽

pp. 81-89

Author(s):

O. Thomas

Keyword(s):

Thin Film ◽

Phase Formation ◽

Stress Evolution ◽

X Ray Diffraction ◽

X Ray ◽

Wafer Curvature ◽

Thin Film Silicon ◽

Metal Thin Film ◽

In Situ Investigation

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A Revised O2 Reduction Model in Li-O2 Batteries as Revealed by in Situ Small Angle X-Ray Scattering

10.26434/chemrxiv.11447775.v1 ◽

2019 ◽

Author(s):

Christian Prehal ◽

Aleksej Samojlov ◽

Manfred Nachtnebel ◽

Manfred Kriechbaum ◽

Heinz Amenitsch ◽

...

Keyword(s):

Small Angle ◽

Wide Angle ◽

Reduction Mechanism ◽

Reduction Model ◽

X Ray ◽

X Ray Scattering ◽

O2 Reduction ◽

Ray Scattering

Here we use in situ small and wide angle X-ray scattering to elucidate unexpected mechanistic insights of the O2 reduction mechanism in Li-O2 batteries.

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Single Crystal Growth of High-Pressure Phases of Ice and Salt Hydrate Far Below the Original Melting Point by Mixing Alcohol: Crystal Structure Determination of Magnesium Chloride Heptahydrate

10.26434/chemrxiv.11345063.v2 ◽

2020 ◽

Author(s):

Keishiro Yamashita ◽

Kazuki Komatsu ◽

Hiroyuki Kagi

Keyword(s):

Crystal Structure ◽

High Pressure ◽

Crystal Growth ◽

Single Crystal ◽

Room Temperature ◽

Growth Technique ◽

Salt Hydrate ◽

X Ray

An crystal-growth technique for single crystal x-ray structure analysis of high-pressure forms of hydrogen-bonded crystals is proposed. We used alcohol mixture (methanol: ethanol = 4:1 in volumetric ratio), which is a widely used pressure transmitting medium, inhibiting the nucleation and growth of unwanted crystals. In this paper, two kinds of single crystals which have not been obtained using a conventional experimental technique were obtained using this technique: ice VI at 1.99 GPa and MgCl2·7H2O at 2.50 GPa at room temperature. Here we first report the crystal structure of MgCl2·7H2O. This technique simultaneously meets the requirement of hydrostaticity for high-pressure experiments and has feasibility for further in-situ measurements.

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